OMANA, MARTIN EUGENIO
OMANA, MARTIN EUGENIO
DIPARTIMENTO DI INGEGNERIA DELL'ENERGIA ELETTRICA E DELL'INFORMAZIONE "GUGLIELMO MARCONI"
Ricercatori a tempo determinato
Aging Resilient Ring Oscillators for Reliable Physically Unclonable Functions (PUFs)
2024 M. Omana, M. Grossi, D. Rossi, C. Metra
AI for Cyberattacks’ Detection in the Metaverse
2024 M. Omana, F. Cantagallo, F. Finelli, C. Metra
On the Reliability of Clock Monitoring Units for Safety Critical Applications’ Microcontrollers
2024 M. Zhupa, M. Naldi, M. Omana, C. Metra
Reliability of AI in Predicting the State of Health of Li-Ion Batteries
2024 Sara Cretí; Martin Omana; Cecilia Metra; Gianni Borelli
Silent Data Corruption and Reliability Risks due to Faults Affecting High Performance Microprocessors’ Caches
2024 M. Omana; A. Manfredi; C. Metra; R. Locatelli; M. Chiavacci; S. Petrucci
RISC-V-based Platforms for HPC: Analyzing Non-functional Properties for Future HPC and Big-Data Clusters
2023 William Fornaciari; Federico Reghenzani; Federico Terraneo; Davide Baroffio; Cecilia Metra; Martin Omana; Josie E. Rodriguez Condia; Matteo Sonza Reorda; Robert Birke;Iacopo Colonnelli; Gianluca Mittone; Marco Aldinucci; Gabriele Mencagli; Francesco Iannone; Filippo Palombi; Giuseppe Zummo; Daniele Cesarini;Federico Tesser
Early detection of photovoltaic system inverter faults
2022 Martin Omana, Marco Grossi, Cecilia Metra
Impact of Soft Errors on High Performance Autoencoders for Cyberattack Detection
2022 F. Finelli; M. Omana; C. Metra
Low-Cost Strategy to Detect Faults Affecting Scrubbers in SRAM-Based FPGAs
2022 M. Grossi, M. Bouras, M. Omana, H. Berbia
Novel BTI Robust Ring-Oscillator-Based Physically Unclonable Function
2022 Marco Grossi; Martin Omana; Daniele Rossi; Biagio Marzulli; Cecilia Metra
Reliability Risks Due to Faults Affecting Selectors of ReRAMs and Possible Solutions
2022 Omana M.E.; Bardhan S.; Metra C.
Investigation of the Impact of BTI Aging Phenomenon on Analog Amplifiers
2021 Grossi M.; Omana M.
ST-CAC: a low-cost crosstalk avoidance coding mechanism based on three-valued numerical system
2021 Shirmohammadi Z.; Khorami A.; Omana M.E.
Fault-Tolerant Inverters for Reliable Photovoltaic Systems
2019 Martin Omana ; Alessandro Fiore ; Marco Mongitore ; Cecilia Metra
Impact of Bias Temperature Instability (BTI) Aging Phenomenon on Clock Deskew Buffers
2019 M. Grossi, M. Omaña
Low-Cost Strategy for Bus Propagation Delay Reduction
2019 M. Omaña, S. Govindara, C. Metra
Sensors and embedded systems in agriculture and food analysis
2019 Grossi M.; Berardinelli A.; Sazonov E.; Beccaro W.; Omana M.
Low-Cost Strategy to Mitigate the Impact of Aging on Latches’ Robustness
2018 Martin Omana; Tusharasandeep Edara; Cecilia Metra
New Approaches for Power Binning of High Performance Microprocessors
2017 Martin, Omana; Marco, Padovani; Kreshnik, Veliu; Cecilia, Metra; Juergen, Alt; Rajesh, Galivanche
Scalable Approach for Power Droop Reduction During Scan-Based Logic BIST
2017 Omaña, Martin; Rossi, Daniele; Fuzzi, Filippo; Metra, Cecilia; Tirumurti, Chandrasekharan Chandra; Galivanche, Rajesh
| Titolo | Autore(i) | Anno | Periodico | Editore | Tipo | File |
|---|---|---|---|---|---|---|
| Aging Resilient Ring Oscillators for Reliable Physically Unclonable Functions (PUFs) | M. Omana, M. Grossi, D. Rossi, C. Metra | 2024-01-01 | MICROELECTRONICS RELIABILITY | - | 1.01 Articolo in rivista | - |
| AI for Cyberattacks’ Detection in the Metaverse | M. Omana, F. Cantagallo, F. Finelli, C. Metra | 2024-01-01 | - | - | 4.01 Contributo in Atti di convegno | - |
| On the Reliability of Clock Monitoring Units for Safety Critical Applications’ Microcontrollers | M. Zhupa, M. Naldi, M. Omana, C. Metra | 2024-01-01 | - | - | 4.03 Poster | - |
| Reliability of AI in Predicting the State of Health of Li-Ion Batteries | Sara Cretí; Martin Omana; Cecilia Metra; Gianni Borelli | 2024-01-01 | - | - | 4.01 Contributo in Atti di convegno | - |
