OMANA, MARTIN EUGENIO
Dettaglio
OMANA, MARTIN EUGENIO
DIPARTIMENTO DI INGEGNERIA DELL'ENERGIA ELETTRICA E DELL'INFORMAZIONE "GUGLIELMO MARCONI"
Collaboratori
Pubblicazioni
Risultati 1 - 20 di 63 (tempo di esecuzione: 0.001 secondi).
Titolo | Autore(i) | Anno | Periodico | Editore | Tipo | File | |
---|---|---|---|---|---|---|---|
1 | Accurate Linear Model for SET Critical Charge Estimation | D. Rossi; J.M. Cazeaux; M. Omaña; C. Metra; A. Chatterjee | 2009 | IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS | 1.01 Articolo in rivista | - | |
2 | Are Our Design For Testability Features Fault Secure ? | C. Metra; T. M. Mak; M. Omaña | 2004 | G. Gielen, J. Figueras | 4.01 Contributo in Atti di convegno | - | |
3 | Can Clock Faults Be Detected Through Functional Test ? | C. Metra; D. Rossi; M. Omaña; J.M. Cazeaux; TM Mak | 2006 | B. Straube, O. Novak | 4.01 Contributo in Atti di convegno | - | |
4 | Checker No-Harm Alarm Robustness | D. Rossi; M. Omaña; C. Metra; A. Pagni | 2006 | C. Metra, M. Nicolaidis, R. Aitken, R. Leveugle | 4.01 Contributo in Atti di convegno | - | |
5 | Checker No-Harm Alarms and Design Approaches to Tolerate Them | Daniele Rossi; Martin Omaña; Cecilia Metra | 2008 | JOURNAL OF ELECTRONIC TESTING | 1.01 Articolo in rivista | - | |
6 | Clock Faults Induced Min and Max Delay Violations | D. Rossi; M. Omaña; J. M. Cazeaux; C. Metra; TM. Mak | 2014 | JOURNAL OF ELECTRONIC TESTING | 1.01 Articolo in rivista | - | |
7 | Concurrent Detection of Faults Affecting Energy Harvesting Circuits of Self-Powered Wearable Sensors | M. Omaña; M. Marzencki; R. Specchia; C. Metra; B. Kaminska | 2009 | D. Gizopoulos, M. Tehranipoor, S. Tragoudas | 4.01 Contributo in Atti di convegno | - | |
8 | Cryptanalysis of Simplified-AES Encrypted Communication | Vimalathithan, R.; Rossi, D.; Omana, M.; Metra, C.; Valarmathi, M. L. | 2015 | INTERNATIONAL JOURNAL OF COMPUTER SCIENCE AND INFORMATION SECURITY | 1.01 Articolo in rivista | - | |
9 | Fast and Low-Cost Clock Deskew Buffer | M. Omaña; D. Rossi; C. Metra | 2004 | R.Aitken, and A.Salsano, and R.Velazco, and X.Sun | 4.01 Contributo in Atti di convegno | - | |
10 | Fault secureness need for next generation high performance microprocessor design for testability structures | C. Metra; T. M. Mak; M. Omaña | 2004 | ACM press | 4.01 Contributo in Atti di convegno | - | |
11 | Fault-Tolerant Inverters for Reliable Photovoltaic Systems | Martin Omana ; Alessandro Fiore ; Marco Mongitore ; Cecilia Metra | 2019 | IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS | 1.01 Articolo in rivista | - | |
12 | Faults Affecting Energy-Harvesting Circuits of Self-Powered Wireless Sensors and Their Possible Concurrent Detection | Omaña M.; Rossi D.; Giaffreda D.; Specchia R.; Metra C.; Marzencki M.; Kaminska B. | 2013 | IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS | 1.01 Articolo in rivista | - | |
13 | Faults Affecting the Control Blocks of PV Arrays and Techniques for Their Concurrent Detection | M. Omana; D. Rossi; G. Collepalumbo; C. Metra; F. Lombardi | 2012 | IEEE Computer Society | 4.01 Contributo in Atti di convegno | - | |
14 | Function Inherent Code Checking: A New Low Cost On-Line Testing Approach for High Performance Microprocessor Control Logic | C. Metra; D. Rossi; M. Omaña; A. Jas; R. Galivanche | 2008 | P. Girard, Z. Peng | 4.01 Contributo in Atti di convegno | - | |
15 | Hardware Reconfiguration Scheme for High Availability Systems | C Metra; A. Ferrari; M. Omaña; A. Pagni | 2004 | C. Metra, R. Leveugle, M. Nicolaidis, J. Teixeira | 4.01 Contributo in Atti di convegno | - | |
16 | High-Performance Robust Latches | M. Omaña; D. Rossi; C. Metra | 2010 | IEEE TRANSACTIONS ON COMPUTERS | 1.01 Articolo in rivista | - | |
17 | High-reliability Fault Tolerant Digital Systems in Nanometric Technologies: Characterization and Design Methodologies | C. Bolchini; A. Miele; C. Sandionigi; M. Ottavi; S. Pontarelli; A. Salsano; C. Metra; M. Omaña; D.... Rossi; M. Sonza Reorda; L. Sterpone; M. Violante; S. Gerardin; M. Bagatin; A. Paccagnella | 2012 | IEEE Computer Society | 4.01 Contributo in Atti di convegno | - | |
18 | Impact of Aging Phenomena on Latches’ Robustness | Omana, MARTIN EUGENIO; Rossi, Daniele; Edara, T.; Metra, Cecilia | 2016 | IEEE TRANSACTIONS ON NANOTECHNOLOGY | 1.01 Articolo in rivista | - | |
19 | Impact of Aging Phenomena on Soft Error Susceptibility | D. Rossi; M. Omaña; C. Metra; A. Paccagnella | 2011 | P. Joshi, M. Violante, G. Chapman, F. Salice | 4.01 Contributo in Atti di convegno | - | |
20 | Impact of Bias Temperature Instability (BTI) Aging Phenomenon on Clock Deskew Buffers | M. Grossi, M. Omaña | 2019 | JOURNAL OF ELECTRONIC TESTING | 1.01 Articolo in rivista | - |