CRIS Current Research Information System

OMANA, MARTIN EUGENIO
 Distribuzione geografica
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Continente #
NA - Nord America 7.212
AS - Asia 4.195
EU - Europa 3.124
AF - Africa 240
SA - Sud America 205
Continente sconosciuto - Info sul continente non disponibili 5
OC - Oceania 3
Totale 14.984
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Nazione #
US - Stati Uniti d'America 7.122
CN - Cina 1.247
SG - Singapore 1.190
VN - Vietnam 841
GB - Regno Unito 705
IT - Italia 675
DE - Germania 389
SE - Svezia 285
HK - Hong Kong 255
FR - Francia 243
UA - Ucraina 236
IN - India 198
RU - Federazione Russa 156
BR - Brasile 140
KR - Corea 119
JP - Giappone 86
IE - Irlanda 79
BD - Bangladesh 76
NL - Olanda 73
BG - Bulgaria 72
TG - Togo 70
ZA - Sudafrica 67
CI - Costa d'Avorio 55
FI - Finlandia 49
MX - Messico 41
EE - Estonia 40
CA - Canada 38
PH - Filippine 37
TW - Taiwan 29
AR - Argentina 27
SC - Seychelles 19
PL - Polonia 18
TH - Thailandia 17
TR - Turchia 17
BE - Belgio 16
AT - Austria 15
IQ - Iraq 14
CH - Svizzera 12
GR - Grecia 11
PK - Pakistan 10
CO - Colombia 9
ID - Indonesia 9
PT - Portogallo 9
MY - Malesia 8
CL - Cile 7
ES - Italia 7
HR - Croazia 7
DK - Danimarca 6
EC - Ecuador 6
ET - Etiopia 6
KE - Kenya 6
PE - Perù 6
AE - Emirati Arabi Uniti 5
AL - Albania 4
EU - Europa 4
GE - Georgia 4
NO - Norvegia 4
RW - Ruanda 4
SA - Arabia Saudita 4
AM - Armenia 3
AU - Australia 3
IR - Iran 3
LB - Libano 3
LT - Lituania 3
PS - Palestinian Territory 3
RO - Romania 3
UY - Uruguay 3
BB - Barbados 2
BO - Bolivia 2
CR - Costa Rica 2
CZ - Repubblica Ceca 2
DZ - Algeria 2
EG - Egitto 2
IL - Israele 2
JO - Giordania 2
KG - Kirghizistan 2
MA - Marocco 2
NP - Nepal 2
OM - Oman 2
PA - Panama 2
PY - Paraguay 2
TN - Tunisia 2
UZ - Uzbekistan 2
VE - Venezuela 2
A2 - ???statistics.table.value.countryCode.A2??? 1
AW - Aruba 1
CY - Cipro 1
GA - Gabon 1
GF - Guiana Francese 1
GT - Guatemala 1
HN - Honduras 1
HU - Ungheria 1
JM - Giamaica 1
KH - Cambogia 1
KZ - Kazakistan 1
LK - Sri Lanka 1
LV - Lettonia 1
LY - Libia 1
MD - Moldavia 1
MO - Macao, regione amministrativa speciale della Cina 1
Totale 14.978
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Città #
Ann Arbor 2.189
Singapore 817
Southend 577
Fairfield 491
Ashburn 462
Dallas 345
Chandler 327
Wilmington 315
Hefei 306
Santa Clara 279
San Jose 268
Woodbridge 246
Hong Kong 231
Bologna 229
Ho Chi Minh City 200
Seattle 200
Hanoi 177
Houston 171
Cambridge 164
Jacksonville 159
Princeton 151
Beijing 150
Boardman 122
Seoul 104
Lauterbourg 80
Dublin 79
Los Angeles 77
Tokyo 76
Sofia 71
Council Bluffs 70
Dong Ket 70
Lomé 70
Westminster 62
Padova 61
Milan 58
Nanjing 58
Abidjan 55
Berlin 48
Buffalo 44
Frankfurt am Main 43
New York 43
Medford 37
Jinan 36
Saint Petersburg 34
Mülheim 33
Shenyang 33
San Diego 29
Bengaluru 28
Hebei 28
Guangzhou 27
Helsinki 27
Rome 27
Da Nang 24
Haiphong 24
Washington 24
Shanghai 23
Changsha 22
Chicago 22
Des Moines 18
Tianjin 18
Redondo Beach 17
Paris 16
Munich 15
Nuremberg 15
São Paulo 15
Zhengzhou 15
García 14
London 14
Montreal 14
Orem 14
Brussels 13
Nanchang 13
Taiyuan 13
Toronto 13
Fremont 12
Lappeenranta 12
Norwalk 12
Taipei 12
Amsterdam 11
Chennai 11
Dearborn 11
Ferrara 11
Hangzhou 11
Lanzhou 11
Mahé 11
Biên Hòa 10
Davao City 10
Fuzhou 10
Modena 10
Ninh Bình 10
Turku 10
Atlanta 9
Boston 9
Brooklyn 9
Falkenstein 9
Hải Dương 9
Kunming 9
Phủ Lý 9
Rimini 9
Verona 9
Totale 10.726
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Nome #
Low Cost and High Speed Embedded Two-Rail Code Checker 259
Model for Transient Fault Susceptibility of Combinational Circuits 237
Accurate Linear Model for SET Critical Charge Estimation 236
Sensors and embedded systems in agriculture and food analysis 226
On-Die Ring Oscillator Based Measurement Scheme for Process Parameter Variations and Clock Jitter 223