| Silent Data Corruption and Reliability Risks due to Faults Affecting High Performance Microprocessors’ Caches | M. Omana; A. Manfredi; C. Metra; R. Locatelli; M. Chiavacci; S. Petrucci | 2024-01-01 | - | Institute of Electrical and Electronics Engineers (IEEE) | 4.01 Contributo in Atti di convegno | Silent Data Corruption and Reliability Risks.pdf |
| RISC-V-based Platforms for HPC: Analyzing Non-functional Properties for Future HPC and Big-Data Clusters | William Fornaciari; Federico Reghenzani; Federico Terraneo; Davide Baroffio; Cecilia Metra; Marti...n Omana; Josie E. Rodriguez Condia; Matteo Sonza Reorda; Robert Birke;Iacopo Colonnelli; Gianluca Mittone; Marco Aldinucci; Gabriele Mencagli; Francesco Iannone; Filippo Palombi; Giuseppe Zummo; Daniele Cesarini;Federico Tesser | 2023-01-01 | - | Springer | 4.01 Contributo in Atti di convegno | - |
| Early detection of photovoltaic system inverter faults | Martin Omana, Marco Grossi, Cecilia Metra | 2022-01-01 | MICROELECTRONICS RELIABILITY | - | 1.01 Articolo in rivista | Early Detection of Photovoltaic System Inverter Faults.pdf |
| Impact of Soft Errors on High Performance Autoencoders for Cyberattack Detection | F. Finelli; M. Omana; C. Metra | 2022-01-01 | - | - | 4.01 Contributo in Atti di convegno | PP Impact of Soft Errors on High Performance Autoencoders.pdf |
| Low-Cost Strategy to Detect Faults Affecting Scrubbers in SRAM-Based FPGAs | M. Grossi, M. Bouras, M. Omana, H. Berbia | 2022-01-01 | MICROPROCESSORS AND MICROSYSTEMS | - | 1.01 Articolo in rivista | Manuscript.pdf |
| Novel BTI Robust Ring-Oscillator-Based Physically Unclonable Function | Marco Grossi; Martin Omana; Daniele Rossi; Biagio Marzulli; Cecilia Metra | 2022-01-01 | - | - | 4.01 Contributo in Atti di convegno | - |
| Reliability Risks Due to Faults Affecting Selectors of ReRAMs and Possible Solutions | Omana M.E.; Bardhan S.; Metra C. | 2022-01-01 | IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING | - | 1.01 Articolo in rivista | Final_ReRAM_TETC.pdf |
| Investigation of the Impact of BTI Aging Phenomenon on Analog Amplifiers | Grossi M.; Omana M. | 2021-01-01 | JOURNAL OF ELECTRONIC TESTING | - | 1.01 Articolo in rivista | investigation of the impact of bti aging phenomenon post print .pdf |
| ST-CAC: a low-cost crosstalk avoidance coding mechanism based on three-valued numerical system | Shirmohammadi Z.; Khorami A.; Omana M.E. | 2021-01-01 | THE JOURNAL OF SUPERCOMPUTING | - | 1.01 Articolo in rivista | Manuscript (003).pdf |
| Fault-Tolerant Inverters for Reliable Photovoltaic Systems | Martin Omana ; Alessandro Fiore ; Marco Mongitore ; Cecilia Metra | 2019-01-01 | IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS | - | 1.01 Articolo in rivista | - |
| Impact of Bias Temperature Instability (BTI) Aging Phenomenon on Clock Deskew Buffers | M. Grossi, M. Omaña | 2019-01-01 | JOURNAL OF ELECTRONIC TESTING | - | 1.01 Articolo in rivista | - |
| Low-Cost Strategy for Bus Propagation Delay Reduction | M. Omaña, S. Govindara, C. Metra | 2019-01-01 | JOURNAL OF ELECTRONIC TESTING | - | 1.01 Articolo in rivista | - |
| Sensors and embedded systems in agriculture and food analysis | Grossi M.; Berardinelli A.; Sazonov E.; Beccaro W.; Omana M. | 2019-01-01 | JOURNAL OF SENSORS | - | 1.03 Recensione in rivista | Grossi_JS_2019.pdf |
| Low-Cost Strategy to Mitigate the Impact of Aging on Latches’ Robustness | Martin Omana; Tusharasandeep Edara; Cecilia Metra | 2018-01-01 | IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING | - | 1.01 Articolo in rivista | - |
| New Approaches for Power Binning of High Performance Microprocessors | Martin, Omana; Marco, Padovani; Kreshnik, Veliu; Cecilia, Metra; Juergen, Alt; Rajesh, Galivanche | 2017-01-01 | IEEE TRANSACTIONS ON COMPUTERS | - | 1.01 Articolo in rivista | - |
| Scalable Approach for Power Droop Reduction During Scan-Based Logic BIST | Omaña, Martin; Rossi, Daniele; Fuzzi, Filippo; Metra, Cecilia; Tirumurti, Chandrasekharan Chandra...; Galivanche, Rajesh | 2017-01-01 | IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS | - | 1.01 Articolo in rivista | - |