MAGNONE, PAOLO
MAGNONE, PAOLO
CENTRO RICERCA SISTEMI ELETTRONICI INGEGN.INF. E TELECOM."ERCOLE DE CASTRO"
Personale esterno ed autonomi
Magnone; Paolo Magnone; Magnone P.; P. Magnone
TCAD simulation of hot-carrier stress degradation in split-gate n-channel STI-LDMOS transistors
2020 Giuliano F.; Magnone P.; Pistollato S.; Tallarico A.N.; Reggiani S.; Fiegna C.; Depetro R.; Rossetti M.; Croce G.
Experimental technique for the performance evaluation and optimization of 1/f noise spectrum investigation in electron devices
2017 Magnone, Paolo; Traverso, PIER ANDREA; Fiegna, Claudio
Numerical simulation of the impact of design parameters on the performance of back-contact back-junction solar cell
2016 Procel, P.; Zanuccoli, M.; Maccaronio, V.; Crupi, F.; Cocorullo, G.; Magnone, P.; Fiegna, C.
Reliability of Au-free AlGaN/GaN-on-silicon Schottky barrier diodes under ON-state stress
2016 Tallarico, ANDREA NATALE; Stoffels, Steve; Magnone, Paolo; Jie, Hu; Lenci, Silvia; Marcon, Denis; Sangiorgi, Enrico; Fiegna, Claudio; Decoutere, Stefaan
Analysis of the impact of geometrical and technological parameters on recombination losses in interdigitated back-contact solar cells
2015 Zanuccoli, Mauro; Magnone, Paolo; Sangiorgi, Enrico; Fiegna, Claudio
Fabrication, characterization and modeling of a silicon solar cell optimized for concentrated photovoltaic applications
2015 G. Paternoster;M. Zanuccoli;P. Bellutti;L. Ferrario;F. Ficorella;C. Fiegna;P. Magnone;F. Mattedi;E. Sangiorgi
Technical and Economical Assessment on Wire Soldered Cells Metallization
2015 Galiazzo, M.; Bertazzo, M.; Micheletti, T.; Zanuccoli, M.; Magnone, P.
A Distributed Electrical Model for Interdigitated back Contact Silicon Solar Cells
2014 Daniele Giaffreda;Maarten Debucquoy;Paolo Magnone;Niels Posthuma;Claudio Fiegna
Analysis of the Impact of Doping Levels on Performance of back Contact-Back Junction Solar Cells
2014 Paul Procel; Vincenzo Maccaronio; Felice Crupi; Giuseppe Cocorullo; Mauro Zanuccoli; Paolo Magnone; Claudio Fiegna
Experimental characterization of low-frequency noise in power MOSFETs for defectiveness modelling and technology assessment
2014 Paolo Magnone;Pier Andrea Traverso;Giacomo Barletta;Claudio Fiegna
Local Shunting in Multicrystalline Silicon Solar Cells: Distributed Electrical Simulations and Experiments
2014 Daniele Giaffreda;Paolo Magnone;Matteo Meneghini;Marco Barbato;Gaudenzio Meneghesso;Enrico Zanoni;Enrico Sangiorgi;Claudio Fiegna
NBTI in p-channel power U-MOSFETs: Understanding the degradation and the recovery mechanisms2014 15th International Conference on Ultimate Integration on Silicon (ULIS)
2014 Andrea Natale Tallarico;Paolo Magnone;Giacomo Barletta;Angelo Magri;Enrico Sangiorgi;Claudio Fiegna
Negative Bias Temperature Stress Reliability in Trench-Gated P-Channel Power MOSFETs
2014 Andrea Natale Tallarico;Paolo Magnone;Giacomo Barletta;Angelo Magri;Enrico Sangiorgi;Claudio Fiegna
Numerical Simulation on the Influence of Via and Rear Emitters in MWT Solar Cells
2014 Paolo Magnone;Raffaele De Rose;Diego Tonini;Michel Frei;Mauro Zanuccoli;Andrea Belli;Marco Galiazzo;Enrico Sangiorgi;Claudio Fiegna
Optimal Non-parametric Estimation of 1/f Noise Spectrum in Semiconductor Device
2014 P. Magnone; P. A. Traverso; C. Fiegna
Understanding negative bias temperature stress in p-channel trench-gate power MOSFETs by low-frequency noise measurement2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD)
