GNANI, ELENA
GNANI, ELENA
DEI - DIPARTIMENTO DI INGEGNERIA DELL'ENERGIA ELETTRICA E DELL'INFORMAZIONE "GUGLIELMO MARCONI"
Docenti di ruolo di IIa fascia
Characterization and TCAD Modeling of the Lateral Space Charge Accumulation in Epoxy Molding Compound in Packaged HV-ICs
2024 Balestra, L.; Gnani, E.; Rossetti, M.; Depetro, R.; Reggiani, S.
GaN HEMT with p-Type Schottky Gate: A Case Study of TCAD Modeling of the Gate Leakage Current
2024 Ercolano F.; Tallarico A.N.; Millesimo M.; Gnani E.; Reggiani S.; Fiegna C.; Borga M.; Posthuma N.; Bakeroot B.
Application of the k ⋅ p Method to Device Simulation
2023 Gnudi A.; Gnani E.; Reggiani S.; Baccarani G.
Breakdown-Voltage Degradation Under AC Stress of Thick SiO2 Capacitors for Galvanic Insulation
2023 Giuliano, Federico; Reggiani, Susanna; Gnani, Elena; Gnudi, Antonio; Rossetti, Mattia; Depetro, Riccardo
Memory devices – Volatile memories
2023 Gnani, Elena; Baccarani, Giorgio
Memory devices—Non-volatile memories
2023 Gnani, Elena; Baccarani, Giorgio
TCAD Modeling of High-Field Electron Transport in Bulk Wurtzite GaN: The Full-Band SHE-BTE
2023 Balestra L.; Ercolano F.; Gnani E.; Reggiani S.
Characterization and numerical analysis of breakdown in thick amorphous SiO2 capacitors
2022 Giuliano, F.; Reggiani, S.; Gnani, E.; Gnudi, A.; Rossetti, M.; Depetro, R.; Croce, G.
Electron effective masses of Scx Al1- x N and Alx Ga1- x N from first-principles calculations of unfolded band structure
2022 Balestra L.; Gnani E.; Reggiani S.
Group velocity of electrons in 4H-SiC from Density Functional Theory simulations
2022 Balestra L.; Reggiani S.; Gnani E.; Gnudi A.
On the breakdown voltage temperature dependence of high-voltage power diodes passivated with diamond-like carbon
2022 Balestra, L.; Reggiani, S.; Gnudi, A.; Gnani, E.; Dobrzynska, J.; Vobecky, J.
TCAD Investigation of Power-to-Failure Evaluation for Ultrafast Events in BJT-based ESD Protection Cells
2022 Zunarelli L.; Reggiani S.; Gnani E.; Sankaralingam R.; Dissegna M.; Boselli G.
Thickness-dependent dielectric breakdown in thick amorphous SiO2 capacitors
2022 Giuliano F.; Reggiani S.; Gnani E.; Gnudi A.; Rossetti M.; Depetro R.
Constant-current time dependent dielectric breakdown in thick amorphous SiO2 capacitors
2021 Giuliano F.; Reggiani S.; Gnani E.; Gnudi A.; Rossetti M.; Depetro R.; Croce G.
Current Instabilities in Large-Area Silicon Diodes: An Accurate TCAD Approach
2021 Luigi Balestra; Susanna Reggiani; Antonio Gnudi; Elena Gnani; Jan Vobeck{'{y}}; Umamaheswara Vemulapati
Foreword Special Issue on 'New Simulation Methodologies for Next-Generation TCAD Tools'
2021 Jungemann, C.; Bonani, F.; Cea, S. M.; Gnani, E.; Hong, S. -M.; Jin, S.; Liu, X.; Moroz, V.; Verhulst, A.
Influence of the DLC Passivation Conductivity on the Performance of Silicon High-Power Diodes over an Extended Temperature Range
2021 Balestra L.; Reggiani S.; Gnudi A.; Gnani E.; Dobrzynska J.; Vobecky J.
Modeling nanoscale iii–v channel mosfets with the self-consistent multi-valley/multi-subband monte carlo approach
