ROSSI, DANIELE
ROSSI, DANIELE
CENTRO RICERCA SISTEMI ELETTRONICI INGEGN.INF. E TELECOM."ERCOLE DE CASTRO"
Impact of Aging Phenomena on Latches’ Robustness
2016 Omana, MARTIN EUGENIO; Rossi, Daniele; Edara, T.; Metra, Cecilia
Low-Cost and High-Reduction Approaches for Power Droop during Launch-On-Shift Scan-Based Logic BIST
2016 Omaña, M.; Rossi, D.; Beniamino, E.; Metra, C.; Tirumurti, C.; Galivanche, R.
Cryptanalysis of Simplified-AES Encrypted Communication
2015 Vimalathithan, R.; Rossi, D.; Omana, M.; Metra, C.; Valarmathi, M. L.
Impact of Bias Temperature Instability on Soft Error Susceptibility
2015 D. Rossi; M. Omaña; C. Metra; A. Paccagnella
Low-Cost On-Chip Clock Jitter Measurement Scheme
2015 M. Omaña; D. Rossi; D. Giaffreda; C. Metra; TM Mak; A. Rahman; S. Tam
Modeling and Detection of Hotspot in Shaded Photovoltaic Cells
2015 Rossi, Daniele; Omana, Martin; Giaffreda, Daniele; Metra, Cecilia
Clock Faults Induced Min and Max Delay Violations
2014 D. Rossi; M. Omaña; J. M. Cazeaux; C. Metra; TM. Mak
Power droop reduction during Launch-On-Shift scan-based logic BIST
2014 M. Omaña; D. Rossi; E. Beniamino; C. Metra; C. Tirumurti; R. Galivanche
Faults Affecting Energy-Harvesting Circuits of Self-Powered Wireless Sensors and Their Possible Concurrent Detection
2013 Omaña M.; Rossi D.; Giaffreda D.; Specchia R.; Metra C.; Marzencki M.; Kaminska B.
Low Cost Concurrent Error Detection Strategy for the Control Logic of High Performance Microprocessors and Its Application to the Instruction Decoder
2013 D. Rossi; M. Omaña; G. Garrammone; C. Metra; A. Jas; and R. Galivanche
Low Cost NBTI Degradation Detection and Masking Approaches
2013 M. Omana; D. Rossi; N. Bosio; C. Metra
Novel Approach to Reduce Power Droop During Scan-Based Logic BIST
2013 M. Omaña; D. Rossi; F. Fuzzi; C. Metra; C. Tirumurti; R. Galivanche
Polynomial Based Key Distribution Scheme for WPAN
2013 R. Vimalathithan; D. Rossi; M. Omaña; C. Metra; M.L.Valarmathi
Faults Affecting the Control Blocks of PV Arrays and Techniques for Their Concurrent Detection
2012 M. Omana; D. Rossi; G. Collepalumbo; C. Metra; F. Lombardi
High-reliability Fault Tolerant Digital Systems in Nanometric Technologies: Characterization and Design Methodologies
2012 C. Bolchini; A. Miele; C. Sandionigi; M. Ottavi; S. Pontarelli; A. Salsano; C. Metra; M. Omaña; D. Rossi; M. Sonza Reorda; L. Sterpone; M. Violante; S. Gerardin; M. Bagatin; A. Paccagnella
Polynomial Based Key Distribution Scheme for WPAN
2012 Vimalathithan R.; D. Rossi; M. Omaña; C. Metra; M. L. Valarmathi
Error correcting code analysis for cache memory high reliability and performance
2011 D. Rossi; N. Timoncini; M. Spica; C. Metra
Impact of Aging Phenomena on Soft Error Susceptibility
2011 D. Rossi; M. Omaña; C. Metra; A. Paccagnella
Model for Thermal Behavior of Shaded Photovoltaic Cells Under Hot-Spot Condition
2011 D. Giaffreda; M. Omaña; D. Rossi; C. Metra
High-Performance Robust Latches
2010 M. Omaña; D. Rossi; C. Metra
| Titolo | Autore(i) | Anno | Periodico | Editore | Tipo | File |
|---|---|---|---|---|---|---|
| Impact of Aging Phenomena on Latches’ Robustness | Omana, MARTIN EUGENIO; Rossi, Daniele; Edara, T.; Metra, Cecilia | 2016-01-01 | IEEE TRANSACTIONS ON NANOTECHNOLOGY | - | 1.01 Articolo in rivista | - |
| Low-Cost and High-Reduction Approaches for Power Droop during Launch-On-Shift Scan-Based Logic BIST | Omaña, M.; Rossi, D.; Beniamino, E.; Metra, C.; Tirumurti, C.; Galivanche, R. | 2016-01-01 | IEEE TRANSACTIONS ON COMPUTERS | - | 1.01 Articolo in rivista | - |
| Cryptanalysis of Simplified-AES Encrypted Communication | Vimalathithan, R.; Rossi, D.; Omana, M.; Metra, C.; Valarmathi, M. L. | 2015-01-01 | INTERNATIONAL JOURNAL OF COMPUTER SCIENCE AND INFORMATION SECURITY | - | 1.01 Articolo in rivista | - |
