ROSSI, DANIELE

ROSSI, DANIELE  

CENTRO RICERCA SISTEMI ELETTRONICI INGEGN.INF. E TELECOM."ERCOLE DE CASTRO"  

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Risultati 1 - 20 di 55 (tempo di esecuzione: 0.058 secondi).
Titolo Autore(i) Anno Periodico Editore Tipo File
Impact of Aging Phenomena on Latches’ Robustness Omana, MARTIN EUGENIO; Rossi, Daniele; Edara, T.; Metra, Cecilia 2016-01-01 IEEE TRANSACTIONS ON NANOTECHNOLOGY - 1.01 Articolo in rivista -
Low-Cost and High-Reduction Approaches for Power Droop during Launch-On-Shift Scan-Based Logic BIST Omaña, M.; Rossi, D.; Beniamino, E.; Metra, C.; Tirumurti, C.; Galivanche, R. 2016-01-01 IEEE TRANSACTIONS ON COMPUTERS - 1.01 Articolo in rivista -
Cryptanalysis of Simplified-AES Encrypted Communication Vimalathithan, R.; Rossi, D.; Omana, M.; Metra, C.; Valarmathi, M. L. 2015-01-01 INTERNATIONAL JOURNAL OF COMPUTER SCIENCE AND INFORMATION SECURITY - 1.01 Articolo in rivista -
Impact of Bias Temperature Instability on Soft Error Susceptibility D. Rossi; M. Omaña; C. Metra; A. Paccagnella 2015-01-01 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS - 1.01 Articolo in rivista -
Low-Cost On-Chip Clock Jitter Measurement Scheme M. Omaña; D. Rossi; D. Giaffreda; C. Metra; TM Mak; A. Rahman; S. Tam 2015-01-01 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS - 1.01 Articolo in rivista -
Modeling and Detection of Hotspot in Shaded Photovoltaic Cells Rossi, Daniele; Omana, Martin; Giaffreda, Daniele; Metra, Cecilia 2015-01-01 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS - 1.01 Articolo in rivista -
Clock Faults Induced Min and Max Delay Violations D. Rossi; M. Omaña; J. M. Cazeaux; C. Metra; TM. Mak 2014-01-01 JOURNAL OF ELECTRONIC TESTING - 1.01 Articolo in rivista -
Power droop reduction during Launch-On-Shift scan-based logic BIST M. Omaña; D. Rossi; E. Beniamino; C. Metra; C. Tirumurti; R. Galivanche 2014-01-01 - - 4.01 Contributo in Atti di convegno -
Faults Affecting Energy-Harvesting Circuits of Self-Powered Wireless Sensors and Their Possible Concurrent Detection Omaña M.; Rossi D.; Giaffreda D.; Specchia R.; Metra C.; Marzencki M.; Kaminska B. 2013-01-01 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS - 1.01 Articolo in rivista -
Low Cost Concurrent Error Detection Strategy for the Control Logic of High Performance Microprocessors and Its Application to the Instruction Decoder D. Rossi; M. Omaña; G. Garrammone; C. Metra; A. Jas; and R. Galivanche 2013-01-01 JOURNAL OF ELECTRONIC TESTING - 1.01 Articolo in rivista -
Low Cost NBTI Degradation Detection and Masking Approaches M. Omana; D. Rossi; N. Bosio; C. Metra 2013-01-01 IEEE TRANSACTIONS ON COMPUTERS - 1.01 Articolo in rivista -
Novel Approach to Reduce Power Droop During Scan-Based Logic BIST M. Omaña; D. Rossi; F. Fuzzi; C. Metra; C. Tirumurti; R. Galivanche 2013-01-01 - IEEE Computer Society 4.01 Contributo in Atti di convegno -
Polynomial Based Key Distribution Scheme for WPAN R. Vimalathithan; D. Rossi; M. Omaña; C. Metra; M.L.Valarmathi 2013-01-01 MALAYSIAN JOURNAL OF MATHEMATICAL SCIENCES - 1.01 Articolo in rivista -
Faults Affecting the Control Blocks of PV Arrays and Techniques for Their Concurrent Detection M. Omana; D. Rossi; G. Collepalumbo; C. Metra; F. Lombardi 2012-01-01 - IEEE Computer Society 4.01 Contributo in Atti di convegno -
High-reliability Fault Tolerant Digital Systems in Nanometric Technologies: Characterization and Design Methodologies C. Bolchini; A. Miele; C. Sandionigi; M. Ottavi; S. Pontarelli; A. Salsano; C. Metra; M. Omaña; D.... Rossi; M. Sonza Reorda; L. Sterpone; M. Violante; S. Gerardin; M. Bagatin; A. Paccagnella 2012-01-01 - IEEE Computer Society 4.01 Contributo in Atti di convegno -
Polynomial Based Key Distribution Scheme for WPAN Vimalathithan R.; D. Rossi; M. Omaña; C. Metra; M. L. Valarmathi 2012-01-01 - s.n 4.01 Contributo in Atti di convegno -
Error correcting code analysis for cache memory high reliability and performance D. Rossi; N. Timoncini; M. Spica; C. Metra 2011-01-01 - B. M. Al-Hashimi, E. Macii 4.01 Contributo in Atti di convegno -
Impact of Aging Phenomena on Soft Error Susceptibility D. Rossi; M. Omaña; C. Metra; A. Paccagnella 2011-01-01 - P. Joshi, M. Violante, G. Chapman, F. Salice 4.01 Contributo in Atti di convegno -
Model for Thermal Behavior of Shaded Photovoltaic Cells Under Hot-Spot Condition D. Giaffreda; M. Omaña; D. Rossi; C. Metra 2011-01-01 - P. Joshi, M. Violante, G. Chapman, F. Salice 4.01 Contributo in Atti di convegno -
High-Performance Robust Latches M. Omaña; D. Rossi; C. Metra 2010-01-01 IEEE TRANSACTIONS ON COMPUTERS - 1.01 Articolo in rivista -