CRIS Current Research Information System

OMANA, MARTIN EUGENIO
 Distribuzione geografica
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Continente #
NA - Nord America 6.477
AS - Asia 2.973
EU - Europa 2.764
AF - Africa 213
SA - Sud America 155
Continente sconosciuto - Info sul continente non disponibili 5
OC - Oceania 3
Totale 12.590
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Nazione #
US - Stati Uniti d'America 6.423
CN - Cina 1.094
SG - Singapore 996
GB - Regno Unito 688
IT - Italia 515
DE - Germania 354
SE - Svezia 283
VN - Vietnam 269
UA - Ucraina 235
HK - Hong Kong 219
IN - India 164
FR - Francia 155
RU - Federazione Russa 155
BR - Brasile 111
KR - Corea 107
IE - Irlanda 76
BG - Bulgaria 72
TG - Togo 70
JP - Giappone 60
ZA - Sudafrica 60
NL - Olanda 57
CI - Costa d'Avorio 55
EE - Estonia 40
FI - Finlandia 34
MX - Messico 30
AR - Argentina 23
CA - Canada 21
SC - Seychelles 17
AT - Austria 15
BE - Belgio 15
PL - Polonia 13
CH - Svizzera 12
TW - Taiwan 10
GR - Grecia 9
BD - Bangladesh 8
HR - Croazia 6
ID - Indonesia 6
PT - Portogallo 6
AE - Emirati Arabi Uniti 5
CL - Cile 5
DK - Danimarca 5
IQ - Iraq 5
MY - Malesia 5
CO - Colombia 4
EC - Ecuador 4
ES - Italia 4
EU - Europa 4
NO - Norvegia 4
RW - Ruanda 4
TR - Turchia 4
AU - Australia 3
IR - Iran 3
KE - Kenya 3
LT - Lituania 3
PE - Perù 3
PK - Pakistan 3
UY - Uruguay 3
AL - Albania 2
AM - Armenia 2
BB - Barbados 2
CZ - Repubblica Ceca 2
IL - Israele 2
JO - Giordania 2
KG - Kirghizistan 2
LB - Libano 2
RO - Romania 2
A2 - ???statistics.table.value.countryCode.A2??? 1
BO - Bolivia 1
DZ - Algeria 1
ET - Etiopia 1
GE - Georgia 1
HU - Ungheria 1
KZ - Kazakistan 1
LK - Sri Lanka 1
MA - Marocco 1
MO - Macao, regione amministrativa speciale della Cina 1
PA - Panama 1
PY - Paraguay 1
SA - Arabia Saudita 1
SI - Slovenia 1
TZ - Tanzania 1
Totale 12.590
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Città #
Ann Arbor 2.189
Singapore 658
Southend 577
Fairfield 491
Ashburn 379
Dallas 340
Chandler 327
Wilmington 315
Hefei 306
Santa Clara 265
Woodbridge 246
Hong Kong 210
Seattle 199
Houston 170
Bologna 169
Cambridge 164
Jacksonville 159
Princeton 151
Beijing 136
Boardman 106
Seoul 103
Dublin 76
Sofia 71
Dong Ket 70
Lomé 70
Westminster 62
Padova 61
Los Angeles 59
Nanjing 58
Tokyo 56
Abidjan 55
Ho Chi Minh City 51
Milan 49
Berlin 48
Buffalo 42
Hanoi 37
Medford 37
Jinan 34
Saint Petersburg 34
Mülheim 33
Shenyang 32
Bengaluru 28
Hebei 28
San Diego 27
Washington 24
Changsha 22
Frankfurt am Main 18
Guangzhou 18
Tianjin 18
Des Moines 17
Redondo Beach 17
Shanghai 17
Rome 16
Helsinki 15
Chicago 14
García 14
Munich 14
Nuremberg 14
Nanchang 13
Paris 13
Zhengzhou 13
Brussels 12
Fremont 12
Norwalk 12
Taiyuan 12
Dearborn 11
Lanzhou 11
Mahé 11
New York 11
São Paulo 11
Turku 10
Boston 9
Fuzhou 9
Kunming 9
Lappeenranta 9
London 9
Modena 9
Montreal 9
Vienna 9
Yubileyny 9
Falkenstein 8
Ferrara 8
Hangzhou 8
Ningbo 8
Ninh Bình 8
Redwood City 8
Toronto 8
Turin 8
Verona 8
Amsterdam 7
Brooklyn 7
Da Nang 7
Falls Church 7
Jiaxing 7
Olalla 7
Pune 7
Treviso 7
Bern 6
Biên Hòa 6
Costa Mesa 6
Totale 9.395
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Nome #
Low Cost and High Speed Embedded Two-Rail Code Checker 238
Model for Transient Fault Susceptibility of Combinational Circuits 224
Accurate Linear Model for SET Critical Charge Estimation 215
On-Die Ring Oscillator Based Measurement Scheme for Process Parameter Variations and Clock Jitter 200
Self-Checking Monitor for NBTI Due Degradation 199
Concurrent Detection of Faults Affecting Energy Harvesting Circuits of Self-Powered Wearable Sensors 196
Clock Faults Induced Min and Max Delay Violations 196