2014 P. Magnone;G. Barletta;P.A. Traverso;A. Magri;E. Sangiorgi;C. Fiegna
A Comparative Study of MWT Architectures by Means of Numerical Simulations
2013 Paolo Magnone;Diego Tonini;Raffaele De Rose;Michel Frei;Felice Crupi;Marco Lanuzza;Enrico Sangiorgi;Claudio Fiegna
Loss analysis of silicon solar cells by means of numerical device simulation
2013 De Rose R.; Magnone P.; Zanuccoli M.; Sangiorgi E.; Fiegna C.
Low-Frequency Noise Measurements in Silicon Power MOSFETs as a Tool to Experimentally Investigate the Defectiveness of the Gate Oxide
2013 Paolo Magnone; Pier Andrea Traverso; Giacomo Barletta; Claudio Fiegna
Numerical Simulation and Modeling of Resistive and Recombination Losses in MWT Solar Cells
2013 Paolo Magnone;Diego Tonini;Raffaele De Rose;Michel Frei;Felice Crupi;Enrico Sangiorgi;Claudio Fiegna
Titolo | Autore(i) | Anno | Periodico | Editore | Tipo | File |
---|---|---|---|---|---|---|
TCAD simulation of hot-carrier stress degradation in split-gate n-channel STI-LDMOS transistors | Giuliano F.; Magnone P.; Pistollato S.; Tallarico A.N.; Reggiani S.; Fiegna C.; Depetro R.; Rosse...tti M.; Croce G. | 2020-01-01 | MICROELECTRONICS RELIABILITY | - | 1.01 Articolo in rivista | TCAD simulation POST PRINT.pdf |
Experimental technique for the performance evaluation and optimization of 1/f noise spectrum investigation in electron devices | Magnone, Paolo; Traverso, PIER ANDREA; Fiegna, Claudio | 2017-01-01 | MEASUREMENT | - | 1.01 Articolo in rivista | - |
Numerical simulation of the impact of design parameters on the performance of back-contact back-junction solar cell | Procel, P.; Zanuccoli, M.; Maccaronio, V.; Crupi, F.; Cocorullo, G.; Magnone, P.; Fiegna, C. | 2016-01-01 | JOURNAL OF COMPUTATIONAL ELECTRONICS | - | 1.01 Articolo in rivista | - |
Reliability of Au-free AlGaN/GaN-on-silicon Schottky barrier diodes under ON-state stress | Tallarico, ANDREA NATALE; Stoffels, Steve; Magnone, Paolo; Jie, Hu; Lenci, Silvia; Marcon, Denis;... Sangiorgi, Enrico; Fiegna, Claudio; Decoutere, Stefaan | 2016-01-01 | IEEE TRANSACTIONS ON ELECTRON DEVICES | - | 1.01 Articolo in rivista | - |
Analysis of the impact of geometrical and technological parameters on recombination losses in interdigitated back-contact solar cells | Zanuccoli, Mauro; Magnone, Paolo; Sangiorgi, Enrico; Fiegna, Claudio | 2015-01-01 | SOLAR ENERGY | - | 1.01 Articolo in rivista | - |
Fabrication, characterization and modeling of a silicon solar cell optimized for concentrated photovoltaic applications | G. Paternoster;M. Zanuccoli;P. Bellutti;L. Ferrario;F. Ficorella;C. Fiegna;P. Magnone;F. Mattedi;...E. Sangiorgi | 2015-01-01 | SOLAR ENERGY MATERIALS AND SOLAR CELLS | - | 1.01 Articolo in rivista | - |
Technical and Economical Assessment on Wire Soldered Cells Metallization | Galiazzo, M.; Bertazzo, M.; Micheletti, T.; Zanuccoli, M.; Magnone, P. | 2015-01-01 | - | - | 4.01 Contributo in Atti di convegno | - |
A Distributed Electrical Model for Interdigitated back Contact Silicon Solar Cells | Daniele Giaffreda;Maarten Debucquoy;Paolo Magnone;Niels Posthuma;Claudio Fiegna | 2014-01-01 | ENERGY PROCEDIA | - | 1.01 Articolo in rivista | - |