2021 Caruso E.; Esseni D.; Gnani E.; Lizzit D.; Palestri P.; Pin A.; Puglisi F.M.; Selmi L.; Zagni N.
Novel TCAD Approach for the Investigation of Charge Transport in Thick Amorphous SiO2 Insulators
2021 Giuliano F.; Reggiani S.; Gnani E.; Gnudi A.; Rossetti M.; Depetro R.; Croce G.
On the Breakdown Voltage Temperature Dependence of High-Voltage Power Diode Passivated with Diamond-Like Carbon
2021 Balestra, Luigi; Reggiani, Susanna; Gnudi, Antonio; Gnani, Elena; Dobrzynska, Jagoda; Vobecky, Jan
| Titolo | Autore(i) | Anno | Periodico | Editore | Tipo | File |
|---|---|---|---|---|---|---|
| Characterization and TCAD Modeling of the Lateral Space Charge Accumulation in Epoxy Molding Compound in Packaged HV-ICs | Balestra, L.; Gnani, E.; Rossetti, M.; Depetro, R.; Reggiani, S. | 2024-01-01 | IEEE TRANSACTIONS ON ELECTRON DEVICES | - | 1.01 Articolo in rivista | Characterization_and_TCAD_Modeling_of_the_Lateral_Space_Charge_Accumulation_in_Epoxy_Molding_Compound_in_Packaged_HV-ICs.pdf |
| GaN HEMT with p-Type Schottky Gate: A Case Study of TCAD Modeling of the Gate Leakage Current | Ercolano F.; Tallarico A.N.; Millesimo M.; Gnani E.; Reggiani S.; Fiegna C.; Borga M.; Posthuma N....; Bakeroot B. | 2024-01-01 | - | Springer Science and Business Media Deutschland GmbH | 4.01 Contributo in Atti di convegno | - |
| Application of the k ⋅ p Method to Device Simulation | Gnudi A.; Gnani E.; Reggiani S.; Baccarani G. | 2023-01-01 | - | Springer Science and Business Media Deutschland GmbH | 2.01 Capitolo / saggio in libro | - |
| Breakdown-Voltage Degradation Under AC Stress of Thick SiO2 Capacitors for Galvanic Insulation | Giuliano, Federico; Reggiani, Susanna; Gnani, Elena; Gnudi, Antonio; Rossetti, Mattia; Depetro, R...iccardo | 2023-01-01 | IEEE TRANSACTIONS ON ELECTRON DEVICES | - | 1.01 Articolo in rivista | Teos_BD_Brief (6).pdf |
| Memory devices – Volatile memories | Gnani, Elena; Baccarani, Giorgio | 2023-01-01 | - | Elsevier | 2.05 Voce in dizionario o enciclopedia | - |
| Memory devices—Non-volatile memories | Gnani, Elena; Baccarani, Giorgio | 2023-01-01 | - | Elsevier | 2.05 Voce in dizionario o enciclopedia | - |
| TCAD Modeling of High-Field Electron Transport in Bulk Wurtzite GaN: The Full-Band SHE-BTE | Balestra L.; Ercolano F.; Gnani E.; Reggiani S. | 2023-01-01 | IEEE ACCESS | - | 1.01 Articolo in rivista | TCAD_Modeling_of_High-Field_Electron_Transport_in_Bulk_Wurtzite_GaN_The_Full-Band_SHE-BTE.pdf |
| Characterization and numerical analysis of breakdown in thick amorphous SiO2 capacitors | Giuliano, F.; Reggiani, S.; Gnani, E.; Gnudi, A.; Rossetti, M.; Depetro, R.; Croce, G. | 2022-01-01 | SOLID-STATE ELECTRONICS | - | 1.01 Articolo in rivista | TEOS_7p_SSE_2021 (4).pdf |
| Electron effective masses of Scx Al1- x N and Alx Ga1- x N from first-principles calculations of unfolded band structure | Balestra L.; Gnani E.; Reggiani S. | 2022-01-01 | JOURNAL OF APPLIED PHYSICS | - | 1.01 Articolo in rivista | 215108_1_online.pdf |
| Group velocity of electrons in 4H-SiC from Density Functional Theory simulations | Balestra L.; Reggiani S.; Gnani E.; Gnudi A. | 2022-01-01 | SOLID-STATE ELECTRONICS | - | 1.01 Articolo in rivista | elsarticle_template.pdf |
