OMANA, MARTIN EUGENIO

OMANA, MARTIN EUGENIO  

DIPARTIMENTO DI INGEGNERIA DELL'ENERGIA ELETTRICA E DELL'INFORMAZIONE "GUGLIELMO MARCONI"  

Ricercatori a tempo determinato  

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Risultati 1 - 20 di 74 (tempo di esecuzione: 0.056 secondi).
Titolo Autore(i) Anno Periodico Editore Tipo File
On the Reliability of Clock Monitoring Units for Safety Critical Applications’ Microcontrollers M. Zhupa, M. Naldi, M. Omana, C. Metra 2024-01-01 - - 4.03 Poster -
Reliability of AI in Predicting the State of Health of Li-Ion Batteries Sara Cretí; Martin Omana; Cecilia Metra; Gianni Borelli 2024-01-01 - - 4.01 Contributo in Atti di convegno -
Silent Data Corruption and Reliability Risks due to Faults Affecting High Performance Microprocessors’ Caches M. Omana; A. Manfredi; C. Metra; R. Locatelli; M. Chiavacci; S. Petrucci 2024-01-01 - - 4.01 Contributo in Atti di convegno -
RISC-V-based Platforms for HPC: Analyzing Non-functional Properties for Future HPC and Big-Data Clusters William Fornaciari; Federico Reghenzani; Federico Terraneo; Davide Baroffio; Cecilia Metra; Marti...n Omana; Josie E. Rodriguez Condia; Matteo Sonza Reorda; Robert Birke;Iacopo Colonnelli; Gianluca Mittone; Marco Aldinucci; Gabriele Mencagli; Francesco Iannone; Filippo Palombi; Giuseppe Zummo; Daniele Cesarini;Federico Tesser 2023-01-01 - Springer 4.01 Contributo in Atti di convegno -
Early detection of photovoltaic system inverter faults Martin Omana, Marco Grossi, Cecilia Metra 2022-01-01 MICROELECTRONICS RELIABILITY - 1.01 Articolo in rivista -
Impact of Soft Errors on High Performance Autoencoders for Cyberattack Detection F. Finelli; M. Omana; C. Metra 2022-01-01 - - 4.01 Contributo in Atti di convegno -
Low-Cost Strategy to Detect Faults Affecting Scrubbers in SRAM-Based FPGAs M. Grossi, M. Bouras, M. Omana, H. Berbia 2022-01-01 MICROPROCESSORS AND MICROSYSTEMS - 1.01 Articolo in rivista -
Novel BTI Robust Ring-Oscillator-Based Physically Unclonable Function Marco Grossi; Martin Omana; Daniele Rossi; Biagio Marzulli; Cecilia Metra 2022-01-01 - - 4.01 Contributo in Atti di convegno -
Reliability Risks Due to Faults Affecting Selectors of ReRAMs and Possible Solutions Omana M.E.; Bardhan S.; Metra C. 2022-01-01 IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING - 1.01 Articolo in rivista Final_ReRAM_TETC.pdf
Investigation of the Impact of BTI Aging Phenomenon on Analog Amplifiers Grossi M.; Omana M. 2021-01-01 JOURNAL OF ELECTRONIC TESTING - 1.01 Articolo in rivista investigation of the impact of bti aging phenomenon post print .pdf
ST-CAC: a low-cost crosstalk avoidance coding mechanism based on three-valued numerical system Shirmohammadi Z.; Khorami A.; Omana M.E. 2021-01-01 THE JOURNAL OF SUPERCOMPUTING - 1.01 Articolo in rivista -
Fault-Tolerant Inverters for Reliable Photovoltaic Systems Martin Omana ; Alessandro Fiore ; Marco Mongitore ; Cecilia Metra 2019-01-01 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS - 1.01 Articolo in rivista -
Impact of Bias Temperature Instability (BTI) Aging Phenomenon on Clock Deskew Buffers M. Grossi, M. Omaña 2019-01-01 JOURNAL OF ELECTRONIC TESTING - 1.01 Articolo in rivista -
Low-Cost Strategy for Bus Propagation Delay Reduction M. Omaña, S. Govindara, C. Metra 2019-01-01 JOURNAL OF ELECTRONIC TESTING - 1.01 Articolo in rivista -
Sensors and embedded systems in agriculture and food analysis Grossi M.; Berardinelli A.; Sazonov E.; Beccaro W.; Omana M. 2019-01-01 JOURNAL OF SENSORS - 1.03 Recensione in rivista Grossi_JS_2019.pdf
Low-Cost Strategy to Mitigate the Impact of Aging on Latches’ Robustness Martin Omana; Tusharasandeep Edara; Cecilia Metra 2018-01-01 IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING - 1.01 Articolo in rivista -
New Approaches for Power Binning of High Performance Microprocessors Martin, Omana; Marco, Padovani; Kreshnik, Veliu; Cecilia, Metra; Juergen, Alt; Rajesh, Galivanche 2017-01-01 IEEE TRANSACTIONS ON COMPUTERS - 1.01 Articolo in rivista -
Scalable Approach for Power Droop Reduction During Scan-Based Logic BIST Omaña, Martin; Rossi, Daniele; Fuzzi, Filippo; Metra, Cecilia; Tirumurti, Chandrasekharan Chandra...; Galivanche, Rajesh 2017-01-01 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS - 1.01 Articolo in rivista -
Impact of Aging Phenomena on Latches’ Robustness Omana, MARTIN EUGENIO; Rossi, Daniele; Edara, T.; Metra, Cecilia 2016-01-01 IEEE TRANSACTIONS ON NANOTECHNOLOGY - 1.01 Articolo in rivista -
Inverters' Self-Checking Monitors for Reliable Photovoltaic Systems Omana, M.; Fiore, A.; Metra, C. 2016-01-01 - - 4.01 Contributo in Atti di convegno -