Are Our Design For Testability Features Fault Secure ? 189
Fault-Tolerant Inverters for Reliable Photovoltaic Systems 189
High-Performance Robust Latches 188
Multiple Transient Faults in Logic: An Issue for Next Generation ICs? 187
Hardware Reconfiguration Scheme for High Availability Systems 186
Checker No-Harm Alarm Robustness 186
Checker No-Harm Alarms and Design Approaches to Tolerate Them 186
Low-Area On-Chip Circuit for Jitter Measurement in a Phase-Locked Loop 183
Can Clock Faults Be Detected Through Functional Test ? 183
Novel On-Chip Circuit for Jitter Testing in High-Speed PLLs 183
Low Cost and Low Intrusive Approach to Test On-Line the Scheduler of High Performance Microprocessors 182
Impact of Aging Phenomena on Latches’ Robustness 182
Low-Cost and High-Reduction Approaches for Power Droop during Launch-On-Shift Scan-Based Logic BIST 181
Fast and Low-Cost Clock Deskew Buffer 180
Impact of Aging Phenomena on Soft Error Susceptibility 180
Faults Affecting Energy-Harvesting Circuits of Self-Powered Wireless Sensors and Their Possible Concurrent Detection 179
Scalable Approach for Power Droop Reduction During Scan-Based Logic BIST 179
New Approaches for Power Binning of High Performance Microprocessors 179
Intermittent and Transient Fault Diagnosis on Sparse Code Signatures 178
Early detection of photovoltaic system inverter faults 176
On the Selection of Unidirectional Error detecting Codes for Self-Checking Circuits' Area Overhead and Performance Optimization 174
Fault secureness need for next generation high performance microprocessor design for testability structures 174
Power droop reduction during Launch-On-Shift scan-based logic BIST 174
Path (Min) delay Faults and Their Impact on Self-Checking Circuits' Operation 172
Low-Cost Strategy to Mitigate the Impact of Aging on Latches’ Robustness 172
Model for Thermal Behavior of Shaded Photovoltaic Cells Under Hot-Spot Condition 171
Should We Make Our Design for Testability Schemes Fault Secure ? 169
Novel Approach to Clock Fault Testing for High Performance Microprocessors 169
Novel Approach to Reduce Power Droop During Scan-Based Logic BIST 166
Sensors and embedded systems in agriculture and food analysis 165
High-reliability Fault Tolerant Digital Systems in Nanometric Technologies: Characterization and Design Methodologies 164
Function Inherent Code Checking: A New Low Cost On-Line Testing Approach for High Performance Microprocessor Control Logic 163
Transient Fault and Soft Error On-Die Monitoring Scheme 163
Novel High Speed Robust Latch 163
Low-Cost and Highly Reliable Detector for Transient and Crosstalk Faults Affecting FPGA Interconnects 162
Impact of Bias Temperature Instability on Soft Error Susceptibility 162
Modeling and Detection of Hotspot in Shaded Photovoltaic Cells 162
Low Cost NBTI Degradation Detection and Masking Approaches 161
The Other Side of the Timing Equation: a Result of Clock Faults 160
On-Transistor Level Gate Sizing for Increased Robustness to Transient Faults 159
Novel Low-Cost Aging Sensor 159
Low-Cost Strategy for Bus Propagation Delay Reduction 158
Novel Compensation Scheme for Local Clocks of High Performance Microprocessors 156
Faults Affecting the Control Blocks of PV Arrays and Techniques for Their Concurrent Detection 154
Novel Physical Unclonable Function Implementation for Microcontrollers and Field Programmable Gate Arrays 153
Low-Cost On-Chip Clock Jitter Measurement Scheme 152
Low Cost Concurrent Error Detection Strategy for the Control Logic of High Performance Microprocessors and Its Application to the Instruction Decoder 151
