MAGNONE, PAOLO
MAGNONE, PAOLO
CENTRO RICERCA SISTEMI ELETTRONICI INGEGN.INF. E TELECOM."ERCOLE DE CASTRO"
Personale esterno ed autonomi
Magnone; Paolo Magnone; Magnone P.; P. Magnone
2-D Numerical analysis of the impact of the highly-doped profile on selective emitter solar cell performance
2011 De Rose R.; Zanuccoli M.; Magnone P.; Tonini D.; Galiazzo M.; Cellere G.; Frei M.; Guo H.-W.; Fiegna C.; Sangiorgi E.
A Comparative Study of MWT Architectures by Means of Numerical Simulations
2013 Paolo Magnone;Diego Tonini;Raffaele De Rose;Michel Frei;Felice Crupi;Marco Lanuzza;Enrico Sangiorgi;Claudio Fiegna
A Distributed Electrical Model for Interdigitated back Contact Silicon Solar Cells
2014 Daniele Giaffreda;Maarten Debucquoy;Paolo Magnone;Niels Posthuma;Claudio Fiegna
A Distributed Electrical Network to Model the Local Shunting in Multicrystalline Silicon Solar Cells
2012 D. Giaffreda; P. Magnone; R. De Rose; M. Barbato; M. Meneghini; V. Giliberto; G. Meneghesso; E. Sangiorgi; C. Fiegna
A methodology to account for the finger interruptions in solar cell performance
2012 De Rose R.; Malomo A.; Magnone P.; Crupi F.; Cellere G.; Martire M.; Tonini D.; Sangiorgi E.
A Methodology to Account for the Finger Non-Uniformity in Photovoltaic Solar Cell
2012 P. Magnone; G. Napoletano; R. De Rose; F. Crupi; D. Tonini; G. Cellere; M. Galiazzo; E. Sangiorgi; C. Fiegna
Analysis of the Impact of Doping Levels on Performance of back Contact-Back Junction Solar Cells
2014 Paul Procel; Vincenzo Maccaronio; Felice Crupi; Giuseppe Cocorullo; Mauro Zanuccoli; Paolo Magnone; Claudio Fiegna
Analysis of the impact of geometrical and technological parameters on recombination losses in interdigitated back-contact solar cells
2015 Mauro, Zanuccoli; Paolo, Magnone; Enrico, Sangiorgi; Claudio, Fiegna
Buried Silicon-Germanium pMOSFETs: Experimental Analysis in VLSI Logic Circuits Under Aggressive Voltage Scaling
2012 Crupi F. ; Alioto M. ; Franco J. ; Magnone P. ; Kaczer B. ; Groeseneken G. ; Mitard J. ; Witters L. ; Hoffmann T. Y. ;
Characterization and Modeling of Hot Carrier-Induced Variability in Subthreshold Region
2012 Magnone P.; Crupi F.; Wils N.; Tuinhout H. P.; Fiegna C.
Effect of shunt resistance on the performance of mc-Silicon solar cells: a combined electro-optical and thermal investigation
2012 Barbato M.; Meneghini M. ; Giliberto V. ; Giaffreda D. ; Magnone P. ; De Rose R. ; Fiegna C. ; Meneghesso G.
Experimental analysis of buried SiGe pMOSFETs from the perspective of aggressive voltage scaling
2011 Crupi F. ; Alioto M. ; Franco J. ; Magnone P. ; Kaczer B. ; Groeseneken G. ; Mitard J. ; Witters L. ; Hoffmann T. Y. ;
Experimental characterization of low-frequency noise in power MOSFETs for defectiveness modelling and technology assessment
2014 Paolo Magnone;Pier Andrea Traverso;Giacomo Barletta;Claudio Fiegna
Experimental technique for the performance evaluation and optimization of 1/f noise spectrum investigation in electron devices
