CRIS Current Research Information System

OMANA, MARTIN EUGENIO

OMANA, MARTIN EUGENIO  

DEI - DIPARTIMENTO DI INGEGNERIA DELL'ENERGIA ELETTRICA E DELL'INFORMAZIONE "GUGLIELMO MARCONI"  

Ricercatori a tempo determinato  

Mostra records
Risultati 1 - 20 di 80 (tempo di esecuzione: 0.037 secondi).
Titolo Autore(i) Anno Periodico Editore Tipo File
Novel Physical Unclonable Function Implementation for Microcontrollers and Field Programmable Gate Arrays Grossi, Marco; Omana, Martin; Metra, Cecilia; Acquaviva, Andrea 2025-01-01 IEEE ACCESS - 1.01 Articolo in rivista Novel_Physical_Unclonable_Function_Implementation_for_Microcontrollers_and_Field_Programmable_Gate_Arrays.pdf
A PCI Express Based Data Acquisition System for the Monitoring of Code Traces of RISC-V Microprocessors Grossi, Marco; Manoni, Simone; Parisi, Emanuele; Omana, Martin; Metra, Cecilia; Alfonsi, Fabrizio... espandi; Gabrielli, Alessandro; Acquaviva, Andrea 2024-01-01 - - 4.01 Contributo in Atti di convegno -
A Ring Oscillator Based Physical Unclonable Function with Enhanced Challenge Response Pairs to Improve the Security of Internet of Things Devices Grossi, Marco; Omana, Martin; Metra, Cecilia; Acquaviva, Andrea 2024-01-01 ENGINEERING PROCEEDINGS - 1.01 Articolo in rivista -
Accuracy of NTC Thermistor Measurements Using the Sensor to Microcontroller Direct Interface Grossi, M.; Omana, M. 2024-01-01 ENGINEERING PROCEEDINGS - 1.01 Articolo in rivista -
Aging Resilient Ring Oscillators for Reliable Physically Unclonable Functions (PUFs) Omana, M.; Grossi, M.; Rossi, D.; Metra, C. 2024-01-01 MICROELECTRONICS RELIABILITY - 1.01 Articolo in rivista MRel_PUF_Manuscript-Acepted.pdf
AI for Cyberattacks’ Detection in the Metaverse Omana, M.; Cantagallo, F.; Finelli, F.; Metra, C. 2024-01-01 - - 4.01 Contributo in Atti di convegno -
On the Reliability of Clock Monitoring Units for Safety Critical Applications’ Microcontrollers M. Zhupa, M. Naldi, M. Omana, C. Metra 2024-01-01 - - 4.03 Poster -
Reliability of AI in Predicting the State of Health of Li-Ion Batteries Sara Cretí; Martin Omana; Cecilia Metra; Gianni Borelli 2024-01-01 - - 4.01 Contributo in Atti di convegno -
Silent Data Corruption and Reliability Risks due to Faults Affecting High Performance Microprocessors’ Caches M. Omana; A. Manfredi; C. Metra; R. Locatelli; M. Chiavacci; S. Petrucci 2024-01-01 - Institute of Electrical and Electronics Engineers (IEEE) 4.01 Contributo in Atti di convegno Silent Data Corruption and Reliability Risks.pdf
RISC-V-based Platforms for HPC: Analyzing Non-functional Properties for Future HPC and Big-Data Clusters William Fornaciari; Federico Reghenzani; Federico Terraneo; Davide Baroffio; Cecilia Metra; Marti... espandin Omana; Josie E. Rodriguez Condia; Matteo Sonza Reorda; Robert Birke;Iacopo Colonnelli; Gianluca Mittone; Marco Aldinucci; Gabriele Mencagli; Francesco Iannone; Filippo Palombi; Giuseppe Zummo; Daniele Cesarini;Federico Tesser 2023-01-01 - Springer 4.01 Contributo in Atti di convegno -
Early detection of photovoltaic system inverter faults Martin Omana, Marco Grossi, Cecilia Metra 2022-01-01 MICROELECTRONICS RELIABILITY - 1.01 Articolo in rivista Early Detection of Photovoltaic System Inverter Faults.pdf
Impact of Soft Errors on High Performance Autoencoders for Cyberattack Detection F. Finelli; M. Omana; C. Metra 2022-01-01 - - 4.01 Contributo in Atti di convegno PP Impact of Soft Errors on High Performance Autoencoders.pdf
Low-Cost Strategy to Detect Faults Affecting Scrubbers in SRAM-Based FPGAs M. Grossi, M. Bouras, M. Omana, H. Berbia 2022-01-01 MICROPROCESSORS AND MICROSYSTEMS - 1.01 Articolo in rivista Manuscript.pdf
Novel BTI Robust Ring-Oscillator-Based Physically Unclonable Function Grossi, Marco; Omana, Martin; Rossi, Daniele; Marzulli, Biagio; Metra, Cecilia 2022-01-01 - - 4.01 Contributo in Atti di convegno -
Reliability Risks Due to Faults Affecting Selectors of ReRAMs and Possible Solutions Omana M.E.; Bardhan S.; Metra C. 2022-01-01 IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING - 1.01 Articolo in rivista Final_ReRAM_TETC.pdf
Investigation of the Impact of BTI Aging Phenomenon on Analog Amplifiers Grossi M.; Omana M. 2021-01-01 JOURNAL OF ELECTRONIC TESTING - 1.01 Articolo in rivista investigation of the impact of bti aging phenomenon post print .pdf
ST-CAC: a low-cost crosstalk avoidance coding mechanism based on three-valued numerical system Shirmohammadi Z.; Khorami A.; Omana M.E. 2021-01-01 THE JOURNAL OF SUPERCOMPUTING - 1.01 Articolo in rivista Manuscript (003).pdf
Fault-Tolerant Inverters for Reliable Photovoltaic Systems Martin Omana ; Alessandro Fiore ; Marco Mongitore ; Cecilia Metra 2019-01-01 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS - 1.01 Articolo in rivista -
Impact of Bias Temperature Instability (BTI) Aging Phenomenon on Clock Deskew Buffers M. Grossi, M. Omaña 2019-01-01 JOURNAL OF ELECTRONIC TESTING - 1.01 Articolo in rivista -
Low-Cost Strategy for Bus Propagation Delay Reduction M. Omaña, S. Govindara, C. Metra 2019-01-01 JOURNAL OF ELECTRONIC TESTING - 1.01 Articolo in rivista -