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OMANA, MARTIN EUGENIO

OMANA, MARTIN EUGENIO  

DEI - DIPARTIMENTO DI INGEGNERIA DELL'ENERGIA ELETTRICA E DELL'INFORMAZIONE "GUGLIELMO MARCONI"  

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Titolo Autore(i) Anno Periodico Editore Tipo File
Data Analysis of Electrical Impedance Spectroscopy-Based Biosensors Using Artificial Neural Networks for Resource Constrained Devices Grossi, M.; Omana, M. 2025-01-01 JOURNAL OF LOW POWER ELECTRONICS AND APPLICATIONS - 1.01 Articolo in rivista jlpea-15-00056-v2.pdf
Feasibility of Physical Unclonable Function (PUF) Implementation Using the Pull-up/Pull-down Resistances Integrated in Microcontrollers GPIO Grossi, M.; Omana, M. 2025-01-01 AEÜ. INTERNATIONAL JOURNAL OF ELECTRONICS AND COMMUNICATIONS - 1.01 Articolo in rivista Manuscript_accepted.pdf
Impact of aging on temperature measurements performed using a resistive temperature sensor with sensor-to-microcontroller direct interface Grossi, Marco; Omana, Martin; Metra, Cecilia 2025-01-01 MICROELECTRONICS RELIABILITY - 1.01 Articolo in rivista Accepted.pdf
Novel Physical Unclonable Function Implementation for Microcontrollers and Field Programmable Gate Arrays Grossi, Marco; Omana, Martin; Metra, Cecilia; Acquaviva, Andrea 2025-01-01 IEEE ACCESS - 1.01 Articolo in rivista Novel_Physical_Unclonable_Function_Implementation_for_Microcontrollers_and_Field_Programmable_Gate_Arrays.pdf
On-Line Test of Fully Integrated Voltage Regulators for High Performance Microprocessors of Autonomous Systems Omana, M.; Menghi, A.; Stefani, A.; Vicini, E.; Metra, C.; Froio, Giuseppe; Petrucci, Stefano 2025-01-01 - - 4.01 Contributo in Atti di convegno -
Physical Unclonable Function (PUF) device based on single stage voltage amplifiers for secure signature generation in the Internet of Things Grossi, M.; Omana, M. 2025-01-01 MEMORIES- MATERIALS, DEVICES, CIRCUITS AND SYSTEMS - 1.01 Articolo in rivista PUF - single stage amplifier.pdf
Physical Unclonable Functions’ Reliability Modeling for Wireless Sensor Networks Grossi, M.; Omana, M.; Metra, C.; Acquaviva, A. 2025-01-01 - IEEE 4.01 Contributo in Atti di convegno Manuscript_AEIT_final.pdf
Risks of Silent Data Corruption Due to the Combined Effects of Latent Faults and Aging Phenomena Affecting FinFET-Based ICs Omana, M.; Venigalla, Y.; Naldi, M.; Metra, C. 2025-01-01 IEEE ACCESS - 1.01 Articolo in rivista IEEE_Access_FinFET.pdf
A PCI Express Based Data Acquisition System for the Monitoring of Code Traces of RISC-V Microprocessors Grossi, Marco; Manoni, Simone; Parisi, Emanuele; Omana, Martin; Metra, Cecilia; Alfonsi, Fabrizio...; Gabrielli, Alessandro; Acquaviva, Andrea 2024-01-01 - - 4.01 Contributo in Atti di convegno -
A Ring Oscillator Based Physical Unclonable Function with Enhanced Challenge Response Pairs to Improve the Security of Internet of Things Devices Grossi, Marco; Omana, Martin; Metra, Cecilia; Acquaviva, Andrea 2024-01-01 ENGINEERING PROCEEDINGS - 1.01 Articolo in rivista engproc-82-00015.pdf
Accuracy of NTC Thermistor Measurements Using the Sensor to Microcontroller Direct Interface Grossi, M.; Omana, M. 2024-01-01 ENGINEERING PROCEEDINGS - 1.01 Articolo in rivista engproc-82-00012.pdf
Aging Resilient Ring Oscillators for Reliable Physically Unclonable Functions (PUFs) Omana, M.; Grossi, M.; Rossi, D.; Metra, C. 2024-01-01 MICROELECTRONICS RELIABILITY - 1.01 Articolo in rivista MRel_PUF_Manuscript-Acepted.pdf
AI for Cyberattacks’ Detection in the Metaverse Omana, M.; Cantagallo, F.; Finelli, F.; Metra, C. 2024-01-01 - - 4.01 Contributo in Atti di convegno -
On the Reliability of Clock Monitoring Units for Safety Critical Applications’ Microcontrollers Zhupa, M.; Naldi, M.; Omana, M.; Metra, C. 2024-01-01 - - 4.01 Contributo in Atti di convegno -
Reliability of AI in Predicting the State of Health of Li-Ion Batteries Sara Cretí; Martin Omana; Cecilia Metra; Gianni Borelli 2024-01-01 - - 4.01 Contributo in Atti di convegno -
Silent Data Corruption and Reliability Risks due to Faults Affecting High Performance Microprocessors’ Caches Omana, M.; Manfredi, A.; Metra, C.; Locatelli, R.; Chiavacci, M.; Petrucci, S. 2024-01-01 - Institute of Electrical and Electronics Engineers (IEEE) 4.01 Contributo in Atti di convegno Silent Data Corruption and Reliability Risks.pdf
RISC-V-based Platforms for HPC: Analyzing Non-functional Properties for Future HPC and Big-Data Clusters William Fornaciari; Federico Reghenzani; Federico Terraneo; Davide Baroffio; Cecilia Metra; Marti...n Omana; Josie E. Rodriguez Condia; Matteo Sonza Reorda; Robert Birke;Iacopo Colonnelli; Gianluca Mittone; Marco Aldinucci; Gabriele Mencagli; Francesco Iannone; Filippo Palombi; Giuseppe Zummo; Daniele Cesarini;Federico Tesser 2023-01-01 - Springer 4.01 Contributo in Atti di convegno -
Early detection of photovoltaic system inverter faults Martin Omana, Marco Grossi, Cecilia Metra 2022-01-01 MICROELECTRONICS RELIABILITY - 1.01 Articolo in rivista Early Detection of Photovoltaic System Inverter Faults.pdf
Impact of Soft Errors on High Performance Autoencoders for Cyberattack Detection F. Finelli; M. Omana; C. Metra 2022-01-01 - - 4.01 Contributo in Atti di convegno PP Impact of Soft Errors on High Performance Autoencoders.pdf
Low-Cost Strategy to Detect Faults Affecting Scrubbers in SRAM-Based FPGAs M. Grossi, M. Bouras, M. Omana, H. Berbia 2022-01-01 MICROPROCESSORS AND MICROSYSTEMS - 1.01 Articolo in rivista Manuscript.pdf