ROSSI, DANIELE
Dettaglio
ROSSI, DANIELE
DIPARTIMENTO DI INGEGNERIA DELL'ENERGIA ELETTRICA E DELL'INFORMAZIONE "GUGLIELMO MARCONI"
Pubblicazioni
Risultati 1 - 20 di 55 (tempo di esecuzione: 0.0 secondi).
Titolo | Autore(i) | Anno | Periodico | Editore | Tipo | File | |
---|---|---|---|---|---|---|---|
1 | A Novel Dual-Walled CNT Bus Architecture with Reduced Cross-Coupling Features | J.M. Cazeaux; D. Rossi; C. Metra; F. Lombardi | 2006 | C. Lau, D. Janes, S. Bandyopadhyay, M. Cahay | 4.01 Contributo in Atti di convegno | - | |
2 | Accurate Linear Model for SET Critical Charge Estimation | D. Rossi; J.M. Cazeaux; M. Omaña; C. Metra; A. Chatterjee | 2009 | IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS | 1.01 Articolo in rivista | - | |
3 | Analysis of the Impact of Bus Implemented EDCs on On-Chip SSN | D. Rossi; C. Steiner; C. Metra | 2006 | D. Sciuto, G. Gielen | 4.01 Contributo in Atti di convegno | - | |
4 | Can Clock Faults Be Detected Through Functional Test ? | C. Metra; D. Rossi; M. Omaña; J.M. Cazeaux; TM Mak | 2006 | B. Straube, O. Novak | 4.01 Contributo in Atti di convegno | - | |
5 | Checker No-Harm Alarm Robustness | D. Rossi; M. Omaña; C. Metra; A. Pagni | 2006 | C. Metra, M. Nicolaidis, R. Aitken, R. Leveugle | 4.01 Contributo in Atti di convegno | - | |
6 | Checker No-Harm Alarms and Design Approaches to Tolerate Them | Daniele Rossi; Martin Omaña; Cecilia Metra | 2008 | JOURNAL OF ELECTRONIC TESTING | 1.01 Articolo in rivista | - | |
7 | Clock Faults Induced Min and Max Delay Violations | D. Rossi; M. Omaña; J. M. Cazeaux; C. Metra; TM. Mak | 2014 | JOURNAL OF ELECTRONIC TESTING | 1.01 Articolo in rivista | - | |
8 | Coding Techniques for Low Switching Noise in Fault Tolerant Busses | A. K. Nieuwland; A. Katoch; D. Rossi; C. Metra | 2005 | C. Metra, K. Roy, L. Anghel, M. Nicolaidis | 4.01 Contributo in Atti di convegno | - | |
9 | Configurable Error Control Scheme for NoC Signal Integrity | D. Rossi; P. Angelini; C. Metra | 2007 | M. Nicolaidis, A. Paschalis | 4.01 Contributo in Atti di convegno | - | |
10 | Cryptanalysis of Simplified-AES Encrypted Communication | Vimalathithan, R.; Rossi, D.; Omana, M.; Metra, C.; Valarmathi, M. L. | 2015 | INTERNATIONAL JOURNAL OF COMPUTER SCIENCE AND INFORMATION SECURITY | 1.01 Articolo in rivista | - | |
11 | Error correcting code analysis for cache memory high reliability and performance | D. Rossi; N. Timoncini; M. Spica; C. Metra | 2011 | B. M. Al-Hashimi, E. Macii | 4.01 Contributo in Atti di convegno | - | |
12 | Exploiting ECC Redundancy to Minimize Crosstalk Impact | D. Rossi; A. K. Nieuwland; A. Katoch; C. Metra | 2005 | IEEE DESIGN & TEST OF COMPUTERS | 1.01 Articolo in rivista | - | |
13 | Fast and Low-Cost Clock Deskew Buffer | M. Omaña; D. Rossi; C. Metra | 2004 | R.Aitken, and A.Salsano, and R.Velazco, and X.Sun | 4.01 Contributo in Atti di convegno | - | |
14 | Faults Affecting Energy-Harvesting Circuits of Self-Powered Wireless Sensors and Their Possible Concurrent Detection | Omaña M.; Rossi D.; Giaffreda D.; Specchia R.; Metra C.; Marzencki M.; Kaminska B. | 2013 | IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS | 1.01 Articolo in rivista | - | |
15 | Faults Affecting the Control Blocks of PV Arrays and Techniques for Their Concurrent Detection | M. Omana; D. Rossi; G. Collepalumbo; C. Metra; F. Lombardi | 2012 | IEEE Computer Society | 4.01 Contributo in Atti di convegno | - | |
16 | Function Inherent Code Checking: A New Low Cost On-Line Testing Approach for High Performance Microprocessor Control Logic | C. Metra; D. Rossi; M. Omaña; A. Jas; R. Galivanche | 2008 | P. Girard, Z. Peng | 4.01 Contributo in Atti di convegno | - | |
17 | High-Performance Robust Latches | M. Omaña; D. Rossi; C. Metra | 2010 | IEEE TRANSACTIONS ON COMPUTERS | 1.01 Articolo in rivista | - | |
18 | High-reliability Fault Tolerant Digital Systems in Nanometric Technologies: Characterization and Design Methodologies | C. Bolchini; A. Miele; C. Sandionigi; M. Ottavi; S. Pontarelli; A. Salsano; C. Metra; M. Omaña; D.... Rossi; M. Sonza Reorda; L. Sterpone; M. Violante; S. Gerardin; M. Bagatin; A. Paccagnella | 2012 | IEEE Computer Society | 4.01 Contributo in Atti di convegno | - | |
19 | Impact of Aging Phenomena on Latches’ Robustness | Omana, MARTIN EUGENIO; Rossi, Daniele; Edara, T.; Metra, Cecilia | 2016 | IEEE TRANSACTIONS ON NANOTECHNOLOGY | 1.01 Articolo in rivista | - | |
20 | Impact of Aging Phenomena on Soft Error Susceptibility | D. Rossi; M. Omaña; C. Metra; A. Paccagnella | 2011 | P. Joshi, M. Violante, G. Chapman, F. Salice | 4.01 Contributo in Atti di convegno | - |