Titolo	Autore(i)	Anno	Periodico	Editore	Tipo
1	Won't On-Chip Clock Calibration Guarantee Performance Boost and Product Quality?	C. Metra; D. Rossi; TM Mak	2007	IEEE TRANSACTIONS ON COMPUTERS		1.01 Articolo in rivista
2	Transient Fault and Soft Error On-Die Monitor	D. Rossi; M. Omaña; C. Metra	2010		G. Chapman, F. Salice, H. Ito, S. Tragoudas	4.01 Contributo in Atti di convegno
3	The Other Side of the Timing Equation: a Result of Clock Faults	M. Omaña; D. Rossi; J. M. Cazeaux; TM. Mak; C. Metra	2005		R. Aitken, H. Ito, C. Metra, N. Park	4.01 Contributo in Atti di convegno
4	Simultaneous Switching Noise Analysis: The Relation Between Bus Layout and Coding	D. Rossi; A. K. Nieuwland; C. Metra	2008	IEEE DESIGN & TEST OF COMPUTERS		1.01 Articolo in rivista
5	Self-Checking Voter for High Speed TMR Systems	J. M. Cazeaux; D. Rossi; C. Metra	2005	JOURNAL OF ELECTRONIC TESTING		1.01 Articolo in rivista
6	Self-Checking Monitor for NBTI Due Degradation	M. Omaña; D. Rossi; N. Bosio; C. Metra	2010		F. Azais, K. Chakrabarty	4.01 Contributo in Atti di convegno
7	Risks for Signal Integrity in System in Package and Possible Remedies	D. Rossi; P. Angelini; C. Metra; G. Campardo; G.P. Vanalli	2008		P. Girard, Z. Peng	4.01 Contributo in Atti di convegno
8	Resistive Crossbar Switching Networks to Implement Inherently Fault Tolerant Nano LUTs	X. Ma; J. Huang; F. Chiminazzo; D. Rossi; C. Metra; F. Lombardi	2008		C. Metra, A. DeHon	4.01 Contributo in Atti di convegno
9	Power droop reduction during Launch-On-Shift scan-based logic BIST	M. Omaña; D. Rossi; E. Beniamino; C. Metra; C. Tirumurti; R. Galivanche	2014			4.01 Contributo in Atti di convegno
10	Power Consumption of Fault Tolerant Busses	Rossi D.; Nieuwland A.K.; van Dijk V.ES.; Kleihorst R.P.; Metra C.	2008	IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS		1.01 Articolo in rivista
11	Polynomial Based Key Distribution Scheme for WPAN	R. Vimalathithan; D. Rossi; M. Omaña; C. Metra; M.L.Valarmathi	2013	MALAYSIAN JOURNAL OF MATHEMATICAL SCIENCES		1.01 Articolo in rivista
12	Polynomial Based Key Distribution Scheme for WPAN	Vimalathithan R.; D. Rossi; M. Omaña; C. Metra; M. L. Valarmathi	2012		s.n	4.01 Contributo in Atti di convegno
13	Path (Min) delay Faults and Their Impact on Self-Checking Circuits' Operation	C. Metra; M. Omaña; D. Rossi; J.M. Cazeaux; TM Mak	2006		C. Metra, M. Nicolaidis, R. Aitken, R. Leveugle	4.01 Contributo in Atti di convegno
14	On-Transistor Level Gate Sizing for Increased Robustness to Transient Faults	J. M. Cazeaux; D. Rossi; M. Omaña; A. Chatterjee; C. Metra	2005		C. Metra, K. Roy, L. Anghel, M. Nicolaidis	4.01 Contributo in Atti di convegno
15	Novel Low-Cost Aging Sensor	M. Omaña; D. Rossi; N. Bosio; C. Metra	2010		N.M. Amato, H. Franke, P.H.J. Kelly	4.01 Contributo in Atti di convegno
16	Novel High Speed Robust Latch	M. Omaña; D. Rossi; C. Metra	2009		D. Gizopoulos, M. Tehranipoor, S. Tragoudas	4.01 Contributo in Atti di convegno
17	Novel Approach to Reduce Power Droop During Scan-Based Logic BIST	M. Omaña; D. Rossi; F. Fuzzi; C. Metra; C. Tirumurti; R. Galivanche	2013		IEEE Computer Society	4.01 Contributo in Atti di convegno
18	New High Speed CMOS Self-Checking Voter	J. M. Cazeaux; D. Rossi; C. Metra	2004		C. Metra, R. Leveugle, M. Nicolaidis, J. Teixeira	4.01 Contributo in Atti di convegno
19	New ECC for Crosstalk Effect Minimization	D. Rossi; A. K. Nieuwland; A. Katoch; C. Metra	2005	IEEE DESIGN & TEST OF COMPUTERS		1.01 Articolo in rivista
20	Multiple Transient Faults in Logic: An Issue for Next Generation ICs?	D. Rossi; M. Omaña; F. Toma; C. Metra	2005		R. Aitken, H. Ito, C. Metra, N. Park	4.01 Contributo in Atti di convegno