CRIS Current Research Information System

ROSSI, DANIELE
 Distribuzione geografica
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Continente #
NA - Nord America 5.088
EU - Europa 2.069
AS - Asia 1.801
AF - Africa 141
SA - Sud America 87
OC - Oceania 4
Continente sconosciuto - Info sul continente non disponibili 1
Totale 9.191
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Nazione #
US - Stati Uniti d'America 5.076
CN - Cina 654
GB - Regno Unito 609
SG - Singapore 609
DE - Germania 261
UA - Ucraina 246
SE - Svezia 238
IT - Italia 232
VN - Vietnam 192
RU - Federazione Russa 138
HK - Hong Kong 119
IN - India 109
FR - Francia 98
IE - Irlanda 65
BR - Brasile 56
JP - Giappone 52
ZA - Sudafrica 46
BG - Bulgaria 45
TG - Togo 44
EE - Estonia 42
KR - Corea 34
CI - Costa d'Avorio 30
CH - Svizzera 19
AR - Argentina 18
SC - Seychelles 15
NL - Olanda 13
FI - Finlandia 12
BE - Belgio 10
GR - Grecia 10
CA - Canada 9
PL - Polonia 7
DK - Danimarca 5
MY - Malesia 5
CL - Cile 4
EC - Ecuador 4
IQ - Iraq 4
AE - Emirati Arabi Uniti 3
BD - Bangladesh 3
CZ - Repubblica Ceca 3
ID - Indonesia 3
PT - Portogallo 3
SI - Slovenia 3
AL - Albania 2
AM - Armenia 2
AU - Australia 2
BO - Bolivia 2
ES - Italia 2
KE - Kenya 2
LA - Repubblica Popolare Democratica del Laos 2
MX - Messico 2
NZ - Nuova Zelanda 2
PE - Perù 2
RO - Romania 2
A2 - ???statistics.table.value.countryCode.A2??? 1
AT - Austria 1
DO - Repubblica Dominicana 1
DZ - Algeria 1
EG - Egitto 1
ET - Etiopia 1
HR - Croazia 1
IL - Israele 1
IR - Iran 1
JO - Giordania 1
KG - Kirghizistan 1
KW - Kuwait 1
LB - Libano 1
MA - Marocco 1
NO - Norvegia 1
PK - Pakistan 1
SA - Arabia Saudita 1
SK - Slovacchia (Repubblica Slovacca) 1
TH - Thailandia 1
TR - Turchia 1
VE - Venezuela 1
Totale 9.191
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Città #
Ann Arbor 1.955
Southend 520
Fairfield 414
Singapore 396
Ashburn 284
Wilmington 252
Chandler 242
Woodbridge 202
Santa Clara 183
Seattle 178
Jacksonville 172
Houston 141
Hefei 138
Cambridge 133
Princeton 126
Hong Kong 115
Beijing 96
Dong Ket 93
Dallas 83
Boardman 73
Dublin 63
Padova 55
Westminster 55
Nanjing 52
Tokyo 49
Lomé 44
Sofia 44
Bologna 41
Saint Petersburg 38
Berlin 35
Mülheim 34
Los Angeles 33
Seoul 33
Medford 31
Abidjan 30
Buffalo 30
Shenyang 29
Hebei 26
Jinan 26
San Diego 22
Changsha 21
Milan 20
Washington 19
Ho Chi Minh City 18
Tianjin 16
Hanoi 15
Mahé 15
Bern 14
Bengaluru 13
Nanchang 12
Redondo Beach 11
São Paulo 10
Verona 10
Yubileyny 10
Zhengzhou 10
Brussels 9
Guangzhou 9
Jiaxing 9
Munich 9
Hangzhou 8
Helsinki 8
New York 8
Norwalk 8
Shanghai 8
Taiyuan 8
Des Moines 7
Lanzhou 7
London 7
Olalla 7
Phoenix 7
Redwood City 7
San Venanzo 7
Chicago 6
Dearborn 6
Fuzhou 6
Amsterdam 5
Boston 5
Fremont 5
Kunming 5
Ningbo 5
Taizhou 5
Chongqing 4
Costa Mesa 4
Haikou 4
Kuala Lumpur 4
Montreal 4
San Francisco 4
Toronto 4
Wuhan 4
Bexley 3
Buenos Aires 3
Da Nang 3
Falls Church 3
Frankfurt am Main 3
Fukui-shi 3
Las Vegas 3
Modena 3
Ninh Bình 3
Paris 3
Qingdao 3
Totale 7.026
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Nome #
Low Cost and High Speed Embedded Two-Rail Code Checker 237
Self-Checking Voter for High Speed TMR Systems 224
Model for Transient Fault Susceptibility of Combinational Circuits 224
Accurate Linear Model for SET Critical Charge Estimation 214
New ECC for Crosstalk Effect Minimization 203
Self-Checking Monitor for NBTI Due Degradation 199
Clock Faults Induced Min and Max Delay Violations 195
Exploiting ECC Redundancy to Minimize Crosstalk Impact 190
Multiple Transient Faults in Logic: An Issue for Next Generation ICs? 187
Checker No-Harm Alarm Robustness 186
Checker No-Harm Alarms and Design Approaches to Tolerate Them 186
High-Performance Robust Latches 186