2017 Magnone, P.; Traverso, P.A.; Fiegna, C.
Fabrication, characterization and modeling of a silicon solar cell optimized for concentrated photovoltaic applications
2015 G. Paternoster;M. Zanuccoli;P. Bellutti;L. Ferrario;F. Ficorella;C. Fiegna;P. Magnone;F. Mattedi;E. Sangiorgi
FinFET Mismatch in Subthreshold Region: Theory and Experiments
2010 Magnone P. ; Crupi F. ; Mercha A. ; Andricciola P. ; Tuinhout H. ; Lander R.J.P. ;
Impact of Hot Carriers on nMOSFET Variability in 45- and 65-nm CMOS Technologies
2011 Magnone P. ; Crupi F. ; Wils N. ; Jain R. ; Tuinhout H. ; Andricciola P. ; Giusi G. ; Fiegna C. ;
Local Shunting in Multicrystalline Silicon Solar Cells: Distributed Electrical Simulations and Experiments
2014 Daniele Giaffreda;Paolo Magnone;Matteo Meneghini;Marco Barbato;Gaudenzio Meneghesso;Enrico Zanoni;Enrico Sangiorgi;Claudio Fiegna
Loss analysis of silicon solar cells by means of numerical device simulation
2013 De Rose R.; Magnone P.; Zanuccoli M.; Sangiorgi E.; Fiegna C.
Low-Frequency Noise Measurements in Silicon Power MOSFETs as a Tool to Experimentally Investigate the Defectiveness of the Gate Oxide
2013 Paolo Magnone; Pier Andrea Traverso; Giacomo Barletta; Claudio Fiegna
| Titolo | Autore(i) | Anno | Periodico | Editore | Tipo | File |
|---|---|---|---|---|---|---|
| 2-D Numerical analysis of the impact of the highly-doped profile on selective emitter solar cell performance | De Rose R.; Zanuccoli M.; Magnone P.; Tonini D.; Galiazzo M.; Cellere G.; Frei M.; Guo H.-W.; Fie...gna C.; Sangiorgi E. | 2011-01-01 | - | IEEE Conference Publications | 4.01 Contributo in Atti di convegno | - |
| A Comparative Study of MWT Architectures by Means of Numerical Simulations | Paolo Magnone;Diego Tonini;Raffaele De Rose;Michel Frei;Felice Crupi;Marco Lanuzza;Enrico Sangior...gi;Claudio Fiegna | 2013-01-01 | ENERGY PROCEDIA | - | 1.01 Articolo in rivista | - |
| A Distributed Electrical Model for Interdigitated back Contact Silicon Solar Cells | Daniele Giaffreda;Maarten Debucquoy;Paolo Magnone;Niels Posthuma;Claudio Fiegna | 2014-01-01 | ENERGY PROCEDIA | - | 1.01 Articolo in rivista | - |
| A Distributed Electrical Network to Model the Local Shunting in Multicrystalline Silicon Solar Cells | D. Giaffreda; P. Magnone; R. De Rose; M. Barbato; M. Meneghini; V. Giliberto; G. Meneghesso; E. S...angiorgi; C. Fiegna | 2012-01-01 | - | s.n. | 4.01 Contributo in Atti di convegno | - |
| A methodology to account for the finger interruptions in solar cell performance | De Rose R.; Malomo A.; Magnone P.; Crupi F.; Cellere G.; Martire M.; Tonini D.; Sangiorgi E. | 2012-01-01 | MICROELECTRONICS RELIABILITY | - | 1.01 Articolo in rivista | - |
| A Methodology to Account for the Finger Non-Uniformity in Photovoltaic Solar Cell | P. Magnone; G. Napoletano; R. De Rose; F. Crupi; D. Tonini; G. Cellere; M. Galiazzo; E. Sangiorgi...; C. Fiegna | 2012-01-01 | ENERGY PROCEDIA | - | 1.01 Articolo in rivista | - |
| Analysis of the Impact of Doping Levels on Performance of back Contact-Back Junction Solar Cells | Paul Procel; Vincenzo Maccaronio; Felice Crupi; Giuseppe Cocorullo; Mauro Zanuccoli; Paolo Magnon...e; Claudio Fiegna | 2014-01-01 | ENERGY PROCEDIA | - | 1.01 Articolo in rivista | - |
| Analysis of the impact of geometrical and technological parameters on recombination losses in interdigitated back-contact solar cells | Mauro, Zanuccoli; Paolo, Magnone; Enrico, Sangiorgi; Claudio, Fiegna | 2015-01-01 | SOLAR ENERGY | - | 1.01 Articolo in rivista | - |
