CRIS Current Research Information System

OMANA, MARTIN EUGENIO
 Distribuzione geografica
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Continente #
NA - Nord America 7.419
AS - Asia 4.236
EU - Europa 3.162
AF - Africa 240
SA - Sud America 206
Continente sconosciuto - Info sul continente non disponibili 198
OC - Oceania 3
Totale 15.464
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Nazione #
US - Stati Uniti d'America 7.317
CN - Cina 1.253
SG - Singapore 1.199
VN - Vietnam 841
GB - Regno Unito 706
IT - Italia 706
DE - Germania 389
SE - Svezia 291
HK - Hong Kong 269
FR - Francia 243
UA - Ucraina 236
IN - India 203
RU - Federazione Russa 156
BR - Brasile 141
KR - Corea 119
JP - Giappone 86
BD - Bangladesh 83
IE - Irlanda 79
NL - Olanda 73
BG - Bulgaria 72
TG - Togo 70
ZA - Sudafrica 67
CI - Costa d'Avorio 55
FI - Finlandia 49
CA - Canada 42
MX - Messico 42
EE - Estonia 40
PH - Filippine 37
TW - Taiwan 29
AR - Argentina 27
SC - Seychelles 19
PL - Polonia 18
TH - Thailandia 17
TR - Turchia 17
BE - Belgio 16
AT - Austria 15
IQ - Iraq 14
CH - Svizzera 12
GR - Grecia 11
PK - Pakistan 10
CO - Colombia 9
ID - Indonesia 9
PT - Portogallo 9
MY - Malesia 8
CL - Cile 7
ES - Italia 7
HR - Croazia 7
DK - Danimarca 6
EC - Ecuador 6
ET - Etiopia 6
KE - Kenya 6
PE - Perù 6
AE - Emirati Arabi Uniti 5
CR - Costa Rica 5
AL - Albania 4
EU - Europa 4
GE - Georgia 4
NO - Norvegia 4
RW - Ruanda 4
SA - Arabia Saudita 4
AM - Armenia 3
AU - Australia 3
IR - Iran 3
JM - Giamaica 3
LB - Libano 3
LT - Lituania 3
PS - Palestinian Territory 3
RO - Romania 3
UY - Uruguay 3
BB - Barbados 2
BO - Bolivia 2
CZ - Repubblica Ceca 2
DZ - Algeria 2
EG - Egitto 2
HN - Honduras 2
IL - Israele 2
JO - Giordania 2
KG - Kirghizistan 2
MA - Marocco 2
NP - Nepal 2
OM - Oman 2
PA - Panama 2
PY - Paraguay 2
TN - Tunisia 2
UZ - Uzbekistan 2
VE - Venezuela 2
A2 - ???statistics.table.value.countryCode.A2??? 1
AW - Aruba 1
CY - Cipro 1
GA - Gabon 1
GF - Guiana Francese 1
GT - Guatemala 1
HU - Ungheria 1
KH - Cambogia 1
KZ - Kazakistan 1
LK - Sri Lanka 1
LV - Lettonia 1
LY - Libia 1
MD - Moldavia 1
MO - Macao, regione amministrativa speciale della Cina 1
Totale 15.264
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Città #
Ann Arbor 2.189
Singapore 824
Southend 577
Fairfield 491
Ashburn 482
Dallas 349
Chandler 327
Wilmington 315
Hefei 306
San Jose 285
Santa Clara 285
Woodbridge 246
Hong Kong 244
Bologna 232
Seattle 202
Ho Chi Minh City 200
Hanoi 177
Houston 173
Cambridge 164
Jacksonville 159
Beijing 151
Princeton 151
Council Bluffs 144
Boardman 122
Seoul 104
Lauterbourg 80
Dublin 79
Los Angeles 77
Tokyo 76
Sofia 71
Dong Ket 70
Lomé 70
Milan 64
Westminster 62
Padova 61
Nanjing 58
Abidjan 55
Berlin 48
New York 46
Buffalo 44
Frankfurt am Main 43
Medford 37
Jinan 36
Saint Petersburg 34
Mülheim 33
Shenyang 33
Rome 30
Bengaluru 29
San Diego 29
Hebei 28
Guangzhou 27
Helsinki 27
Shanghai 25
Chicago 24
Da Nang 24
Haiphong 24
Washington 24
Changsha 22
Des Moines 18
Tianjin 18
Redondo Beach 17
Paris 16
London 15
Munich 15
Nuremberg 15
São Paulo 15
Zhengzhou 15
García 14
Montreal 14
Orem 14
Toronto 14
Brussels 13
Nanchang 13
Taiyuan 13
Brooklyn 12
Fremont 12
Lappeenranta 12
Norwalk 12
Taipei 12
Amsterdam 11
Chennai 11
Dearborn 11
Ferrara 11
Hangzhou 11
Lanzhou 11
Mahé 11
Atlanta 10
Biên Hòa 10
Davao City 10
Fuzhou 10
Modena 10
Ninh Bình 10
Phoenix 10
Turku 10
Verona 10
Boston 9
Falkenstein 9
Hải Dương 9
Kunming 9
Phủ Lý 9
Totale 10.900
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Nome #
Accurate Linear Model for SET Critical Charge Estimation 267
Low Cost and High Speed Embedded Two-Rail Code Checker 262
Novel Physical Unclonable Function Implementation for Microcontrollers and Field Programmable Gate Arrays 238
Model for Transient Fault Susceptibility of Combinational Circuits 238
Sensors and embedded systems in agriculture and food analysis 229