Analysis of the Impact of Doping Levels on Performance of back Contact-Back Junction Solar Cells | Paul Procel; Vincenzo Maccaronio; Felice Crupi; Giuseppe Cocorullo; Mauro Zanuccoli; Paolo Magnon...e; Claudio Fiegna | 2014-01-01 | ENERGY PROCEDIA | - | 1.01 Articolo in rivista | - |
Experimental characterization of low-frequency noise in power MOSFETs for defectiveness modelling and technology assessment | Paolo Magnone;Pier Andrea Traverso;Giacomo Barletta;Claudio Fiegna | 2014-01-01 | MEASUREMENT | - | 1.01 Articolo in rivista | - |
Local Shunting in Multicrystalline Silicon Solar Cells: Distributed Electrical Simulations and Experiments | Daniele Giaffreda;Paolo Magnone;Matteo Meneghini;Marco Barbato;Gaudenzio Meneghesso;Enrico Zanoni...;Enrico Sangiorgi;Claudio Fiegna | 2014-01-01 | IEEE JOURNAL OF PHOTOVOLTAICS | - | 1.01 Articolo in rivista | - |
NBTI in p-channel power U-MOSFETs: Understanding the degradation and the recovery mechanisms2014 15th International Conference on Ultimate Integration on Silicon (ULIS) | Andrea Natale Tallarico;Paolo Magnone;Giacomo Barletta;Angelo Magri;Enrico Sangiorgi;Claudio Fiegna | 2014-01-01 | - | IEEE Computer Society | 4.01 Contributo in Atti di convegno | - |
Negative Bias Temperature Stress Reliability in Trench-Gated P-Channel Power MOSFETs | Andrea Natale Tallarico;Paolo Magnone;Giacomo Barletta;Angelo Magri;Enrico Sangiorgi;Claudio Fiegna | 2014-01-01 | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | - | 1.01 Articolo in rivista | - |
Numerical Simulation on the Influence of Via and Rear Emitters in MWT Solar Cells | Paolo Magnone;Raffaele De Rose;Diego Tonini;Michel Frei;Mauro Zanuccoli;Andrea Belli;Marco Galiaz...zo;Enrico Sangiorgi;Claudio Fiegna | 2014-01-01 | IEEE JOURNAL OF PHOTOVOLTAICS | - | 1.01 Articolo in rivista | - |
Optimal Non-parametric Estimation of 1/f Noise Spectrum in Semiconductor Device | P. Magnone; P. A. Traverso; C. Fiegna | 2014-01-01 | - | - | 4.01 Contributo in Atti di convegno | - |
Understanding negative bias temperature stress in p-channel trench-gate power MOSFETs by low-frequency noise measurement2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD) | P. Magnone;G. Barletta;P.A. Traverso;A. Magri;E. Sangiorgi;C. Fiegna | 2014-01-01 | - | Institute of Electrical and Electronics Engineers Inc. | 4.01 Contributo in Atti di convegno | - |
A Comparative Study of MWT Architectures by Means of Numerical Simulations | Paolo Magnone;Diego Tonini;Raffaele De Rose;Michel Frei;Felice Crupi;Marco Lanuzza;Enrico Sangior...gi;Claudio Fiegna | 2013-01-01 | ENERGY PROCEDIA | - | 1.01 Articolo in rivista | - |
Loss analysis of silicon solar cells by means of numerical device simulation | De Rose R.; Magnone P.; Zanuccoli M.; Sangiorgi E.; Fiegna C. | 2013-01-01 | - | - | 4.01 Contributo in Atti di convegno | - |
Low-Frequency Noise Measurements in Silicon Power MOSFETs as a Tool to Experimentally Investigate the Defectiveness of the Gate Oxide | Paolo Magnone; Pier Andrea Traverso; Giacomo Barletta; Claudio Fiegna | 2013-01-01 | - | - | 4.01 Contributo in Atti di convegno | - |
Numerical Simulation and Modeling of Resistive and Recombination Losses in MWT Solar Cells | Paolo Magnone;Diego Tonini;Raffaele De Rose;Michel Frei;Felice Crupi;Enrico Sangiorgi;Claudio Fiegna | 2013-01-01 | IEEE JOURNAL OF PHOTOVOLTAICS | - | 1.01 Articolo in rivista | - |