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ROSSI, MARCO

ROSSI, MARCO  

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Risultati 1 - 13 di 13 (tempo di esecuzione: 0.03 secondi).
Titolo Autore(i) Anno Periodico Editore Tipo File
The electrical conductivity of hydrogenated nanocrystalline silicon investigated at the nanoscale Cavalcoli, Daniela; F., Detto; Rossi, Marco; A., Tomasi; Cavallini, Anna 2010-01-01 NANOTECHNOLOGY - 1.01 Articolo in rivista -
Defect analysis of hydrogenated nanocrystalline Si thin films A. Cavallini; D. Cavalcoli; M. Rossi; A. Tomasi; S. Pizzini; D. Chrastina; G. Isella 2007-01-01 PHYSICA. B, CONDENSED MATTER - 1.01 Articolo in rivista -
Hydrogenated nanocrystalline silicon thin films studied by scanning force microscopy. D.Cavalcoli;M.Rossi; A. Tomasi; A.Cavallini;D.Chrastina;
G.Isella 		2007-01-01 DIFFUSION AND DEFECT DATA, SOLID STATE DATA. PART B, SOLID STATE PHENOMENA - 1.01 Articolo in rivista -
Micro- and nano-structures in silicon studied by DLTS and scanning probe methods D.Cavalcoli; A.Cavallini; M.Rossi; S.Pizzini 2006-01-01 SEMICONDUCTORS MAIK Nauka/Interperiodica 4.01 Contributo in Atti di convegno -
Nanocrystalline Silicon Films as Multifunctional Material for Optoelectronic and Photovoltaic Applications S.Pizzini; M.Acciarri; S.Binetti; D.Cavalcoli; A. Cavallini; L. Colombo; H. von Känel; K.Peter; B... espandi. Pichaud; G.Isella; D.Chrastina; A.LeDonne; M. Guzzi; A.Mattoni; M.Rossi; S.Sanguinetti; M. Texier 2006-01-01 MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY - 1.01 Articolo in rivista -
Charcaterization of electrical contacts on polycrystalline 3C-SiC thin films A.Castaldini; A.Cavallini; M.Rossi; M.Cocuzza; C.Ricciardi 2005-01-01 MATERIALS SCIENCE FORUM - 4.01 Contributo in Atti di convegno -
Characterization of polycrystalline 3CB-SiC thin films for MEMS and pressure sensors application A. Cavallini; M. Rossi; M. Cocuzza; C. Ricciardi; 2004-01-01 - IEEE 4.01 Contributo in Atti di convegno -
Defect influence on the electrcal properties of 4H-SiC Schottky Diodes S.Porro; S.Ferrero; F.Giorgis; C.F.Pirri; D.Perrone; U.Meotto; P.Mandracci; L.Scaltrito; G.Richie... espandiri; L.Merlin; A.Cavallini; A.Castaldini; M.Rossi 2004-01-01 - Trans Tech Publications Limited 2.01 Capitolo / saggio in libro -
Minority Carrier Diffusion Lengths in Multi-crystalline Silicon Wafers and Solar Cells D.Cavalcoli; A.Cavallini; M.Rossi; K.Peter 2004-01-01 DIFFUSION AND DEFECT DATA, SOLID STATE DATA. PART B, SOLID STATE PHENOMENA - 1.01 Articolo in rivista -
Mono and multi-crystalline Silicon characterization by Non-Contacting Techniques CAVALCOLI D.; A.CAVALLINI ; M. ROSSI 2004-01-01 JOURNAL OF THE ELECTROCHEMICAL SOCIETY - 1.01 Articolo in rivista -
Characterization of bulk and surface properties in semiconductors using non-contacting techniques Castaldini A.; Cavalcoli D.; Cavallini A.; Rossi M. 2003-01-01 - - 4.01 Contributo in Atti di convegno -
Scanning Kelvin probe and surface photovoltage analysis of multicrystalline silicon Castaldini, A.; Cavalcoli, D.; Cavallini, A.; Rossi, M. 2002-01-01 MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY - 1.01 Articolo in rivista -
Surface photovoltage analysis of crystalline silicon for photovoltaic applications Castaldini A.; Cavalcoli D.; Cavallini A.; Rossi M. 2002-01-01 SOLAR ENERGY MATERIALS AND SOLAR CELLS - 1.01 Articolo in rivista -