Performance degradation of integrated circuits due to aging effects, such as Negative Bias Temperature Instability (NBTI), is becoming of great concern for current and future CMOS technology. Here we introduce an aging sensor able to detect such degradations in the combinational part of a critical data-path. It requires lower area than recently proposed alternative solutions, and a lower or comparable power consumption.
M. Omaña, D. Rossi, N. Bosio, C. Metra (2010). Novel Low-Cost Aging Sensor. NEW YORK : N.M. Amato, H. Franke, P.H.J. Kelly [10.1145/1787275.1787299].
Novel Low-Cost Aging Sensor
OMANA, MARTIN EUGENIO;ROSSI, DANIELE;METRA, CECILIA
2010
Abstract
Performance degradation of integrated circuits due to aging effects, such as Negative Bias Temperature Instability (NBTI), is becoming of great concern for current and future CMOS technology. Here we introduce an aging sensor able to detect such degradations in the combinational part of a critical data-path. It requires lower area than recently proposed alternative solutions, and a lower or comparable power consumption.File in questo prodotto:
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