Can Clock Faults Be Detected Through Functional Test ? 183
Impact of Aging Phenomena on Latches’ Robustness 181
Low-Cost and High-Reduction Approaches for Power Droop during Launch-On-Shift Scan-Based Logic BIST 181
Fast and Low-Cost Clock Deskew Buffer 180
Low Cost and Low Intrusive Approach to Test On-Line the Scheduler of High Performance Microprocessors 180
Impact of Aging Phenomena on Soft Error Susceptibility 180
Analysis of the Impact of Bus Implemented EDCs on On-Chip SSN 178
Faults Affecting Energy-Harvesting Circuits of Self-Powered Wireless Sensors and Their Possible Concurrent Detection 177
Won't On-Chip Clock Calibration Guarantee Performance Boost and Product Quality? 174
Power droop reduction during Launch-On-Shift scan-based logic BIST 173
Path (Min) delay Faults and Their Impact on Self-Checking Circuits' Operation 172
Model for Thermal Behavior of Shaded Photovoltaic Cells Under Hot-Spot Condition 170
New High Speed CMOS Self-Checking Voter 167
Error correcting code analysis for cache memory high reliability and performance 167
Impact of ECCs on Simultaneously Switching Output Noise for On-Chip Busses of High Reliability Systems 166
Novel Approach to Reduce Power Droop During Scan-Based Logic BIST 166
High-reliability Fault Tolerant Digital Systems in Nanometric Technologies: Characterization and Design Methodologies 163
Novel High Speed Robust Latch 163
Low-Cost and Highly Reliable Detector for Transient and Crosstalk Faults Affecting FPGA Interconnects 162
Function Inherent Code Checking: A New Low Cost On-Line Testing Approach for High Performance Microprocessor Control Logic 162
Transient Fault and Soft Error On-Die Monitoring Scheme 162
Impact of Bias Temperature Instability on Soft Error Susceptibility 161
Low Cost NBTI Degradation Detection and Masking Approaches 161
Modeling and Detection of Hotspot in Shaded Photovoltaic Cells 160
The Other Side of the Timing Equation: a Result of Clock Faults 159
On-Transistor Level Gate Sizing for Increased Robustness to Transient Faults 159
Novel Low-Cost Aging Sensor 159
A Novel Dual-Walled CNT Bus Architecture with Reduced Cross-Coupling Features 155
Configurable Error Control Scheme for NoC Signal Integrity 154
Faults Affecting the Control Blocks of PV Arrays and Techniques for Their Concurrent Detection 154
Low-Cost On-Chip Clock Jitter Measurement Scheme 152
Modeling Crosstalk Effects in CNT Bus Architectures 152
Low Cost Concurrent Error Detection Strategy for the Control Logic of High Performance Microprocessors and Its Application to the Instruction Decoder 151
Power Consumption of Fault Tolerant Busses 150
Coding Techniques for Low Switching Noise in Fault Tolerant Busses 145
Latch Susceptibility to Transient Faults and New Hardening Approach 143
Simultaneous Switching Noise Analysis: The Relation Between Bus Layout and Coding 141
Risks for Signal Integrity in System in Package and Possible Remedies 138
Polynomial Based Key Distribution Scheme for WPAN 138
Polynomial Based Key Distribution Scheme for WPAN 135
Cryptanalysis of Simplified-AES Encrypted Communication 128
Low Cost Scheme for On-Line Skew Compensation 117
Resistive Crossbar Switching Networks to Implement Inherently Fault Tolerant Nano LUTs 116
Totale 9.266
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Categoria #
all - tutte 23.119
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 23.119
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021568 0 0 0 0 0 93 10 64 97 39 73 192
2021/20222.786 77 20 407 341 346 278 290 302 307 80 146 192
2022/2023933 136 136 51 138 57 82 37 45 143 7 72 29
2023/2024301 18 42 27 16 36 104 8 6 5 23 4 12
2024/2025875 70 127 65 43 287 53 63 12 8 3 5 139
2025/20261.144 112 180 323 176 277 76 0 0 0 0 0 0
Totale 9.266