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EnglishIn this paper we propose an on-die monitoring scheme to detect and count transient faults (TFs) resulting, as well as not resulting in output SEs, affecting the inputs of data-path latches/flip-flops. This approach allows an early monitoring of the latches/flip-flops vulnerability to TFs, thus discovering intrinsic weaknesses of design or process. The proposed monitoring scheme features a very low impact on area overhead and power consumption, thus being suitable to be deployed within any IC.
| Titolo: | Transient Fault and Soft Error On-Die Monitor |
| Autore/i: | ROSSI, DANIELE; OMANA, MARTIN EUGENIO; METRA, CECILIA |
| Autore/i Unibo: | |
| Anno: | 2010 |
| Titolo del libro: | Proceedings of The 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems |
| Pagina iniziale: | 391 |
| Pagina finale: | 398 |
| Digital Object Identifier (DOI): | 10.1109/DFT.2010.53 |
| Abstract: | In this paper we propose an on-die monitoring scheme to detect and count transient faults (TFs) resulting, as well as not resulting in output SEs, affecting the inputs of data-path latches/flip-flops. This approach allows an early monitoring of the latches/flip-flops vulnerability to TFs, thus discovering intrinsic weaknesses of design or process. The proposed monitoring scheme features a very low impact on area overhead and power consumption, thus being suitable to be deployed within any IC. |
| Data prodotto definitivo in UGOV: | 22-feb-2011 |
| Appare nelle tipologie: | 4.01 Contributo in Atti di convegno |
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