CRIS Current Research Information System

MAGNONE, PAOLO
 Distribuzione geografica
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Continente #
NA - Nord America 3.616
EU - Europa 1.201
AS - Asia 942
AF - Africa 95
SA - Sud America 2
Totale 5.856
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Nazione #
US - Stati Uniti d'America 3.613
GB - Regno Unito 387
CN - Cina 342
SG - Singapore 261
VN - Vietnam 199
IT - Italia 186
DE - Germania 179
RU - Federazione Russa 102
SE - Svezia 84
IN - India 69
IE - Irlanda 61
UA - Ucraina 60
HK - Hong Kong 56
CI - Costa d'Avorio 49
FR - Francia 46
ZA - Sudafrica 43
EE - Estonia 27
BG - Bulgaria 18
BE - Belgio 11
FI - Finlandia 10
CH - Svizzera 9
HR - Croazia 5
JO - Giordania 5
AT - Austria 3
CA - Canada 3
GR - Grecia 3
LB - Libano 3
NL - Olanda 3
CL - Cile 2
SC - Seychelles 2
SI - Slovenia 2
TW - Taiwan 2
CZ - Repubblica Ceca 1
ES - Italia 1
HU - Ungheria 1
IR - Iran 1
KR - Corea 1
NG - Nigeria 1
PT - Portogallo 1
RO - Romania 1
SA - Arabia Saudita 1
TR - Turchia 1
UZ - Uzbekistan 1
Totale 5.856
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Città #
Ann Arbor 1.372
Southend 353
Fairfield 339
Singapore 224
Wilmington 202
Ashburn 178
Santa Clara 171
Woodbridge 154
Chandler 153
Seattle 147
Cambridge 129
Houston 123
Princeton 104
Dong Ket 98
Dublin 61
Hong Kong 55
Boardman 54
Abidjan 49
Nanjing 46
Turin 43
Padova 41
Westminster 41
Bologna 39
Jacksonville 33
Berlin 31
Jinan 28
New York 28
Saint Petersburg 26
Beijing 23
Shenyang 21
Dearborn 19
Sofia 18
Changsha 17
Medford 17
San Diego 17
Redmond 16
Mülheim 15
Hebei 14
Tianjin 13
Norwalk 12
Brussels 11
Guangzhou 11
Jiaxing 11
Nanchang 11
Cesena 9
Zhengzhou 9
Helsinki 8
Ho Chi Minh City 8
Kunming 8
Shanghai 8
Falls Church 7
Milan 7
San Venanzo 7
Yubileyny 7
Haikou 6
Taizhou 6
The Dalles 6
Amman 5
Bern 5
Hanoi 5
Lanzhou 5
London 5
Frankfurt am Main 4
Hangzhou 4
Hefei 4
Kiev 4
Redwood City 4
San Francisco 4
Vallefoglia 4
Wuxi 4
Bühl 3
Ningbo 3
Olalla 3
Toronto 3
Buffalo 2
Busalla 2
Chengdu 2
Cordenons 2
Dallas 2
Duncan 2
Falkenstein 2
Florence 2
Genova 2
Islington 2
Jiangmen 2
Kaliningrad 2
Langfang 2
Lappeenranta 2
Las Vegas 2
Lausanne 2
Mahé 2
Munich 2
North Bergen 2
Nuvolera 2
Nürnberg 2
Orange 2
Shenzhen 2
Silverton 2
Taiyuan 2
Walnut 2
Totale 4.785
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Nome #
Analysis of the impact of geometrical and technological parameters on recombination losses in interdigitated back-contact solar cells 221
A Methodology to Account for the Finger Non-Uniformity in Photovoltaic Solar Cell 205
A methodology to account for the finger interruptions in solar cell performance 193
TCAD simulation of hot-carrier stress degradation in split-gate n-channel STI-LDMOS transistors 172
2-D Numerical analysis of the impact of the highly-doped profile on selective emitter solar cell performance 171
Numerical simulation and modeling of rear point contact solar cells 168
Characterization and Modeling of Hot Carrier-Induced Variability in Subthreshold Region 166
Analysis of the Impact of Doping Levels on Performance of back Contact-Back Junction Solar Cells 160
Impact of Hot Carriers on nMOSFET Variability in 45- and 65-nm CMOS Technologies 160
A Comparative Study of MWT Architectures by Means of Numerical Simulations 158
A Distributed Electrical Network to Model the Local Shunting in Multicrystalline Silicon Solar Cells 157
A Distributed Electrical Model for Interdigitated back Contact Silicon Solar Cells 156
Understanding the impact of double screen-printing on silicon solar cells by 2-D numerical simulations 155
