CRIS Current Research Information System
IRIS è la soluzione IT che facilita la raccolta e la gestione dei dati relativi alle attività e ai prodotti della ricerca. Fornisce a ricercatori, amministratori e valutatori gli strumenti per monitorare i risultati della ricerca, aumentarne la visibilità e allocare in modo efficace le risorse disponibili.
EnglishIn this paper we propose an on-die monitoring scheme to detect and count transient faults (TFs) resulting, as well as not resulting in output SEs, affecting the inputs of data-path latches/flip-flops. This approach allows an early monitoring of the latches/flip-flops vulnerability to TFs, thus discovering intrinsic weaknesses of design or process. The proposed monitoring scheme features a very low impact on area overhead and power consumption, thus being suitable to be deployed within any IC.
| Titolo: | Transient Fault and Soft Error On-Die Monitoring Scheme |
| Autore/i: | ROSSI, DANIELE; OMANA, MARTIN EUGENIO; METRA, CECILIA |
| Autore/i Unibo: | |
| Anno: | 2010 |
| Titolo del libro: | Proceedings of The 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems |
| Pagina iniziale: | 391 |
| Pagina finale: | 398 |
| Digital Object Identifier (DOI): | http://dx.doi.org/10.1109/DFT.2010.53 |
| Abstract: | In this paper we propose an on-die monitoring scheme to detect and count transient faults (TFs) resulting, as well as not resulting in output SEs, affecting the inputs of data-path latches/flip-flops. This approach allows an early monitoring of the latches/flip-flops vulnerability to TFs, thus discovering intrinsic weaknesses of design or process. The proposed monitoring scheme features a very low impact on area overhead and power consumption, thus being suitable to be deployed within any IC. |
| Data prodotto definitivo in UGOV: | 22-feb-2011 |
| Appare nelle tipologie: | 4.01 Contributo in Atti di convegno |
File in questo prodotto:
http://hdl.handle.net/11585/99032
Copyright © 2021