| Impact of Bias Temperature Instability on Soft Error Susceptibility | D. Rossi; M. Omaña; C. Metra; A. Paccagnella | 2015-01-01 | IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS | - | 1.01 Articolo in rivista | - |
| Low-Cost On-Chip Clock Jitter Measurement Scheme | M. Omaña; D. Rossi; D. Giaffreda; C. Metra; TM Mak; A. Rahman; S. Tam | 2015-01-01 | IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS | - | 1.01 Articolo in rivista | - |
| Modeling and Detection of Hotspot in Shaded Photovoltaic Cells | Rossi, Daniele; Omana, Martin; Giaffreda, Daniele; Metra, Cecilia | 2015-01-01 | IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS | - | 1.01 Articolo in rivista | - |
| Clock Faults Induced Min and Max Delay Violations | D. Rossi; M. Omaña; J. M. Cazeaux; C. Metra; TM. Mak | 2014-01-01 | JOURNAL OF ELECTRONIC TESTING | - | 1.01 Articolo in rivista | - |
| Power droop reduction during Launch-On-Shift scan-based logic BIST | M. Omaña; D. Rossi; E. Beniamino; C. Metra; C. Tirumurti; R. Galivanche | 2014-01-01 | - | - | 4.01 Contributo in Atti di convegno | - |
| Faults Affecting Energy-Harvesting Circuits of Self-Powered Wireless Sensors and Their Possible Concurrent Detection | Omaña M.; Rossi D.; Giaffreda D.; Specchia R.; Metra C.; Marzencki M.; Kaminska B. | 2013-01-01 | IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS | - | 1.01 Articolo in rivista | - |
| Low Cost Concurrent Error Detection Strategy for the Control Logic of High Performance Microprocessors and Its Application to the Instruction Decoder | D. Rossi; M. Omaña; G. Garrammone; C. Metra; A. Jas; and R. Galivanche | 2013-01-01 | JOURNAL OF ELECTRONIC TESTING | - | 1.01 Articolo in rivista | - |
| Low Cost NBTI Degradation Detection and Masking Approaches | M. Omana; D. Rossi; N. Bosio; C. Metra | 2013-01-01 | IEEE TRANSACTIONS ON COMPUTERS | - | 1.01 Articolo in rivista | - |
| Novel Approach to Reduce Power Droop During Scan-Based Logic BIST | M. Omaña; D. Rossi; F. Fuzzi; C. Metra; C. Tirumurti; R. Galivanche | 2013-01-01 | - | IEEE Computer Society | 4.01 Contributo in Atti di convegno | - |
| Polynomial Based Key Distribution Scheme for WPAN | R. Vimalathithan; D. Rossi; M. Omaña; C. Metra; M.L.Valarmathi | 2013-01-01 | MALAYSIAN JOURNAL OF MATHEMATICAL SCIENCES | - | 1.01 Articolo in rivista | - |
| Faults Affecting the Control Blocks of PV Arrays and Techniques for Their Concurrent Detection | M. Omana; D. Rossi; G. Collepalumbo; C. Metra; F. Lombardi | 2012-01-01 | - | IEEE Computer Society | 4.01 Contributo in Atti di convegno | - |
| High-reliability Fault Tolerant Digital Systems in Nanometric Technologies: Characterization and Design Methodologies | C. Bolchini; A. Miele; C. Sandionigi; M. Ottavi; S. Pontarelli; A. Salsano; C. Metra; M. Omaña; D.... Rossi; M. Sonza Reorda; L. Sterpone; M. Violante; S. Gerardin; M. Bagatin; A. Paccagnella | 2012-01-01 | - | IEEE Computer Society | 4.01 Contributo in Atti di convegno | - |
| Polynomial Based Key Distribution Scheme for WPAN | Vimalathithan R.; D. Rossi; M. Omaña; C. Metra; M. L. Valarmathi | 2012-01-01 | - | s.n | 4.01 Contributo in Atti di convegno | - |
| Error correcting code analysis for cache memory high reliability and performance | D. Rossi; N. Timoncini; M. Spica; C. Metra | 2011-01-01 | - | B. M. Al-Hashimi, E. Macii | 4.01 Contributo in Atti di convegno | - |
| Impact of Aging Phenomena on Soft Error Susceptibility | D. Rossi; M. Omaña; C. Metra; A. Paccagnella | 2011-01-01 | - | P. Joshi, M. Violante, G. Chapman, F. Salice | 4.01 Contributo in Atti di convegno | - |
| Model for Thermal Behavior of Shaded Photovoltaic Cells Under Hot-Spot Condition | D. Giaffreda; M. Omaña; D. Rossi; C. Metra | 2011-01-01 | - | P. Joshi, M. Violante, G. Chapman, F. Salice | 4.01 Contributo in Atti di convegno | - |
| High-Performance Robust Latches | M. Omaña; D. Rossi; C. Metra | 2010-01-01 | IEEE TRANSACTIONS ON COMPUTERS | - | 1.01 Articolo in rivista | - |