MAGNONE, PAOLO
 Distribuzione geografica
Continente #
NA - Nord America 49
EU - Europa 32
AS - Asia 15
Totale 96
Nazione #
US - Stati Uniti d'America 49
DE - Germania 12
IT - Italia 8
FR - Francia 6
CN - Cina 4
SG - Singapore 4
HK - Hong Kong 3
NL - Olanda 3
IN - India 2
JP - Giappone 2
CH - Svizzera 1
CZ - Repubblica Ceca 1
IE - Irlanda 1
Totale 96
Città #
Ashburn 11
Boardman 9
Munich 8
Los Angeles 5
Bologna 4
Chicago 4
Singapore 4
Central 3
Grenoble 3
Atlanta 2
Brescia 2
Delhi 2
Eindhoven 2
Reston 2
San Francisco 2
Stuttgart 2
Buffalo 1
Chitose 1
Council Bluffs 1
Crugers 1
Dallas 1
Dublin 1
Fisciano 1
Frankfurt am Main 1
Hangzhou 1
Jersey City 1
Lincoln 1
Naples 1
Nishio 1
Shenzhen 1
Zurich 1
Totale 80
Nome #
TCAD simulation of hot-carrier stress degradation in split-gate n-channel STI-LDMOS transistors, file 38bbf57c-d22a-4e91-937f-0953a53a96dd 39
Local Shunting in Multicrystalline Silicon Solar Cells: Distributed Electrical Simulations and Experiments, file e1dcb32c-5048-7715-e053-1705fe0a6cc9 10
Numerical Simulation and Modeling of Resistive and Recombination Losses in MWT Solar Cells, file e1dcb32c-504a-7715-e053-1705fe0a6cc9 9
Experimental characterization of low-frequency noise in power MOSFETs for defectiveness modelling and technology assessment, file e1dcb32c-5047-7715-e053-1705fe0a6cc9 8
Numerical simulation and modeling of thermal transient in silicon power devices, file e1dcb32c-504b-7715-e053-1705fe0a6cc9 7
TCAD numerical simulation of Metal Wrap Through solar cell2013 IEEE International Conference of Electron Devices and Solid-state Circuits, file e1dcb32c-504d-7715-e053-1705fe0a6cc9 7
Negative Bias Temperature Stress Reliability in Trench-Gated P-Channel Power MOSFETs, file e1dcb32c-59af-7715-e053-1705fe0a6cc9 6
Understanding negative bias temperature stress in p-channel trench-gate power MOSFETs by low-frequency noise measurement2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD), file e1dcb32c-6177-7715-e053-1705fe0a6cc9 6
Numerical Simulation on the Influence of Via and Rear Emitters in MWT Solar Cells, file e1dcb32c-616e-7715-e053-1705fe0a6cc9 2
Experimental technique for the performance evaluation and optimization of 1/f noise spectrum investigation in electron devices, file e1dcb32f-6873-7715-e053-1705fe0a6cc9 2
Totale 96
Categoria #
all - tutte 446
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 446


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2022/202364 7 6 5 4 8 6 4 12 2 7 2 1
2023/202430 1 3 2 3 7 3 4 5 2 0 0 0
Totale 96