CRIS Current Research Information System

OMANA, MARTIN EUGENIO
 Distribuzione geografica
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Continente #
NA - Nord America 5.446
EU - Europa 2.214
AS - Asia 777
AF - Africa 144
SA - Sud America 10
Continente sconosciuto - Info sul continente non disponibili 5
OC - Oceania 2
Totale 8.598
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Nazione #
US - Stati Uniti d'America 5.438
GB - Regno Unito 667
CN - Cina 306
DE - Germania 293
IT - Italia 282
SE - Svezia 281
UA - Ucraina 233
SG - Singapore 206
IN - India 120
VN - Vietnam 114
FR - Francia 104
RU - Federazione Russa 90
BG - Bulgaria 72
IE - Irlanda 71
TG - Togo 70
ZA - Sudafrica 56
EE - Estonia 40
BE - Belgio 12
SC - Seychelles 12
CH - Svizzera 10
GR - Grecia 9
FI - Finlandia 8
JP - Giappone 8
BR - Brasile 6
CA - Canada 6
HR - Croazia 6
PT - Portogallo 6
DK - Danimarca 5
HK - Hong Kong 5
NL - Olanda 5
AT - Austria 4
CI - Costa d'Avorio 4
EU - Europa 4
NO - Norvegia 4
TW - Taiwan 4
CL - Cile 3
KR - Corea 3
PL - Polonia 3
AL - Albania 2
AU - Australia 2
CZ - Repubblica Ceca 2
ES - Italia 2
LB - Libano 2
MX - Messico 2
MY - Malesia 2
RO - Romania 2
A2 - ???statistics.table.value.countryCode.A2??? 1
AR - Argentina 1
BD - Bangladesh 1
ID - Indonesia 1
IL - Israele 1
IR - Iran 1
MA - Marocco 1
MO - Macao, regione amministrativa speciale della Cina 1
PK - Pakistan 1
SA - Arabia Saudita 1
SI - Slovenia 1
TZ - Tanzania 1
Totale 8.598
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Città #
Ann Arbor 2.189
Southend 577
Fairfield 491
Chandler 327
Wilmington 315
Ashburn 299
Woodbridge 246
Seattle 199
Singapore 186
Houston 169
Cambridge 164
Jacksonville 159
Princeton 151
Dublin 71
Sofia 71
Dong Ket 70
Lomé 70
Westminster 62
Padova 61
Bologna 58
Nanjing 58
Berlin 48
Medford 37
Saint Petersburg 34
Mülheim 33
Jinan 31
Boardman 30
Shenyang 30
Hebei 28
San Diego 27
Beijing 24
Washington 24
Santa Clara 23
Changsha 17
Des Moines 16
Tianjin 14
Fremont 12
Los Angeles 12
Milan 12
Nanchang 12
Norwalk 12
Brussels 11
Dearborn 11
Lanzhou 11
Mahé 11
Taiyuan 11
Zhengzhou 10
Modena 9
Paris 9
Ningbo 8
Redwood City 8
Tokyo 8
Verona 8
Falls Church 7
Jiaxing 7
Kunming 7
Olalla 7
Pune 7
Bern 6
Costa Mesa 6
Delhi 6
Helsinki 6
Redmond 6
San Venanzo 6
Canosa Di Puglia 5
Fuzhou 5
Hangzhou 5
São Paulo 5
Turin 5
Abidjan 4
Guangzhou 4
Taizhou 4
Chicago 3
Dallas 3
Frankfurt Am Main 3
Haikou 3
Montreal 3
Phoenix 3
Rome 3
San Francisco 3
San Jose 3
Tappahannock 3
Toronto 3
Vienna 3
Villanova d'Albenga 3
Amsterdam 2
Atlanta 2
Brindisi 2
Bruneck 2
Buffalo 2
Bühl 2
Central 2
Cesena 2
Ferrara 2
Frankfurt am Main 2
Hefei 2
Hsinchu 2
Lappeenranta 2
Las Vegas 2
London 2
Totale 6.761
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Nome #
Accurate Linear Model for SET Critical Charge Estimation 183
Low Cost and High Speed Embedded Two-Rail Code Checker 179
Model for Transient Fault Susceptibility of Combinational Circuits 175
Concurrent Detection of Faults Affecting Energy Harvesting Circuits of Self-Powered Wearable Sensors 168
Self-Checking Monitor for NBTI Due Degradation 166
Clock Faults Induced Min and Max Delay Violations 166
On-Die Ring Oscillator Based Measurement Scheme for Process Parameter Variations and Clock Jitter 160
Checker No-Harm Alarms and Design Approaches to Tolerate Them 153
High-Performance Robust Latches 153
Novel On-Chip Circuit for Jitter Testing in High-Speed PLLs 151
Checker No-Harm Alarm Robustness 150
Low Cost and Low Intrusive Approach to Test On-Line the Scheduler of High Performance Microprocessors 150
Low-Cost and High-Reduction Approaches for Power Droop during Launch-On-Shift Scan-Based Logic BIST 149
Can Clock Faults Be Detected Through Functional Test ? 148
Impact of Aging Phenomena on Soft Error Susceptibility 147
Multiple Transient Faults in Logic: An Issue for Next Generation ICs? 146
Are Our Design For Testability Features Fault Secure ? 146
Impact of Aging Phenomena on Latches’ Robustness 146
Intermittent and Transient Fault Diagnosis on Sparse Code Signatures 144
Novel Approach to Clock Fault Testing for High Performance Microprocessors 143
New Approaches for Power Binning of High Performance Microprocessors 143
Fault-Tolerant Inverters for Reliable Photovoltaic Systems 143
Scalable Approach for Power Droop Reduction During Scan-Based Logic BIST 142