Novel On-Chip Clock Jitter Measurement Scheme For High Performance Microprocessors 149
New Design For Testability Approach for Clock Fault Testing 148
Latch Susceptibility to Transient Faults and New Hardening Approach 145
Risks Associated with Faults within Test Pattern Compactors and Their Implications on Testing 145
Low-Cost Dynamic Compensation Scheme for Local Clocks of Next Generation High Performance Microprocessors 141
Impact of aging on temperature measurements performed using a resistive temperature sensor with sensor-to-microcontroller direct interface 140
Polynomial Based Key Distribution Scheme for WPAN 139
Impact of Bias Temperature Instability (BTI) Aging Phenomenon on Clock Deskew Buffers 137
Polynomial Based Key Distribution Scheme for WPAN 135
Aging Resilient Ring Oscillators for Reliable Physically Unclonable Functions (PUFs) 132
Inverters' Self-Checking Monitors for Reliable Photovoltaic Systems 130
Cryptanalysis of Simplified-AES Encrypted Communication 128
On the Reliability of Clock Monitoring Units for Safety Critical Applications’ Microcontrollers 127
Low-Cost Strategy to Detect Faults Affecting Scrubbers in SRAM-Based FPGAs 123
Impact of Soft Errors on High Performance Autoencoders for Cyberattack Detection 123
Silent Data Corruption and Reliability Risks due to Faults Affecting High Performance Microprocessors’ Caches 120
Low Cost Scheme for On-Line Skew Compensation 118
Reliability Risks Due to Faults Affecting Selectors of ReRAMs and Possible Solutions 116
RISC-V-based Platforms for HPC: Analyzing Non-functional Properties for Future HPC and Big-Data Clusters 108
A PCI Express Based Data Acquisition System for the Monitoring of Code Traces of RISC-V Microprocessors 101
Investigation of the Impact of BTI Aging Phenomenon on Analog Amplifiers 91
A Ring Oscillator Based Physical Unclonable Function with Enhanced Challenge Response Pairs to Improve the Security of Internet of Things Devices 86
Accuracy of NTC Thermistor Measurements Using the Sensor to Microcontroller Direct Interface 78
AI for Cyberattacks’ Detection in the Metaverse 73
ST-CAC: a low-cost crosstalk avoidance coding mechanism based on three-valued numerical system 69
Novel BTI Robust Ring-Oscillator-Based Physically Unclonable Function 68
Reliability of AI in Predicting the State of Health of Li-Ion Batteries 62
Physical Unclonable Functions’ Reliability Modeling for Wireless Sensor Networks 23
Feasibility of Physical Unclonable Function (PUF) Implementation Using the Pull-up/Pull-down Resistances Integrated in Microcontrollers GPIO 22
Risks of Silent Data Corruption Due to the Combined Effects of Latent Faults and Aging Phenomena Affecting FinFET-Based ICs 17
Data Analysis of Electrical Impedance Spectroscopy-Based Biosensors Using Artificial Neural Networks for Resource Constrained Devices 16
On-Line Test of Fully Integrated Voltage Regulators for High Performance Microprocessors of Autonomous Systems 14
Physical Unclonable Function (PUF) device based on single stage voltage amplifiers for secure signature generation in the Internet of Things 14
Totale 12.770
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Categoria #
all - tutte 32.192
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 32.192
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021641 0 0 0 0 0 113 19 77 104 49 84 195
2021/20223.168 93 29 451 377 385 328 340 335 356 96 179 199
2022/20231.199 157 169 61 182 94 102 52 75 179 9 88 31
2023/2024454 33 68 44 20 51 142 14 11 12 31 10 18
2024/20251.785 96 184 116 110 446 101 164 45 26 106 95 296
2025/20262.567 319 410 752 355 503 228 0 0 0 0 0 0
Totale 12.770