In this work we propose a methodology based on a mixed-mode simulation approach to evaluate the impact of finger interruptions in the front-side metallization on the solar cell performance. We apply the proposed methodology to typical finger profiles realized with double screen-printing technology. The efficiency degradation induced by finger interruptions is studied as a function of interruption size, interruption position, number of interruptions and finger resistivity. © 2012 Elsevier Ltd. All rights reserved.
De Rose R., Malomo A., Magnone P., Crupi F., Cellere G., Martire M., et al. (2012). A methodology to account for the finger interruptions in solar cell performance. MICROELECTRONICS RELIABILITY, 52, 2500-2503 [10.1016/j.microrel.2012.07.014].
A methodology to account for the finger interruptions in solar cell performance
DE ROSE, RAFFAELE;MAGNONE, PAOLO;SANGIORGI, ENRICO
2012
Abstract
In this work we propose a methodology based on a mixed-mode simulation approach to evaluate the impact of finger interruptions in the front-side metallization on the solar cell performance. We apply the proposed methodology to typical finger profiles realized with double screen-printing technology. The efficiency degradation induced by finger interruptions is studied as a function of interruption size, interruption position, number of interruptions and finger resistivity. © 2012 Elsevier Ltd. All rights reserved.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