On-Die Ring Oscillator Based Measurement Scheme for Process Parameter Variations and Clock Jitter 226
Clock Faults Induced Min and Max Delay Violations 221
Low-Area On-Chip Circuit for Jitter Measurement in a Phase-Locked Loop 218
High-Performance Robust Latches 217
Impact of Aging Phenomena on Latches’ Robustness 217
Concurrent Detection of Faults Affecting Energy Harvesting Circuits of Self-Powered Wearable Sensors 216
Fault-Tolerant Inverters for Reliable Photovoltaic Systems 216
Faults Affecting Energy-Harvesting Circuits of Self-Powered Wireless Sensors and Their Possible Concurrent Detection 215
Early detection of photovoltaic system inverter faults 211
Power droop reduction during Launch-On-Shift scan-based logic BIST 211
Self-Checking Monitor for NBTI Due Degradation 206
Are Our Design For Testability Features Fault Secure ? 205
Novel On-Chip Circuit for Jitter Testing in High-Speed PLLs 205
Modeling and Detection of Hotspot in Shaded Photovoltaic Cells 204
Multiple Transient Faults in Logic: An Issue for Next Generation ICs? 201
Low-Cost and High-Reduction Approaches for Power Droop during Launch-On-Shift Scan-Based Logic BIST 201
Checker No-Harm Alarm Robustness 200
Checker No-Harm Alarms and Design Approaches to Tolerate Them 200
Low-Cost Strategy to Mitigate the Impact of Aging on Latches’ Robustness 200
Hardware Reconfiguration Scheme for High Availability Systems 199
Intermittent and Transient Fault Diagnosis on Sparse Code Signatures 198
Impact of Aging Phenomena on Soft Error Susceptibility 198
Fast and Low-Cost Clock Deskew Buffer 197
Low Cost and Low Intrusive Approach to Test On-Line the Scheduler of High Performance Microprocessors 197
Can Clock Faults Be Detected Through Functional Test ? 196
Scalable Approach for Power Droop Reduction During Scan-Based Logic BIST 196
New Approaches for Power Binning of High Performance Microprocessors 196
Model for Thermal Behavior of Shaded Photovoltaic Cells Under Hot-Spot Condition 195
Novel Approach to Reduce Power Droop During Scan-Based Logic BIST 194
Function Inherent Code Checking: A New Low Cost On-Line Testing Approach for High Performance Microprocessor Control Logic 192
Impact of Bias Temperature Instability on Soft Error Susceptibility 192
Should We Make Our Design for Testability Schemes Fault Secure ? 191
On the Selection of Unidirectional Error detecting Codes for Self-Checking Circuits' Area Overhead and Performance Optimization 190
Fault secureness need for next generation high performance microprocessor design for testability structures 188
High-reliability Fault Tolerant Digital Systems in Nanometric Technologies: Characterization and Design Methodologies 188
Silent Data Corruption and Reliability Risks due to Faults Affecting High Performance Microprocessors’ Caches 187
Novel Approach to Clock Fault Testing for High Performance Microprocessors 187
Impact of aging on temperature measurements performed using a resistive temperature sensor with sensor-to-microcontroller direct interface 186
Path (Min) delay Faults and Their Impact on Self-Checking Circuits' Operation 185
Low-Cost Strategy for Bus Propagation Delay Reduction 184
Novel Low-Cost Aging Sensor 182
Low-Cost and Highly Reliable Detector for Transient and Crosstalk Faults Affecting FPGA Interconnects 180
Novel On-Chip Clock Jitter Measurement Scheme For High Performance Microprocessors 180
Low Cost NBTI Degradation Detection and Masking Approaches 179
Novel High Speed Robust Latch 176
Low-Cost On-Chip Clock Jitter Measurement Scheme 175
On-Transistor Level Gate Sizing for Increased Robustness to Transient Faults 175
Faults Affecting the Control Blocks of PV Arrays and Techniques for Their Concurrent Detection 175
On the Reliability of Clock Monitoring Units for Safety Critical Applications’ Microcontrollers 174
