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METRA, CECILIA

METRA, CECILIA  

DEI - DIPARTIMENTO DI INGEGNERIA DELL'ENERGIA ELETTRICA E DELL'INFORMAZIONE "GUGLIELMO MARCONI"  

Docenti di ruolo di Ia fascia  

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Risultati 1 - 20 di 151 (tempo di esecuzione: 0.035 secondi).
Titolo Autore(i) Anno Periodico Editore Tipo File
IEEE Transactions on Computers Metra, C. 9999-01-01 IEEE TRANSACTIONS ON COMPUTERS - 8.01 Ruolo editoriale in rivista -
IEEE Transactions on Emerging Topics in Computing Metra, C. 9999-01-01 IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING - 8.01 Ruolo editoriale in rivista -
IEEE Transactions on Emerging Topics in Computing Cecilia Metra 9999-01-01 IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING - 8.01 Ruolo editoriale in rivista -
Journal of Electronic Testing: Theory and Applications (JETTA) Metra, C. 9999-01-01 JOURNAL OF ELECTRONIC TESTING - 8.01 Ruolo editoriale in rivista -
Impact of aging on temperature measurements performed using a resistive temperature sensor with sensor-to-microcontroller direct interface Grossi, Marco; Omana, Martin; Metra, Cecilia 2025-01-01 MICROELECTRONICS RELIABILITY - 1.01 Articolo in rivista Accepted.pdf
Novel Physical Unclonable Function Implementation for Microcontrollers and Field Programmable Gate Arrays Grossi, Marco; Omana, Martin; Metra, Cecilia; Acquaviva, Andrea 2025-01-01 IEEE ACCESS - 1.01 Articolo in rivista Novel_Physical_Unclonable_Function_Implementation_for_Microcontrollers_and_Field_Programmable_Gate_Arrays.pdf
On-Line Test of Fully Integrated Voltage Regulators for High Performance Microprocessors of Autonomous Systems Omana, M.; Menghi, A.; Stefani, A.; Vicini, E.; Metra, C.; Froio, Giuseppe; Petrucci, Stefano 2025-01-01 - - 4.01 Contributo in Atti di convegno -
Physical Unclonable Functions’ Reliability Modeling for Wireless Sensor Networks Grossi, M.; Omana, M.; Metra, C.; Acquaviva, A. 2025-01-01 - IEEE 4.01 Contributo in Atti di convegno Manuscript_AEIT_final.pdf
Risks of Silent Data Corruption Due to the Combined Effects of Latent Faults and Aging Phenomena Affecting FinFET-Based ICs Omana, M.; Venigalla, Y.; Naldi, M.; Metra, C. 2025-01-01 IEEE ACCESS - 1.01 Articolo in rivista IEEE_Access_FinFET.pdf
The Emerging Metaverse: IEEE ISEMV 2024 Retrospective and Future Directions Nisiotis, L.; Metra, C.; Athavale, J.; Milojcic, D.; Dukes, S.; Ranaweera, J. 2025-01-01 COMPUTER - 1.01 Articolo in rivista -
A PCI Express Based Data Acquisition System for the Monitoring of Code Traces of RISC-V Microprocessors Grossi, Marco; Manoni, Simone; Parisi, Emanuele; Omana, Martin; Metra, Cecilia; Alfonsi, Fabrizio...; Gabrielli, Alessandro; Acquaviva, Andrea 2024-01-01 - - 4.01 Contributo in Atti di convegno -
A Ring Oscillator Based Physical Unclonable Function with Enhanced Challenge Response Pairs to Improve the Security of Internet of Things Devices Grossi, Marco; Omana, Martin; Metra, Cecilia; Acquaviva, Andrea 2024-01-01 ENGINEERING PROCEEDINGS - 1.01 Articolo in rivista engproc-82-00015.pdf
Aging Resilient Ring Oscillators for Reliable Physically Unclonable Functions (PUFs) Omana, M.; Grossi, M.; Rossi, D.; Metra, C. 2024-01-01 MICROELECTRONICS RELIABILITY - 1.01 Articolo in rivista MRel_PUF_Manuscript-Acepted.pdf
AI for Cyberattacks’ Detection in the Metaverse Omana, M.; Cantagallo, F.; Finelli, F.; Metra, C. 2024-01-01 - - 4.01 Contributo in Atti di convegno -
On the Reliability of Clock Monitoring Units for Safety Critical Applications’ Microcontrollers Zhupa, M.; Naldi, M.; Omana, M.; Metra, C. 2024-01-01 - - 4.01 Contributo in Atti di convegno -
Reliability of AI in Predicting the State of Health of Li-Ion Batteries Sara Cretí; Martin Omana; Cecilia Metra; Gianni Borelli 2024-01-01 - - 4.01 Contributo in Atti di convegno -
Silent Data Corruption and Reliability Risks due to Faults Affecting High Performance Microprocessors’ Caches Omana, M.; Manfredi, A.; Metra, C.; Locatelli, R.; Chiavacci, M.; Petrucci, S. 2024-01-01 - Institute of Electrical and Electronics Engineers (IEEE) 4.01 Contributo in Atti di convegno Silent Data Corruption and Reliability Risks.pdf
RISC-V-based Platforms for HPC: Analyzing Non-functional Properties for Future HPC and Big-Data Clusters William Fornaciari; Federico Reghenzani; Federico Terraneo; Davide Baroffio; Cecilia Metra; Marti...n Omana; Josie E. Rodriguez Condia; Matteo Sonza Reorda; Robert Birke;Iacopo Colonnelli; Gianluca Mittone; Marco Aldinucci; Gabriele Mencagli; Francesco Iannone; Filippo Palombi; Giuseppe Zummo; Daniele Cesarini;Federico Tesser 2023-01-01 - Springer 4.01 Contributo in Atti di convegno -
Early detection of photovoltaic system inverter faults Martin Omana, Marco Grossi, Cecilia Metra 2022-01-01 MICROELECTRONICS RELIABILITY - 1.01 Articolo in rivista Early Detection of Photovoltaic System Inverter Faults.pdf
Impact of Soft Errors on High Performance Autoencoders for Cyberattack Detection F. Finelli; M. Omana; C. Metra 2022-01-01 - - 4.01 Contributo in Atti di convegno PP Impact of Soft Errors on High Performance Autoencoders.pdf