| On the breakdown voltage temperature dependence of high-voltage power diodes passivated with diamond-like carbon | Balestra, L.; Reggiani, S.; Gnudi, A.; Gnani, E.; Dobrzynska, J.; Vobecky, J. | 2022-01-01 | SOLID-STATE ELECTRONICS | - | 1.01 Articolo in rivista | SSE_Balestra_2022.pdf |
| TCAD Investigation of Power-to-Failure Evaluation for Ultrafast Events in BJT-based ESD Protection Cells | Zunarelli L.; Reggiani S.; Gnani E.; Sankaralingam R.; Dissegna M.; Boselli G. | 2022-01-01 | - | Institute of Electrical and Electronics Engineers Inc. | 4.01 Contributo in Atti di convegno | - |
| Thickness-dependent dielectric breakdown in thick amorphous SiO2 capacitors | Giuliano F.; Reggiani S.; Gnani E.; Gnudi A.; Rossetti M.; Depetro R. | 2022-01-01 | SOLID-STATE ELECTRONICS | - | 1.01 Articolo in rivista | Euro_SOI_SSE_4p (2).pdf |
| Constant-current time dependent dielectric breakdown in thick amorphous SiO2 capacitors | Giuliano F.; Reggiani S.; Gnani E.; Gnudi A.; Rossetti M.; Depetro R.; Croce G. | 2021-01-01 | - | Institute of Electrical and Electronics Engineers Inc. | 4.01 Contributo in Atti di convegno | - |
| Current Instabilities in Large-Area Silicon Diodes: An Accurate TCAD Approach | Luigi Balestra; Susanna Reggiani; Antonio Gnudi; Elena Gnani; Jan Vobeck{'{y}}; Umamaheswara Vemu...lapati | 2021-01-01 | - | - | 4.01 Contributo in Atti di convegno | - |
| Foreword Special Issue on 'New Simulation Methodologies for Next-Generation TCAD Tools' | Jungemann, C.; Bonani, F.; Cea, S. M.; Gnani, E.; Hong, S. -M.; Jin, S.; Liu, X.; Moroz, V.; Verh...ulst, A. | 2021-01-01 | IEEE TRANSACTIONS ON ELECTRON DEVICES | - | 1.01 Articolo in rivista | - |
| Influence of the DLC Passivation Conductivity on the Performance of Silicon High-Power Diodes over an Extended Temperature Range | Balestra L.; Reggiani S.; Gnudi A.; Gnani E.; Dobrzynska J.; Vobecky J. | 2021-01-01 | IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY | - | 1.01 Articolo in rivista | Influence_of_the_DLC_Passivation_Conductivity_on_the_Performance_of_Silicon_High-Power_Diodes_Over_an_Extended_Temperature_Range.pdf |
| Modeling nanoscale iii–v channel mosfets with the self-consistent multi-valley/multi-subband monte carlo approach | Caruso E.; Esseni D.; Gnani E.; Lizzit D.; Palestri P.; Pin A.; Puglisi F.M.; Selmi L.; Zagni N. | 2021-01-01 | ELECTRONICS | - | 1.01 Articolo in rivista | electronics-10-02472-v2.pdf |
| Novel TCAD Approach for the Investigation of Charge Transport in Thick Amorphous SiO2 Insulators | Giuliano F.; Reggiani S.; Gnani E.; Gnudi A.; Rossetti M.; Depetro R.; Croce G. | 2021-01-01 | IEEE TRANSACTIONS ON ELECTRON DEVICES | - | 1.01 Articolo in rivista | Teos_Oxide_Modeling_merged POST PRINT.pdf |
| On the Breakdown Voltage Temperature Dependence of High-Voltage Power Diode Passivated with Diamond-Like Carbon | Balestra, Luigi; Reggiani, Susanna; Gnudi, Antonio; Gnani, Elena; Dobrzynska, Jagoda; Vobecky, Jan | 2021-01-01 | - | - | 4.01 Contributo in Atti di convegno | - |