METRA, CECILIA

METRA, CECILIA  

DIPARTIMENTO DI INGEGNERIA DELL'ENERGIA ELETTRICA E DELL'INFORMAZIONE "GUGLIELMO MARCONI"  

Docenti di ruolo di Ia fascia  

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Risultati 1 - 20 di 132 (tempo di esecuzione: 0.029 secondi).
Titolo Autore(i) Anno Periodico Editore Tipo File
10th IEEE International On-Line Testing Symposium M. Nicolaidis; J.P. Teixeira; R. Leveugle; C. Metra 2004-01-01 - - 7.12 Attività espositiva:Mostra o Esposizione -
11th IEEE International On-Line Testing Symposium M. Nicolaidis; L. Anghel; C. Metra; K. Roy 2005-01-01 - - 7.12 Attività espositiva:Mostra o Esposizione -
12th IEEE International On-Line Testing Symposium C. Metra; M. Nicolaidis; R. Leveugle; R. Aitken 2006-01-01 - - 7.12 Attività espositiva:Mostra o Esposizione -
The 2019 IEEE Computer Society: Hit Target on Member Satisfaction and Technical Excellence Metra, c. 2019-01-01 COMPUTER - 1.01 Articolo in rivista -
The 2019 IEEE Computer Society: Targeting Member Satisfaction and Technical Excellence c. Metra 2019-01-01 COMPUTER - 1.04 Replica / breve intervento (e simili) -
20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems R. Aitken; C. Metra; N. Park; H. Ito 2005-01-01 - - 7.12 Attività espositiva:Mostra o Esposizione -
A Novel Dual-Walled CNT Bus Architecture with Reduced Cross-Coupling Features J.M. Cazeaux; D. Rossi; C. Metra; F. Lombardi 2006-01-01 - C. Lau, D. Janes, S. Bandyopadhyay, M. Cahay 4.01 Contributo in Atti di convegno -
AC/DC FAULT TOLERANT CODE R.P. KLEIHORST; A.K. NIEUWLAND; C. METRA; V.E.S. Van DIJK 2004-01-01 - - 6.01 Brevetto -
Accurate Linear Model for SET Critical Charge Estimation D. Rossi; J.M. Cazeaux; M. Omaña; C. Metra; A. Chatterjee 2009-01-01 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS - 1.01 Articolo in rivista -
ACM Transactions on Design Automation of Electronic Systems C. Metra 2014-01-01 ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS - 8.01 Ruolo editoriale in rivista -
Analysis of the Impact of Bus Implemented EDCs on On-Chip SSN D. Rossi; C. Steiner; C. Metra 2006-01-01 - D. Sciuto, G. Gielen 4.01 Contributo in Atti di convegno -
Are Our Design For Testability Features Fault Secure ? C. Metra; T. M. Mak; M. Omaña 2004-01-01 - G. Gielen, J. Figueras 4.01 Contributo in Atti di convegno -
Can Clock Faults Be Detected Through Functional Test ? C. Metra; D. Rossi; M. Omaña; J.M. Cazeaux; TM Mak 2006-01-01 - B. Straube, O. Novak 4.01 Contributo in Atti di convegno -
Checker No-Harm Alarm Robustness D. Rossi; M. Omaña; C. Metra; A. Pagni 2006-01-01 - C. Metra, M. Nicolaidis, R. Aitken, R. Leveugle 4.01 Contributo in Atti di convegno -
Checker No-Harm Alarms and Design Approaches to Tolerate Them Daniele Rossi; Martin Omaña; Cecilia Metra 2008-01-01 JOURNAL OF ELECTRONIC TESTING - 1.01 Articolo in rivista -
Clock Faults Induced Min and Max Delay Violations D. Rossi; M. Omaña; J. M. Cazeaux; C. Metra; TM. Mak 2014-01-01 JOURNAL OF ELECTRONIC TESTING - 1.01 Articolo in rivista -
Coding Techniques for Low Switching Noise in Fault Tolerant Busses A. K. Nieuwland; A. Katoch; D. Rossi; C. Metra 2005-01-01 - C. Metra, K. Roy, L. Anghel, M. Nicolaidis 4.01 Contributo in Atti di convegno -
Concurrent Detection of Faults Affecting Energy Harvesting Circuits of Self-Powered Wearable Sensors M. Omaña; M. Marzencki; R. Specchia; C. Metra; B. Kaminska 2009-01-01 - D. Gizopoulos, M. Tehranipoor, S. Tragoudas 4.01 Contributo in Atti di convegno -
Configurable Error Control Scheme for NoC Signal Integrity D. Rossi; P. Angelini; C. Metra 2007-01-01 - M. Nicolaidis, A. Paschalis 4.01 Contributo in Atti di convegno -
Cryptanalysis of Simplified-AES Encrypted Communication Vimalathithan, R.; Rossi, D.; Omana, M.; Metra, C.; Valarmathi, M. L. 2015-01-01 INTERNATIONAL JOURNAL OF COMPUTER SCIENCE AND INFORMATION SECURITY - 1.01 Articolo in rivista -