OMANA, MARTIN EUGENIO

OMANA, MARTIN EUGENIO  

DIPARTIMENTO DI INGEGNERIA DELL'ENERGIA ELETTRICA E DELL'INFORMAZIONE "GUGLIELMO MARCONI"  

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Risultati 1 - 20 di 66 (tempo di esecuzione: 0.032 secondi).
Titolo Autore(i) Anno Periodico Editore Tipo File
Accurate Linear Model for SET Critical Charge Estimation D. Rossi; J.M. Cazeaux; M. Omaña; C. Metra; A. Chatterjee 2009-01-01 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS - 1.01 Articolo in rivista -
Are Our Design For Testability Features Fault Secure ? C. Metra; T. M. Mak; M. Omaña 2004-01-01 - G. Gielen, J. Figueras 4.01 Contributo in Atti di convegno -
Can Clock Faults Be Detected Through Functional Test ? C. Metra; D. Rossi; M. Omaña; J.M. Cazeaux; TM Mak 2006-01-01 - B. Straube, O. Novak 4.01 Contributo in Atti di convegno -
Checker No-Harm Alarm Robustness D. Rossi; M. Omaña; C. Metra; A. Pagni 2006-01-01 - C. Metra, M. Nicolaidis, R. Aitken, R. Leveugle 4.01 Contributo in Atti di convegno -
Checker No-Harm Alarms and Design Approaches to Tolerate Them Daniele Rossi; Martin Omaña; Cecilia Metra 2008-01-01 JOURNAL OF ELECTRONIC TESTING - 1.01 Articolo in rivista -
Clock Faults Induced Min and Max Delay Violations D. Rossi; M. Omaña; J. M. Cazeaux; C. Metra; TM. Mak 2014-01-01 JOURNAL OF ELECTRONIC TESTING - 1.01 Articolo in rivista -
Concurrent Detection of Faults Affecting Energy Harvesting Circuits of Self-Powered Wearable Sensors M. Omaña; M. Marzencki; R. Specchia; C. Metra; B. Kaminska 2009-01-01 - D. Gizopoulos, M. Tehranipoor, S. Tragoudas 4.01 Contributo in Atti di convegno -
Cryptanalysis of Simplified-AES Encrypted Communication Vimalathithan, R.; Rossi, D.; Omana, M.; Metra, C.; Valarmathi, M. L. 2015-01-01 INTERNATIONAL JOURNAL OF COMPUTER SCIENCE AND INFORMATION SECURITY - 1.01 Articolo in rivista -
Fast and Low-Cost Clock Deskew Buffer M. Omaña; D. Rossi; C. Metra 2004-01-01 - R.Aitken, and A.Salsano, and R.Velazco, and X.Sun 4.01 Contributo in Atti di convegno -
Fault secureness need for next generation high performance microprocessor design for testability structures C. Metra; T. M. Mak; M. Omaña 2004-01-01 - ACM press 4.01 Contributo in Atti di convegno -
Fault-Tolerant Inverters for Reliable Photovoltaic Systems Martin Omana ; Alessandro Fiore ; Marco Mongitore ; Cecilia Metra 2019-01-01 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS - 1.01 Articolo in rivista -
Faults Affecting Energy-Harvesting Circuits of Self-Powered Wireless Sensors and Their Possible Concurrent Detection Omaña M.; Rossi D.; Giaffreda D.; Specchia R.; Metra C.; Marzencki M.; Kaminska B. 2013-01-01 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS - 1.01 Articolo in rivista -
Faults Affecting the Control Blocks of PV Arrays and Techniques for Their Concurrent Detection M. Omana; D. Rossi; G. Collepalumbo; C. Metra; F. Lombardi 2012-01-01 - IEEE Computer Society 4.01 Contributo in Atti di convegno -
Function Inherent Code Checking: A New Low Cost On-Line Testing Approach for High Performance Microprocessor Control Logic C. Metra; D. Rossi; M. Omaña; A. Jas; R. Galivanche 2008-01-01 - P. Girard, Z. Peng 4.01 Contributo in Atti di convegno -
Hardware Reconfiguration Scheme for High Availability Systems C Metra; A. Ferrari; M. Omaña; A. Pagni 2004-01-01 - C. Metra, R. Leveugle, M. Nicolaidis, J. Teixeira 4.01 Contributo in Atti di convegno -
High-Performance Robust Latches M. Omaña; D. Rossi; C. Metra 2010-01-01 IEEE TRANSACTIONS ON COMPUTERS - 1.01 Articolo in rivista -
High-reliability Fault Tolerant Digital Systems in Nanometric Technologies: Characterization and Design Methodologies C. Bolchini; A. Miele; C. Sandionigi; M. Ottavi; S. Pontarelli; A. Salsano; C. Metra; M. Omaña; D. Rossi; M. Sonza Reorda; L. Sterpone; M. Violante; S. Gerardin; M. Bagatin; A. Paccagnella 2012-01-01 - IEEE Computer Society 4.01 Contributo in Atti di convegno -
Impact of Aging Phenomena on Latches’ Robustness Omana, MARTIN EUGENIO; Rossi, Daniele; Edara, T.; Metra, Cecilia 2016-01-01 IEEE TRANSACTIONS ON NANOTECHNOLOGY - 1.01 Articolo in rivista -
Impact of Aging Phenomena on Soft Error Susceptibility D. Rossi; M. Omaña; C. Metra; A. Paccagnella 2011-01-01 - P. Joshi, M. Violante, G. Chapman, F. Salice 4.01 Contributo in Atti di convegno -
Impact of Bias Temperature Instability (BTI) Aging Phenomenon on Clock Deskew Buffers M. Grossi, M. Omaña 2019-01-01 JOURNAL OF ELECTRONIC TESTING - 1.01 Articolo in rivista -