ROSSI, MARCO
 Distribuzione geografica
Continente #
NA - Nord America 582
EU - Europa 341
AS - Asia 336
SA - Sud America 29
AF - Africa 28
Totale 1.316
Nazione #
US - Stati Uniti d'America 576
CN - Cina 126
GB - Regno Unito 115
SG - Singapore 103
DE - Germania 44
UA - Ucraina 40
VN - Vietnam 40
IT - Italia 33
HK - Hong Kong 29
RU - Federazione Russa 29
SE - Svezia 29
IN - India 25
BR - Brasile 23
IE - Irlanda 18
FR - Francia 17
CI - Costa d'Avorio 10
ZA - Sudafrica 8
EE - Estonia 7
JP - Giappone 7
SC - Seychelles 5
AR - Argentina 4
CA - Canada 4
NL - Olanda 4
TG - Togo 4
CH - Svizzera 2
KR - Corea 2
MX - Messico 2
BD - Bangladesh 1
CL - Cile 1
CZ - Repubblica Ceca 1
ID - Indonesia 1
IQ - Iraq 1
LY - Libia 1
MY - Malesia 1
PL - Polonia 1
PY - Paraguay 1
SI - Slovenia 1
Totale 1.316
Città #
Southend 105
Fairfield 69
Santa Clara 63
Singapore 58
Ashburn 53
Wilmington 35
Seattle 34
Jacksonville 30
Hong Kong 29
Cambridge 28
Houston 27
Woodbridge 26
Hefei 23
Princeton 22
Chandler 20
Ann Arbor 18
Dublin 18
Beijing 16
Boardman 13
Dong Ket 11
Abidjan 10
Nanjing 10
Padova 10
Westminster 10
Berlin 7
Los Angeles 7
Saint Petersburg 7
Tokyo 7
Jinan 6
Buffalo 5
Hanoi 5
Hebei 5
Mahé 5
Mülheim 5
Nanchang 5
San Diego 5
Turin 5
Amsterdam 4
Dallas 4
Lomé 4
Medford 4
New York 4
Changsha 3
Hangzhou 3
Lanzhou 3
Milan 3
Pune 3
The Dalles 3
Washington 3
Zhengzhou 3
Bengaluru 2
Chennai 2
Dearborn 2
Duncan 2
Guangzhou 2
Haiphong 2
Hải Dương 2
Montreal 2
Ningbo 2
Norwalk 2
Redondo Beach 2
Registro 2
Salvador 2
Seoul 2
Shenyang 2
Taizhou 2
Tianjin 2
Verona 2
Yubileyny 2
Adelfia 1
Alagoinhas 1
Amparo 1
Atlanta 1
Baghdad 1
Belo Horizonte 1
Benghazi 1
Biên Hòa 1
Boa Esperança 1
Bologna 1
Brasília 1
Brooklyn 1
Calgary 1
Camaragibe 1
Campinas 1
Campos dos Goytacazes 1
Can Tho 1
Celje 1
Chicago 1
Chongqing 1
Ciampino 1
Cuiabá 1
Córdoba 1
Des Moines 1
Diamantino 1
Dongguan 1
Elk Grove Village 1
Estación Colina 1
Falls Church 1
Fano 1
Feira de Santana 1
Totale 925
Nome #
Defect influence on the electrcal properties of 4H-SiC Schottky Diodes 150
Characterization of polycrystalline 3CB-SiC thin films for MEMS and pressure sensors application 143
Mono and multi-crystalline Silicon characterization by Non-Contacting Techniques 142
Micro- and nano-structures in silicon studied by DLTS and scanning probe methods 138
Nanocrystalline Silicon Films as Multifunctional Material for Optoelectronic and Photovoltaic Applications 137
Minority Carrier Diffusion Lengths in Multi-crystalline Silicon Wafers and Solar Cells 115
Hydrogenated nanocrystalline silicon thin films studied by scanning force microscopy. 113
The electrical conductivity of hydrogenated nanocrystalline silicon investigated at the nanoscale 108
Charcaterization of electrical contacts on polycrystalline 3C-SiC thin films 106
Defect analysis of hydrogenated nanocrystalline Si thin films 98
Characterization of bulk and surface properties in semiconductors using non-contacting techniques 36
Surface photovoltage analysis of crystalline silicon for photovoltaic applications 24
Scanning Kelvin probe and surface photovoltage analysis of multicrystalline silicon 22
Totale 1.332
Categoria #
all - tutte 3.997
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 3.997


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/202193 0 0 0 0 0 8 3 18 8 8 9 39
2021/2022130 11 4 13 9 15 9 8 10 6 2 20 23
2022/2023157 14 19 15 12 6 6 2 16 25 7 19 16
2023/202461 3 11 11 2 5 17 2 1 0 5 1 3
2024/2025218 3 43 13 20 74 11 11 0 1 0 1 41
2025/2026206 21 45 54 30 38 18 0 0 0 0 0 0
Totale 1.332