Novel Physical Unclonable Function Implementation for Microcontrollers and Field Programmable Gate Arrays 219
Clock Faults Induced Min and Max Delay Violations 218
Low-Area On-Chip Circuit for Jitter Measurement in a Phase-Locked Loop 217
Impact of Aging Phenomena on Latches’ Robustness 216
Fault-Tolerant Inverters for Reliable Photovoltaic Systems 215
Concurrent Detection of Faults Affecting Energy Harvesting Circuits of Self-Powered Wearable Sensors 214
High-Performance Robust Latches 214
Faults Affecting Energy-Harvesting Circuits of Self-Powered Wireless Sensors and Their Possible Concurrent Detection 214
Power droop reduction during Launch-On-Shift scan-based logic BIST 208
Early detection of photovoltaic system inverter faults 207
Self-Checking Monitor for NBTI Due Degradation 205
Novel On-Chip Circuit for Jitter Testing in High-Speed PLLs 204
Modeling and Detection of Hotspot in Shaded Photovoltaic Cells 204
Are Our Design For Testability Features Fault Secure ? 203
Multiple Transient Faults in Logic: An Issue for Next Generation ICs? 199
Checker No-Harm Alarms and Design Approaches to Tolerate Them 199
Low-Cost Strategy to Mitigate the Impact of Aging on Latches’ Robustness 199
Low-Cost and High-Reduction Approaches for Power Droop during Launch-On-Shift Scan-Based Logic BIST 199
Hardware Reconfiguration Scheme for High Availability Systems 198
Checker No-Harm Alarm Robustness 197
Intermittent and Transient Fault Diagnosis on Sparse Code Signatures 196
Impact of Aging Phenomena on Soft Error Susceptibility 196
Low Cost and Low Intrusive Approach to Test On-Line the Scheduler of High Performance Microprocessors 195
Scalable Approach for Power Droop Reduction During Scan-Based Logic BIST 195
Fast and Low-Cost Clock Deskew Buffer 194
Can Clock Faults Be Detected Through Functional Test ? 194
New Approaches for Power Binning of High Performance Microprocessors 194
Model for Thermal Behavior of Shaded Photovoltaic Cells Under Hot-Spot Condition 191
Impact of Bias Temperature Instability on Soft Error Susceptibility 191
Function Inherent Code Checking: A New Low Cost On-Line Testing Approach for High Performance Microprocessor Control Logic 190
Novel Approach to Reduce Power Droop During Scan-Based Logic BIST 190
On the Selection of Unidirectional Error detecting Codes for Self-Checking Circuits' Area Overhead and Performance Optimization 189
Should We Make Our Design for Testability Schemes Fault Secure ? 189
Fault secureness need for next generation high performance microprocessor design for testability structures 187
Novel Approach to Clock Fault Testing for High Performance Microprocessors 186
High-reliability Fault Tolerant Digital Systems in Nanometric Technologies: Characterization and Design Methodologies 186
Path (Min) delay Faults and Their Impact on Self-Checking Circuits' Operation 184
Silent Data Corruption and Reliability Risks due to Faults Affecting High Performance Microprocessors’ Caches 183
Low-Cost Strategy for Bus Propagation Delay Reduction 181
Impact of aging on temperature measurements performed using a resistive temperature sensor with sensor-to-microcontroller direct interface 180
Novel Low-Cost Aging Sensor 178
Low Cost NBTI Degradation Detection and Masking Approaches 178
Low-Cost and Highly Reliable Detector for Transient and Crosstalk Faults Affecting FPGA Interconnects 177
Novel On-Chip Clock Jitter Measurement Scheme For High Performance Microprocessors 177
Low-Cost On-Chip Clock Jitter Measurement Scheme 174
On the Reliability of Clock Monitoring Units for Safety Critical Applications’ Microcontrollers 173
The Other Side of the Timing Equation: a Result of Clock Faults 173
On-Transistor Level Gate Sizing for Increased Robustness to Transient Faults 173
Faults Affecting the Control Blocks of PV Arrays and Techniques for Their Concurrent Detection 173