Effect of shunt resistance on the performance of mc-Silicon solar cells: a combined electro-optical and thermal investigation 152
Two- and Three-Dimensional Numerical Simulation of Advanced Silicon Solar Cells 152
Experimental technique for the performance evaluation and optimization of 1/f noise spectrum investigation in electron devices 151
Open issues for the numerical simulation of silicon solar cells 149
Understanding the Impact of the Doping Profiles on Selective Emitter Solar Cell by Two-Dimensional Numerical Simulation 148
Performance Analysis of Rear Point Contact Solar Cells by Three-Dimensional Numerical Simulation 144
Local Shunting in Multicrystalline Silicon Solar Cells: Distributed Electrical Simulations and Experiments 143
Numerical simulation and modeling of thermal transient in silicon power devices 142
Loss analysis of silicon solar cells by means of numerical device simulation 142
Fabrication, characterization and modeling of a silicon solar cell optimized for concentrated photovoltaic applications 140
Numerical simulation of the impact of design parameters on the performance of back-contact back-junction solar cell 137
Negative Bias Temperature Stress Reliability in Trench-Gated P-Channel Power MOSFETs 137
Modeling of thermal network in silicon power MOSFETs 136
Numerical simulation and modeling of thermal transient in silicon power devices 135
NBTI in p-channel power U-MOSFETs: Understanding the degradation and the recovery mechanisms2014 15th International Conference on Ultimate Integration on Silicon (ULIS) 135
Experimental characterization of low-frequency noise in power MOSFETs for defectiveness modelling and technology assessment 133
Numerical Simulation and Modeling of Resistive and Recombination Losses in MWT Solar Cells 132
Numerical Simulation on the Influence of Via and Rear Emitters in MWT Solar Cells 131
Reliability of Au-free AlGaN/GaN-on-silicon Schottky barrier diodes under ON-state stress 127
TCAD numerical simulation of Metal Wrap Through solar cell2013 IEEE International Conference of Electron Devices and Solid-state Circuits 122
Understanding negative bias temperature stress in p-channel trench-gate power MOSFETs by low-frequency noise measurement2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD) 122
Silicon Concentrator Solar Cells: Fabrication, Characterization and Modeling for Future Improvements 121
Buried Silicon-Germanium pMOSFETs: Experimental Analysis in VLSI Logic Circuits Under Aggressive Voltage Scaling 118
Low-Frequency Noise Measurements in Silicon Power MOSFETs as a Tool to Experimentally Investigate the Defectiveness of the Gate Oxide 103
Experimental analysis of buried SiGe pMOSFETs from the perspective of aggressive voltage scaling 96
Optimal Non-parametric Estimation of 1/f Noise Spectrum in Semiconductor Device 96
Understanding the Basic Advantages of Bulk FinFETs for Sub- and Near-Threshold Logic Circuits From Device Measurements 90
FinFET Mismatch in Subthreshold Region: Theory and Experiments 90
Technical and Economical Assessment on Wire Soldered Cells Metallization 63
Totale 5.929
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Categoria #
all - tutte 14.512
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 14.512
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/202060 0 0 0 0 0 0 0 0 0 0 0 60
2020/2021625 133 36 27 21 8 69 11 22 91 29 21 157
2021/20221.964 146 45 237 204 246 194 226 185 205 53 111 112
2022/2023726 83 61 37 118 34 64 15 22 165 15 88 24
2023/2024154 15 37 4 10 7 50 2 10 4 5 6 4
2024/2025774 80 165 58 57 211 30 64 8 1 5 8 87
Totale 5.929