In this paper we propose a three-dimensional (3-D) distributed electrical network for the modelling of solar cells. The developed tool is based on a network of repetitive elementary cells, each modeled by a two-diode electrical circuit and allows to account for the transport through the emitter, the fingers and the busbars. Moreover, the tool is able to account for the non-uniformity in the solar cell. In order to validate our tool, we calibrate the electrical parameters according to experimental measurements on multicrystalline-silicon (mc-Si) solar cells. By using the thermographic analysis, we detect hot spot regions inside the mc-Si devices and we model them by means of local shunting in our tool. The presence of local shunting, due to localized crystal defects, results in a degradation of the open-circuit voltage, of the fill factor and then of the overall power conversion efficiency.

D. Giaffreda, P. Magnone, R. De Rose, M. Barbato, M. Meneghini, V. Giliberto, et al. (2012). A Distributed Electrical Network to Model the Local Shunting in Multicrystalline Silicon Solar Cells. s.l. : s.n. [10.4229/27thEUPVSEC2012-2BV.5.39].

A Distributed Electrical Network to Model the Local Shunting in Multicrystalline Silicon Solar Cells

GIAFFREDA, DANIELE;MAGNONE, PAOLO;DE ROSE, RAFFAELE;SANGIORGI, ENRICO;FIEGNA, CLAUDIO
2012

Abstract

In this paper we propose a three-dimensional (3-D) distributed electrical network for the modelling of solar cells. The developed tool is based on a network of repetitive elementary cells, each modeled by a two-diode electrical circuit and allows to account for the transport through the emitter, the fingers and the busbars. Moreover, the tool is able to account for the non-uniformity in the solar cell. In order to validate our tool, we calibrate the electrical parameters according to experimental measurements on multicrystalline-silicon (mc-Si) solar cells. By using the thermographic analysis, we detect hot spot regions inside the mc-Si devices and we model them by means of local shunting in our tool. The presence of local shunting, due to localized crystal defects, results in a degradation of the open-circuit voltage, of the fill factor and then of the overall power conversion efficiency.
2012
27th European Photovoltaic Solar Energy Conference and Exhibition
1453
1456
D. Giaffreda, P. Magnone, R. De Rose, M. Barbato, M. Meneghini, V. Giliberto, et al. (2012). A Distributed Electrical Network to Model the Local Shunting in Multicrystalline Silicon Solar Cells. s.l. : s.n. [10.4229/27thEUPVSEC2012-2BV.5.39].
D. Giaffreda; P. Magnone; R. De Rose; M. Barbato; M. Meneghini; V. Giliberto; G. Meneghesso; E. Sangiorgi; C. Fiegna
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/131897
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