ROSSI, DANIELE

ROSSI, DANIELE  

CENTRO RICERCA SISTEMI ELETTRONICI INGEGN.INF. E TELECOM."ERCOLE DE CASTRO"  

Risultati 1 - 20 di 55 (tempo di esecuzione: 0.033 secondi).
Titolo Autore(i) Anno Periodico Editore Tipo File
A Novel Dual-Walled CNT Bus Architecture with Reduced Cross-Coupling Features J.M. Cazeaux; D. Rossi; C. Metra; F. Lombardi 2006-01-01 - C. Lau, D. Janes, S. Bandyopadhyay, M. Cahay 4.01 Contributo in Atti di convegno -
Accurate Linear Model for SET Critical Charge Estimation D. Rossi; J.M. Cazeaux; M. Omaña; C. Metra; A. Chatterjee 2009-01-01 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS - 1.01 Articolo in rivista -
Analysis of the Impact of Bus Implemented EDCs on On-Chip SSN D. Rossi; C. Steiner; C. Metra 2006-01-01 - D. Sciuto, G. Gielen 4.01 Contributo in Atti di convegno -
Can Clock Faults Be Detected Through Functional Test ? C. Metra; D. Rossi; M. Omaña; J.M. Cazeaux; TM Mak 2006-01-01 - B. Straube, O. Novak 4.01 Contributo in Atti di convegno -
Checker No-Harm Alarm Robustness D. Rossi; M. Omaña; C. Metra; A. Pagni 2006-01-01 - C. Metra, M. Nicolaidis, R. Aitken, R. Leveugle 4.01 Contributo in Atti di convegno -
Checker No-Harm Alarms and Design Approaches to Tolerate Them Daniele Rossi; Martin Omaña; Cecilia Metra 2008-01-01 JOURNAL OF ELECTRONIC TESTING - 1.01 Articolo in rivista -
Clock Faults Induced Min and Max Delay Violations D. Rossi; M. Omaña; J. M. Cazeaux; C. Metra; TM. Mak 2014-01-01 JOURNAL OF ELECTRONIC TESTING - 1.01 Articolo in rivista -
Coding Techniques for Low Switching Noise in Fault Tolerant Busses A. K. Nieuwland; A. Katoch; D. Rossi; C. Metra 2005-01-01 - C. Metra, K. Roy, L. Anghel, M. Nicolaidis 4.01 Contributo in Atti di convegno -
Configurable Error Control Scheme for NoC Signal Integrity D. Rossi; P. Angelini; C. Metra 2007-01-01 - M. Nicolaidis, A. Paschalis 4.01 Contributo in Atti di convegno -
Cryptanalysis of Simplified-AES Encrypted Communication Vimalathithan, R.; Rossi, D.; Omana, M.; Metra, C.; Valarmathi, M. L. 2015-01-01 INTERNATIONAL JOURNAL OF COMPUTER SCIENCE AND INFORMATION SECURITY - 1.01 Articolo in rivista -
Error correcting code analysis for cache memory high reliability and performance D. Rossi; N. Timoncini; M. Spica; C. Metra 2011-01-01 - B. M. Al-Hashimi, E. Macii 4.01 Contributo in Atti di convegno -
Exploiting ECC Redundancy to Minimize Crosstalk Impact D. Rossi; A. K. Nieuwland; A. Katoch; C. Metra 2005-01-01 IEEE DESIGN & TEST OF COMPUTERS - 1.01 Articolo in rivista -
Fast and Low-Cost Clock Deskew Buffer M. Omaña; D. Rossi; C. Metra 2004-01-01 - R.Aitken, and A.Salsano, and R.Velazco, and X.Sun 4.01 Contributo in Atti di convegno -
Faults Affecting Energy-Harvesting Circuits of Self-Powered Wireless Sensors and Their Possible Concurrent Detection Omaña M.; Rossi D.; Giaffreda D.; Specchia R.; Metra C.; Marzencki M.; Kaminska B. 2013-01-01 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS - 1.01 Articolo in rivista -
Faults Affecting the Control Blocks of PV Arrays and Techniques for Their Concurrent Detection M. Omana; D. Rossi; G. Collepalumbo; C. Metra; F. Lombardi 2012-01-01 - IEEE Computer Society 4.01 Contributo in Atti di convegno -
Function Inherent Code Checking: A New Low Cost On-Line Testing Approach for High Performance Microprocessor Control Logic C. Metra; D. Rossi; M. Omaña; A. Jas; R. Galivanche 2008-01-01 - P. Girard, Z. Peng 4.01 Contributo in Atti di convegno -
High-Performance Robust Latches M. Omaña; D. Rossi; C. Metra 2010-01-01 IEEE TRANSACTIONS ON COMPUTERS - 1.01 Articolo in rivista -
High-reliability Fault Tolerant Digital Systems in Nanometric Technologies: Characterization and Design Methodologies C. Bolchini; A. Miele; C. Sandionigi; M. Ottavi; S. Pontarelli; A. Salsano; C. Metra; M. Omaña; D. Rossi; M. Sonza Reorda; L. Sterpone; M. Violante; S. Gerardin; M. Bagatin; A. Paccagnella 2012-01-01 - IEEE Computer Society 4.01 Contributo in Atti di convegno -
Impact of Aging Phenomena on Latches’ Robustness Omana, MARTIN EUGENIO; Rossi, Daniele; Edara, T.; Metra, Cecilia 2016-01-01 IEEE TRANSACTIONS ON NANOTECHNOLOGY - 1.01 Articolo in rivista -
Impact of Aging Phenomena on Soft Error Susceptibility D. Rossi; M. Omaña; C. Metra; A. Paccagnella 2011-01-01 - P. Joshi, M. Violante, G. Chapman, F. Salice 4.01 Contributo in Atti di convegno -