ROSSI, MARCO
 Distribuzione geografica
Continente #
NA - Nord America 549
EU - Europa 328
AS - Asia 158
AF - Africa 20
Totale 1.055
Nazione #
US - Stati Uniti d'America 549
GB - Regno Unito 115
CN - Cina 72
DE - Germania 44
UA - Ucraina 39
SG - Singapore 38
IT - Italia 33
SE - Svezia 28
VN - Vietnam 25
IN - India 21
RU - Federazione Russa 20
IE - Irlanda 18
FR - Francia 17
EE - Estonia 7
ZA - Sudafrica 7
SC - Seychelles 5
CI - Costa d'Avorio 4
TG - Togo 4
NL - Olanda 3
CH - Svizzera 2
JP - Giappone 2
CZ - Repubblica Ceca 1
PL - Polonia 1
Totale 1.055
Città #
Southend 105
Fairfield 69
Santa Clara 62
Ashburn 51
Wilmington 35
Seattle 34
Singapore 34
Jacksonville 30
Cambridge 28
Houston 27
Woodbridge 26
Princeton 22
Chandler 20
Ann Arbor 18
Dublin 18
Boardman 13
Dong Ket 11
Nanjing 10
Padova 10
Westminster 10
Berlin 7
Saint Petersburg 7
Jinan 6
Hebei 5
Mahé 5
Mülheim 5
Nanchang 5
San Diego 5
Turin 5
Abidjan 4
Lomé 4
Medford 4
New York 4
Amsterdam 3
Changsha 3
Hangzhou 3
Lanzhou 3
Los Angeles 3
Milan 3
Pune 3
Washington 3
Zhengzhou 3
Beijing 2
Dearborn 2
Duncan 2
Guangzhou 2
Ningbo 2
Norwalk 2
Shenyang 2
Taizhou 2
Tianjin 2
Tokyo 2
Verona 2
Adelfia 1
Bologna 1
Chongqing 1
Ciampino 1
Des Moines 1
Dongguan 1
Falls Church 1
Fano 1
Genzano Di Roma 1
Harbin 1
Islington 1
Jiaxing 1
Lancut 1
Lausanne 1
Montclair 1
Olalla 1
Phoenix 1
Putian 1
Redwood City 1
Shanghai 1
Shenzhen 1
Suzhou 1
Wenzhou 1
Wuhan 1
Wuxi 1
Totale 773
Nome #
Mono and multi-crystalline Silicon characterization by Non-Contacting Techniques 120
Nanocrystalline Silicon Films as Multifunctional Material for Optoelectronic and Photovoltaic Applications 116
Micro- and nano-structures in silicon studied by DLTS and scanning probe methods 113
Defect influence on the electrcal properties of 4H-SiC Schottky Diodes 112
Characterization of polycrystalline 3CB-SiC thin films for MEMS and pressure sensors application 104
Minority Carrier Diffusion Lengths in Multi-crystalline Silicon Wafers and Solar Cells 97
Hydrogenated nanocrystalline silicon thin films studied by scanning force microscopy. 94
The electrical conductivity of hydrogenated nanocrystalline silicon investigated at the nanoscale 92
Charcaterization of electrical contacts on polycrystalline 3C-SiC thin films 88
Defect analysis of hydrogenated nanocrystalline Si thin films 85
Characterization of bulk and surface properties in semiconductors using non-contacting techniques 25
Surface photovoltage analysis of crystalline silicon for photovoltaic applications 13
Scanning Kelvin probe and surface photovoltage analysis of multicrystalline silicon 11
Totale 1.070
Categoria #
all - tutte 2.909
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 2.909


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/2020201 0 0 0 0 0 31 43 43 38 14 10 22
2020/2021158 32 14 4 15 0 8 3 18 8 8 9 39
2021/2022130 11 4 13 9 15 9 8 10 6 2 20 23
2022/2023157 14 19 15 12 6 6 2 16 25 7 19 16
2023/202461 3 11 11 2 5 17 2 1 0 5 1 3
2024/2025162 3 43 13 20 74 9 0 0 0 0 0 0
Totale 1.070