We review a few state of the art solutions and recent developments to model short channel III-V compound semiconductor n-MOSFETs based on full quantum transport, semiclassical multi-valley/multi-subband transport and TCAD models. The pros and cons of each, and the insights they can deliver, are illustrated with examples from recent technology developments and literature. Areas where improvements and implementations at TCAD level are most necessary are highlighted as well.

Selmi, L., Caruso, E., Carapezzi, S., Visciarelli, M., Gnani, E., Zagni, N., et al. (2017). Modelling nanoscale n-MOSFETs with III-V compound semiconductor channels: From advanced models for band structures, electrostatics and transport to TCAD. Institute of Electrical and Electronics Engineers Inc. [10.1109/IEDM.2017.8268384].

Modelling nanoscale n-MOSFETs with III-V compound semiconductor channels: From advanced models for band structures, electrostatics and transport to TCAD

Selmi, L.
;
Carapezzi, S.;Visciarelli, M.;Gnani, E.;Zagni, N.;Pavan, P.;Esseni, D.;Gnudi, A.;Reggiani, S.;
2017

Abstract

We review a few state of the art solutions and recent developments to model short channel III-V compound semiconductor n-MOSFETs based on full quantum transport, semiclassical multi-valley/multi-subband transport and TCAD models. The pros and cons of each, and the insights they can deliver, are illustrated with examples from recent technology developments and literature. Areas where improvements and implementations at TCAD level are most necessary are highlighted as well.
2017
Technical Digest - International Electron Devices Meeting, IEDM
13.4.1
13.4.4
Selmi, L., Caruso, E., Carapezzi, S., Visciarelli, M., Gnani, E., Zagni, N., et al. (2017). Modelling nanoscale n-MOSFETs with III-V compound semiconductor channels: From advanced models for band structures, electrostatics and transport to TCAD. Institute of Electrical and Electronics Engineers Inc. [10.1109/IEDM.2017.8268384].
Selmi, L.; Caruso, E.; Carapezzi, S.; Visciarelli, M.; Gnani, E.; Zagni, N.; Pavan, P.; Palestri, P.; Esseni, D.; Gnudi, A.; Reggiani, S.; Puglisi, F....espandi
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/669632
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