| Buried Silicon-Germanium pMOSFETs: Experimental Analysis in VLSI Logic Circuits Under Aggressive Voltage Scaling | Crupi F. ; Alioto M. ; Franco J. ; Magnone P. ; Kaczer B. ; Groeseneken G. ; Mitard J. ; Witters ...L. ; Hoffmann T. Y. ; | 2012-01-01 | IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS | - | 1.01 Articolo in rivista | - |
| Characterization and Modeling of Hot Carrier-Induced Variability in Subthreshold Region | Magnone P.; Crupi F.; Wils N.; Tuinhout H. P.; Fiegna C. | 2012-01-01 | IEEE TRANSACTIONS ON ELECTRON DEVICES | - | 1.01 Articolo in rivista | - |
| Effect of shunt resistance on the performance of mc-Silicon solar cells: a combined electro-optical and thermal investigation | Barbato M.; Meneghini M. ; Giliberto V. ; Giaffreda D. ; Magnone P. ; De Rose R. ; Fiegna C. ; Me...neghesso G. | 2012-01-01 | - | IEEE Conference Publications | 4.01 Contributo in Atti di convegno | - |
| Experimental analysis of buried SiGe pMOSFETs from the perspective of aggressive voltage scaling | Crupi F. ; Alioto M. ; Franco J. ; Magnone P. ; Kaczer B. ; Groeseneken G. ; Mitard J. ; Witters ...L. ; Hoffmann T. Y. ; | 2011-01-01 | IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS PROCEEDINGS | - | 1.01 Articolo in rivista | - |
| Experimental characterization of low-frequency noise in power MOSFETs for defectiveness modelling and technology assessment | Paolo Magnone;Pier Andrea Traverso;Giacomo Barletta;Claudio Fiegna | 2014-01-01 | MEASUREMENT | - | 1.01 Articolo in rivista | - |
| Experimental technique for the performance evaluation and optimization of 1/f noise spectrum investigation in electron devices | Magnone, P.; Traverso, P.A.; Fiegna, C. | 2017-01-01 | MEASUREMENT | - | 1.01 Articolo in rivista | - |
| Fabrication, characterization and modeling of a silicon solar cell optimized for concentrated photovoltaic applications | G. Paternoster;M. Zanuccoli;P. Bellutti;L. Ferrario;F. Ficorella;C. Fiegna;P. Magnone;F. Mattedi;...E. Sangiorgi | 2015-01-01 | SOLAR ENERGY MATERIALS AND SOLAR CELLS | - | 1.01 Articolo in rivista | - |
| FinFET Mismatch in Subthreshold Region: Theory and Experiments | Magnone P. ; Crupi F. ; Mercha A. ; Andricciola P. ; Tuinhout H. ; Lander R.J.P. ; | 2010-01-01 | IEEE TRANSACTIONS ON ELECTRON DEVICES | - | 1.01 Articolo in rivista | - |
| Impact of Hot Carriers on nMOSFET Variability in 45- and 65-nm CMOS Technologies | Magnone P. ; Crupi F. ; Wils N. ; Jain R. ; Tuinhout H. ; Andricciola P. ; Giusi G. ; Fiegna C. ; | 2011-01-01 | IEEE TRANSACTIONS ON ELECTRON DEVICES | - | 1.01 Articolo in rivista | - |
| Local Shunting in Multicrystalline Silicon Solar Cells: Distributed Electrical Simulations and Experiments | Daniele Giaffreda;Paolo Magnone;Matteo Meneghini;Marco Barbato;Gaudenzio Meneghesso;Enrico Zanoni...;Enrico Sangiorgi;Claudio Fiegna | 2014-01-01 | IEEE JOURNAL OF PHOTOVOLTAICS | - | 1.01 Articolo in rivista | - |
| Loss analysis of silicon solar cells by means of numerical device simulation | De Rose R.; Magnone P.; Zanuccoli M.; Sangiorgi E.; Fiegna C. | 2013-01-01 | - | - | 4.01 Contributo in Atti di convegno | - |
| Low-Frequency Noise Measurements in Silicon Power MOSFETs as a Tool to Experimentally Investigate the Defectiveness of the Gate Oxide | Paolo Magnone; Pier Andrea Traverso; Giacomo Barletta; Claudio Fiegna | 2013-01-01 | - | - | 4.01 Contributo in Atti di convegno | - |