OMANA, MARTIN EUGENIO

OMANA, MARTIN EUGENIO

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Dettaglio

	
			Nome completo
		
			OMANA, MARTIN EUGENIO 	  	
			
			Afferenza
		
			DIPARTIMENTO DI INGEGNERIA DELL'ENERGIA ELETTRICA E DELL'INFORMAZIONE "GUGLIELMO MARCONI" 	  	
			
			Tipo di ruolo
		
			Collaboratori

Pubblicazioni

Risultati 1 - 20 di 63 (tempo di esecuzione: 0.001 secondi).

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	Titolo	Autore(i)	Anno	Periodico	Editore	Tipo	File
1	Accurate Linear Model for SET Critical Charge Estimation	D. Rossi; J.M. Cazeaux; M. Omaña; C. Metra; A. Chatterjee	2009	IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS		1.01 Articolo in rivista	-
2	Are Our Design For Testability Features Fault Secure ?	C. Metra; T. M. Mak; M. Omaña	2004		G. Gielen, J. Figueras	4.01 Contributo in Atti di convegno	-
3	Can Clock Faults Be Detected Through Functional Test ?	C. Metra; D. Rossi; M. Omaña; J.M. Cazeaux; TM Mak	2006		B. Straube, O. Novak	4.01 Contributo in Atti di convegno	-
4	Checker No-Harm Alarm Robustness	D. Rossi; M. Omaña; C. Metra; A. Pagni	2006		C. Metra, M. Nicolaidis, R. Aitken, R. Leveugle	4.01 Contributo in Atti di convegno	-
5	Checker No-Harm Alarms and Design Approaches to Tolerate Them	Daniele Rossi; Martin Omaña; Cecilia Metra	2008	JOURNAL OF ELECTRONIC TESTING		1.01 Articolo in rivista	-
6	Clock Faults Induced Min and Max Delay Violations	D. Rossi; M. Omaña; J. M. Cazeaux; C. Metra; TM. Mak	2014	JOURNAL OF ELECTRONIC TESTING		1.01 Articolo in rivista	-
7	Concurrent Detection of Faults Affecting Energy Harvesting Circuits of Self-Powered Wearable Sensors	M. Omaña; M. Marzencki; R. Specchia; C. Metra; B. Kaminska	2009		D. Gizopoulos, M. Tehranipoor, S. Tragoudas	4.01 Contributo in Atti di convegno	-
8	Cryptanalysis of Simplified-AES Encrypted Communication	Vimalathithan, R.; Rossi, D.; Omana, M.; Metra, C.; Valarmathi, M. L.	2015	INTERNATIONAL JOURNAL OF COMPUTER SCIENCE AND INFORMATION SECURITY		1.01 Articolo in rivista	-
9	Fast and Low-Cost Clock Deskew Buffer	M. Omaña; D. Rossi; C. Metra	2004		R.Aitken, and A.Salsano, and R.Velazco, and X.Sun	4.01 Contributo in Atti di convegno	-
10	Fault secureness need for next generation high performance microprocessor design for testability structures	C. Metra; T. M. Mak; M. Omaña	2004		ACM press	4.01 Contributo in Atti di convegno	-
11	Fault-Tolerant Inverters for Reliable Photovoltaic Systems	Martin Omana ; Alessandro Fiore ; Marco Mongitore ; Cecilia Metra	2019	IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS		1.01 Articolo in rivista	-
12	Faults Affecting Energy-Harvesting Circuits of Self-Powered Wireless Sensors and Their Possible Concurrent Detection	Omaña M.; Rossi D.; Giaffreda D.; Specchia R.; Metra C.; Marzencki M.; Kaminska B.	2013	IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS		1.01 Articolo in rivista	-
13	Faults Affecting the Control Blocks of PV Arrays and Techniques for Their Concurrent Detection	M. Omana; D. Rossi; G. Collepalumbo; C. Metra; F. Lombardi	2012		IEEE Computer Society	4.01 Contributo in Atti di convegno	-
14	Function Inherent Code Checking: A New Low Cost On-Line Testing Approach for High Performance Microprocessor Control Logic	C. Metra; D. Rossi; M. Omaña; A. Jas; R. Galivanche	2008		P. Girard, Z. Peng	4.01 Contributo in Atti di convegno	-
15	Hardware Reconfiguration Scheme for High Availability Systems	C Metra; A. Ferrari; M. Omaña; A. Pagni	2004		C. Metra, R. Leveugle, M. Nicolaidis, J. Teixeira	4.01 Contributo in Atti di convegno	-
16	High-Performance Robust Latches	M. Omaña; D. Rossi; C. Metra	2010	IEEE TRANSACTIONS ON COMPUTERS		1.01 Articolo in rivista	-
17	High-reliability Fault Tolerant Digital Systems in Nanometric Technologies: Characterization and Design Methodologies	C. Bolchini; A. Miele; C. Sandionigi; M. Ottavi; S. Pontarelli; A. Salsano; C. Metra; M. Omaña; D.... Rossi; M. Sonza Reorda; L. Sterpone; M. Violante; S. Gerardin; M. Bagatin; A. Paccagnella	2012		IEEE Computer Society	4.01 Contributo in Atti di convegno	-
18	Impact of Aging Phenomena on Latches’ Robustness	Omana, MARTIN EUGENIO; Rossi, Daniele; Edara, T.; Metra, Cecilia	2016	IEEE TRANSACTIONS ON NANOTECHNOLOGY		1.01 Articolo in rivista	-
19	Impact of Aging Phenomena on Soft Error Susceptibility	D. Rossi; M. Omaña; C. Metra; A. Paccagnella	2011		P. Joshi, M. Violante, G. Chapman, F. Salice	4.01 Contributo in Atti di convegno	-
20	Impact of Bias Temperature Instability (BTI) Aging Phenomenon on Clock Deskew Buffers	M. Grossi, M. Omaña	2019	JOURNAL OF ELECTRONIC TESTING		1.01 Articolo in rivista	-

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