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EnglishIn this paper we propose an on-die monitoring scheme to detect and count transient faults (TFs) resulting, as well as not resulting in output SEs, affecting the inputs of data-path latches/flip-flops. This approach allows an early monitoring of the latches/flip-flops vulnerability to TFs, thus discovering intrinsic weaknesses of design or process. The proposed monitoring scheme features a very low impact on area overhead and power consumption, thus being suitable to be deployed within any IC.
| Titolo: | Transient Fault and Soft Error On-Die Monitoring Scheme | |
| Autore/i: | ROSSI, DANIELE; OMANA, MARTIN EUGENIO; METRA, CECILIA | |
| Autore/i Unibo: | ||
| Anno: | 2010 | |
| Titolo del libro: | Proceedings of The 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems | |
| Pagina iniziale: | 391 | |
| Pagina finale: | 398 | |
| Digital Object Identifier (DOI): | http://dx.doi.org/10.1109/DFT.2010.53 | |
| Abstract: | In this paper we propose an on-die monitoring scheme to detect and count transient faults (TFs) resulting, as well as not resulting in output SEs, affecting the inputs of data-path latches/flip-flops. This approach allows an early monitoring of the latches/flip-flops vulnerability to TFs, thus discovering intrinsic weaknesses of design or process. The proposed monitoring scheme features a very low impact on area overhead and power consumption, thus being suitable to be deployed within any IC. | |
| Data prodotto definitivo in UGOV: | 22-feb-2011 | |
| Appare nelle tipologie: | 4.01 Contributo in Atti di convegno |
File in questo prodotto:
http://hdl.handle.net/11585/99032
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