In this work we propose a methodology based on a mixed-mode simulation approach to evaluate the impact of finger interruptions in the front-side metallization on the solar cell performance. We apply the proposed methodology to typical finger profiles realized with double screen-printing technology. The efficiency degradation induced by finger interruptions is studied as a function of interruption size, interruption position, number of interruptions and finger resistivity. © 2012 Elsevier Ltd. All rights reserved.

De Rose R., Malomo A., Magnone P., Crupi F., Cellere G., Martire M., et al. (2012). A methodology to account for the finger interruptions in solar cell performance. MICROELECTRONICS RELIABILITY, 52, 2500-2503 [10.1016/j.microrel.2012.07.014].

A methodology to account for the finger interruptions in solar cell performance

DE ROSE, RAFFAELE;MAGNONE, PAOLO;SANGIORGI, ENRICO
2012

Abstract

In this work we propose a methodology based on a mixed-mode simulation approach to evaluate the impact of finger interruptions in the front-side metallization on the solar cell performance. We apply the proposed methodology to typical finger profiles realized with double screen-printing technology. The efficiency degradation induced by finger interruptions is studied as a function of interruption size, interruption position, number of interruptions and finger resistivity. © 2012 Elsevier Ltd. All rights reserved.
2012
De Rose R., Malomo A., Magnone P., Crupi F., Cellere G., Martire M., et al. (2012). A methodology to account for the finger interruptions in solar cell performance. MICROELECTRONICS RELIABILITY, 52, 2500-2503 [10.1016/j.microrel.2012.07.014].
De Rose R.; Malomo A.; Magnone P.; Crupi F.; Cellere G.; Martire M.; Tonini D.; Sangiorgi E.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/129770
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