Hardware Reconfiguration Scheme for High Availability Systems 141
Power droop reduction during Launch-On-Shift scan-based logic BIST 141
Faults Affecting Energy-Harvesting Circuits of Self-Powered Wireless Sensors and Their Possible Concurrent Detection 140
Low-Cost Strategy to Mitigate the Impact of Aging on Latches’ Robustness 140
Novel High Speed Robust Latch 138
Fast and Low-Cost Clock Deskew Buffer 137
Low-Area On-Chip Circuit for Jitter Measurement in a Phase-Locked Loop 136
Path (Min) delay Faults and Their Impact on Self-Checking Circuits' Operation 136
On the Selection of Unidirectional Error detecting Codes for Self-Checking Circuits' Area Overhead and Performance Optimization 134
Transient Fault and Soft Error On-Die Monitoring Scheme 134
Novel Approach to Reduce Power Droop During Scan-Based Logic BIST 134
Impact of Bias Temperature Instability on Soft Error Susceptibility 134
On-Transistor Level Gate Sizing for Increased Robustness to Transient Faults 134
Novel Compensation Scheme for Local Clocks of High Performance Microprocessors 133
Function Inherent Code Checking: A New Low Cost On-Line Testing Approach for High Performance Microprocessor Control Logic 131
Model for Thermal Behavior of Shaded Photovoltaic Cells Under Hot-Spot Condition 131
Fault secureness need for next generation high performance microprocessor design for testability structures 129
Faults Affecting the Control Blocks of PV Arrays and Techniques for Their Concurrent Detection 129
Low Cost Concurrent Error Detection Strategy for the Control Logic of High Performance Microprocessors and Its Application to the Instruction Decoder 128
Novel Low-Cost Aging Sensor 128
Low Cost NBTI Degradation Detection and Masking Approaches 128
High-reliability Fault Tolerant Digital Systems in Nanometric Technologies: Characterization and Design Methodologies 128
Modeling and Detection of Hotspot in Shaded Photovoltaic Cells 128
New Design For Testability Approach for Clock Fault Testing 127
Novel On-Chip Clock Jitter Measurement Scheme For High Performance Microprocessors 124
Low-Cost Strategy for Bus Propagation Delay Reduction 123
Should We Make Our Design for Testability Schemes Fault Secure ? 122
Latch Susceptibility to Transient Faults and New Hardening Approach 122
Risks Associated with Faults within Test Pattern Compactors and Their Implications on Testing 122
Low-Cost and Highly Reliable Detector for Transient and Crosstalk Faults Affecting FPGA Interconnects 120
The Other Side of the Timing Equation: a Result of Clock Faults 119
Low-Cost On-Chip Clock Jitter Measurement Scheme 119
Low-Cost Dynamic Compensation Scheme for Local Clocks of Next Generation High Performance Microprocessors 116
Polynomial Based Key Distribution Scheme for WPAN 112
Polynomial Based Key Distribution Scheme for WPAN 111
Inverters' Self-Checking Monitors for Reliable Photovoltaic Systems 107
Cryptanalysis of Simplified-AES Encrypted Communication 94
Low Cost Scheme for On-Line Skew Compensation 91
Impact of Bias Temperature Instability (BTI) Aging Phenomenon on Clock Deskew Buffers 88
Reliability Risks Due to Faults Affecting Selectors of ReRAMs and Possible Solutions 59
Investigation of the Impact of BTI Aging Phenomenon on Analog Amplifiers 45
Sensors and embedded systems in agriculture and food analysis 38
RISC-V-based Platforms for HPC: Analyzing Non-functional Properties for Future HPC and Big-Data Clusters 34
Early detection of photovoltaic system inverter faults 31
ST-CAC: a low-cost crosstalk avoidance coding mechanism based on three-valued numerical system 22
Impact of Soft Errors on High Performance Autoencoders for Cyberattack Detection 21
Novel BTI Robust Ring-Oscillator-Based Physically Unclonable Function 14
Low-Cost Strategy to Detect Faults Affecting Scrubbers in SRAM-Based FPGAs 5
Totale 8.709
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Categoria #
all - tutte 19.991
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 19.991
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/20201.612 0 0 43 102 208 202 244 282 263 127 57 84
2020/20211.056 252 79 34 42 8 113 19 77 104 49 84 195
2021/20223.168 93 29 451 377 385 328 340 335 356 96 179 199
2022/20231.199 157 169 61 182 94 102 52 75 179 9 88 31
2023/2024454 33 68 44 20 51 142 14 11 12 31 10 18
2024/2025291 96 184 11 0 0 0 0 0 0 0 0 0
Totale 8.709