Novel High Speed Robust Latch 173
Novel Compensation Scheme for Local Clocks of High Performance Microprocessors 172
Transient Fault and Soft Error On-Die Monitoring Scheme 172
Low-Cost Strategy to Detect Faults Affecting Scrubbers in SRAM-Based FPGAs 169
Aging Resilient Ring Oscillators for Reliable Physically Unclonable Functions (PUFs) 169
Low Cost Concurrent Error Detection Strategy for the Control Logic of High Performance Microprocessors and Its Application to the Instruction Decoder 169
Polynomial Based Key Distribution Scheme for WPAN 167
New Design For Testability Approach for Clock Fault Testing 161
Impact of Bias Temperature Instability (BTI) Aging Phenomenon on Clock Deskew Buffers 161
Latch Susceptibility to Transient Faults and New Hardening Approach 157
Polynomial Based Key Distribution Scheme for WPAN 155
Cryptanalysis of Simplified-AES Encrypted Communication 155
Inverters' Self-Checking Monitors for Reliable Photovoltaic Systems 154
Risks Associated with Faults within Test Pattern Compactors and Their Implications on Testing 154
Low-Cost Dynamic Compensation Scheme for Local Clocks of Next Generation High Performance Microprocessors 152
Impact of Soft Errors on High Performance Autoencoders for Cyberattack Detection 151
Reliability Risks Due to Faults Affecting Selectors of ReRAMs and Possible Solutions 145
A PCI Express Based Data Acquisition System for the Monitoring of Code Traces of RISC-V Microprocessors 138
Low Cost Scheme for On-Line Skew Compensation 132
RISC-V-based Platforms for HPC: Analyzing Non-functional Properties for Future HPC and Big-Data Clusters 131
Investigation of the Impact of BTI Aging Phenomenon on Analog Amplifiers 129
A Ring Oscillator Based Physical Unclonable Function with Enhanced Challenge Response Pairs to Improve the Security of Internet of Things Devices 127
Accuracy of NTC Thermistor Measurements Using the Sensor to Microcontroller Direct Interface 115
Reliability of AI in Predicting the State of Health of Li-Ion Batteries 98
AI for Cyberattacks’ Detection in the Metaverse 95
Impact of Operating Conditions on the Reliability of SRAM-Based Physical Unclonable Functions (PUFs) 93
ST-CAC: a low-cost crosstalk avoidance coding mechanism based on three-valued numerical system 93
Novel BTI Robust Ring-Oscillator-Based Physically Unclonable Function 91
Feasibility of Physical Unclonable Function (PUF) Implementation Using the Pull-up/Pull-down Resistances Integrated in Microcontrollers GPIO 87
Physical Unclonable Functions’ Reliability Modeling for Wireless Sensor Networks 74
Risks of Silent Data Corruption Due to the Combined Effects of Latent Faults and Aging Phenomena Affecting FinFET-Based ICs 72
Physical Unclonable Function (PUF) device based on single stage voltage amplifiers for secure signature generation in the Internet of Things 69
Data Analysis of Electrical Impedance Spectroscopy-Based Biosensors Using Artificial Neural Networks for Resource Constrained Devices 57
On-Line Test of Fully Integrated Voltage Regulators for High Performance Microprocessors of Autonomous Systems 53
FPGA Implemented RO-Based PUFs for User Authentication in the Metaverse 46
Reliable Fail Operational Multicore Microcontrollers for Metaverse Enabled Autonomous Vehicles 44
Totale 15.177
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Categoria #
all - tutte 37.815
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 37.815
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2021/20223.168 93 29 451 377 385 328 340 335 356 96 179 199
2022/20231.199 157 169 61 182 94 102 52 75 179 9 88 31
2023/2024454 33 68 44 20 51 142 14 11 12 31 10 18
2024/20251.785 96 184 116 110 446 101 164 45 26 106 95 296
2025/20264.943 319 410 752 355 503 260 460 200 973 299 235 177
2026/202731 31 0 0 0 0 0 0 0 0 0 0 0
Totale 15.177