The Other Side of the Timing Equation: a Result of Clock Faults 174
Novel Compensation Scheme for Local Clocks of High Performance Microprocessors 173
Transient Fault and Soft Error On-Die Monitoring Scheme 173
Low-Cost Strategy to Detect Faults Affecting Scrubbers in SRAM-Based FPGAs 172
Aging Resilient Ring Oscillators for Reliable Physically Unclonable Functions (PUFs) 170
Low Cost Concurrent Error Detection Strategy for the Control Logic of High Performance Microprocessors and Its Application to the Instruction Decoder 170
Polynomial Based Key Distribution Scheme for WPAN 169
New Design For Testability Approach for Clock Fault Testing 163
Impact of Bias Temperature Instability (BTI) Aging Phenomenon on Clock Deskew Buffers 162
Latch Susceptibility to Transient Faults and New Hardening Approach 159
Polynomial Based Key Distribution Scheme for WPAN 156
Cryptanalysis of Simplified-AES Encrypted Communication 156
Inverters' Self-Checking Monitors for Reliable Photovoltaic Systems 155
Risks Associated with Faults within Test Pattern Compactors and Their Implications on Testing 155
Impact of Soft Errors on High Performance Autoencoders for Cyberattack Detection 154
Low-Cost Dynamic Compensation Scheme for Local Clocks of Next Generation High Performance Microprocessors 154
A PCI Express Based Data Acquisition System for the Monitoring of Code Traces of RISC-V Microprocessors 147
Reliability Risks Due to Faults Affecting Selectors of ReRAMs and Possible Solutions 147
RISC-V-based Platforms for HPC: Analyzing Non-functional Properties for Future HPC and Big-Data Clusters 134
Low Cost Scheme for On-Line Skew Compensation 133
Investigation of the Impact of BTI Aging Phenomenon on Analog Amplifiers 133
A Ring Oscillator Based Physical Unclonable Function with Enhanced Challenge Response Pairs to Improve the Security of Internet of Things Devices 129
Accuracy of NTC Thermistor Measurements Using the Sensor to Microcontroller Direct Interface 119
Impact of Operating Conditions on the Reliability of SRAM-Based Physical Unclonable Functions (PUFs) 110
Reliability of AI in Predicting the State of Health of Li-Ion Batteries 99
AI for Cyberattacks’ Detection in the Metaverse 96
ST-CAC: a low-cost crosstalk avoidance coding mechanism based on three-valued numerical system 95
Novel BTI Robust Ring-Oscillator-Based Physically Unclonable Function 92
Feasibility of Physical Unclonable Function (PUF) Implementation Using the Pull-up/Pull-down Resistances Integrated in Microcontrollers GPIO 92
Physical Unclonable Function (PUF) device based on single stage voltage amplifiers for secure signature generation in the Internet of Things 80
Physical Unclonable Functions’ Reliability Modeling for Wireless Sensor Networks 79
Risks of Silent Data Corruption Due to the Combined Effects of Latent Faults and Aging Phenomena Affecting FinFET-Based ICs 77
Data Analysis of Electrical Impedance Spectroscopy-Based Biosensors Using Artificial Neural Networks for Resource Constrained Devices 64
On-Line Test of Fully Integrated Voltage Regulators for High Performance Microprocessors of Autonomous Systems 63
FPGA Implemented RO-Based PUFs for User Authentication in the Metaverse 53
Reliable Fail Operational Multicore Microcontrollers for Metaverse Enabled Autonomous Vehicles 51
Totale 15.464
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Categoria #
all - tutte 39.192
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 39.192
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2021/20223.075 0 29 451 377 385 328 340 335 356 96 179 199
2022/20231.199 157 169 61 182 94 102 52 75 179 9 88 31
2023/2024454 33 68 44 20 51 142 14 11 12 31 10 18
2024/20251.785 96 184 116 110 446 101 164 45 26 106 95 296
2025/20264.943 319 410 752 355 503 260 460 200 973 299 235 177
2026/2027318 160 158 0 0 0 0 0 0 0 0 0 0
Totale 15.464