Sfoglia per Autore
Latch Susceptibility to Transient Faults and New Hardening Approach
2007 M. Omaña; D. Rossi; C. Metra
Novel Approach to Clock Fault Testing for High Performance Microprocessors
2007 C. Metra; M. Omaña; TM Mak; S. Tam
Function Inherent Code Checking: A New Low Cost On-Line Testing Approach for High Performance Microprocessor Control Logic
2008 C. Metra; D. Rossi; M. Omaña; A. Jas; R. Galivanche
Novel On-Chip Clock Jitter Measurement Scheme For High Performance Microprocessors
2008 C. Metra; M. Omaña; T.M. Mak; A. Rahman; S. Tam
Checker No-Harm Alarms and Design Approaches to Tolerate Them
2008 Daniele Rossi; Martin Omaña; Cecilia Metra
Concurrent Detection of Faults Affecting Energy Harvesting Circuits of Self-Powered Wearable Sensors
2009 M. Omaña; M. Marzencki; R. Specchia; C. Metra; B. Kaminska
Novel High Speed Robust Latch
2009 M. Omaña; D. Rossi; C. Metra
Accurate Linear Model for SET Critical Charge Estimation
2009 D. Rossi; J.M. Cazeaux; M. Omaña; C. Metra; A. Chatterjee
On-Die Ring Oscillator Based Measurement Scheme for Process Parameter Variations and Clock Jitter
2010 M. Omaña; D. Giaffreda; C. Metra; TM Mak; S. Tam; A. Rahman
Novel Low-Cost Aging Sensor
2010 M. Omaña; D. Rossi; N. Bosio; C. Metra
Self-Checking Monitor for NBTI Due Degradation
2010 M. Omaña; D. Rossi; N. Bosio; C. Metra
Transient Fault and Soft Error On-Die Monitoring Scheme
2010 D. Rossi; M. Omaña; C. Metra
High-Performance Robust Latches
2010 M. Omaña; D. Rossi; C. Metra
Low Cost and Low Intrusive Approach to Test On-Line the Scheduler of High Performance Microprocessors
2010 D. Rossi; M. Omaña; G. Berghella; C. Metra; A. Jas; T. Chandra; R. Galivanche
Impact of Aging Phenomena on Soft Error Susceptibility
2011 D. Rossi; M. Omaña; C. Metra; A. Paccagnella
Model for Thermal Behavior of Shaded Photovoltaic Cells Under Hot-Spot Condition
2011 D. Giaffreda; M. Omaña; D. Rossi; C. Metra
Low-Cost Dynamic Compensation Scheme for Local Clocks of Next Generation High Performance Microprocessors
2011 M. Omaña; C. Metra; T. M. Mak; S. Tam
Faults Affecting the Control Blocks of PV Arrays and Techniques for Their Concurrent Detection
2012 M. Omana; D. Rossi; G. Collepalumbo; C. Metra; F. Lombardi
Polynomial Based Key Distribution Scheme for WPAN
2012 Vimalathithan R.; D. Rossi; M. Omaña; C. Metra; M. L. Valarmathi
New Design For Testability Approach for Clock Fault Testing
2012 C. Metra; M. Omaña; TM Mak; S. Tam
Titolo | Autore(i) | Anno | Periodico | Editore | Tipo | File |
---|---|---|---|---|---|---|
Latch Susceptibility to Transient Faults and New Hardening Approach | M. Omaña; D. Rossi; C. Metra | 2007-01-01 | IEEE TRANSACTIONS ON COMPUTERS | - | 1.01 Articolo in rivista | - |
Novel Approach to Clock Fault Testing for High Performance Microprocessors | C. Metra; M. Omaña; TM Mak; S. Tam | 2007-01-01 | - | P. Prinetto, H. Wunderlich | 4.01 Contributo in Atti di convegno | - |
Function Inherent Code Checking: A New Low Cost On-Line Testing Approach for High Performance Microprocessor Control Logic | C. Metra; D. Rossi; M. Omaña; A. Jas; R. Galivanche | 2008-01-01 | - | P. Girard, Z. Peng | 4.01 Contributo in Atti di convegno | - |
Novel On-Chip Clock Jitter Measurement Scheme For High Performance Microprocessors | C. Metra; M. Omaña; T.M. Mak; A. Rahman; S. Tam | 2008-01-01 | - | D, Gizopoulos, M. Tehranipoor | 4.01 Contributo in Atti di convegno | - |
Checker No-Harm Alarms and Design Approaches to Tolerate Them | Daniele Rossi; Martin Omaña; Cecilia Metra | 2008-01-01 | JOURNAL OF ELECTRONIC TESTING | - | 1.01 Articolo in rivista | - |
Concurrent Detection of Faults Affecting Energy Harvesting Circuits of Self-Powered Wearable Sensors | M. Omaña; M. Marzencki; R. Specchia; C. Metra; B. Kaminska | 2009-01-01 | - | D. Gizopoulos, M. Tehranipoor, S. Tragoudas | 4.01 Contributo in Atti di convegno | - |
Novel High Speed Robust Latch | M. Omaña; D. Rossi; C. Metra | 2009-01-01 | - | D. Gizopoulos, M. Tehranipoor, S. Tragoudas | 4.01 Contributo in Atti di convegno | - |
Accurate Linear Model for SET Critical Charge Estimation | D. Rossi; J.M. Cazeaux; M. Omaña; C. Metra; A. Chatterjee | 2009-01-01 | IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS | - | 1.01 Articolo in rivista | - |
On-Die Ring Oscillator Based Measurement Scheme for Process Parameter Variations and Clock Jitter | M. Omaña; D. Giaffreda; C. Metra; TM Mak; S. Tam; A. Rahman | 2010-01-01 | - | G. Chapman, F. Salice, H. Ito, S. Tragoudas | 4.01 Contributo in Atti di convegno | - |
Novel Low-Cost Aging Sensor | M. Omaña; D. Rossi; N. Bosio; C. Metra | 2010-01-01 | - | N.M. Amato, H. Franke, P.H.J. Kelly | 4.01 Contributo in Atti di convegno | - |
Self-Checking Monitor for NBTI Due Degradation | M. Omaña; D. Rossi; N. Bosio; C. Metra | 2010-01-01 | - | F. Azais, K. Chakrabarty | 4.01 Contributo in Atti di convegno | - |
Transient Fault and Soft Error On-Die Monitoring Scheme | D. Rossi; M. Omaña; C. Metra | 2010-01-01 | - | G. Chapman, F. Salice, H. Ito, S. Tragoudas | 4.01 Contributo in Atti di convegno | - |
High-Performance Robust Latches | M. Omaña; D. Rossi; C. Metra | 2010-01-01 | IEEE TRANSACTIONS ON COMPUTERS | - | 1.01 Articolo in rivista | - |
Low Cost and Low Intrusive Approach to Test On-Line the Scheduler of High Performance Microprocessors | D. Rossi; M. Omaña; G. Berghella; C. Metra; A. Jas; T. Chandra; R. Galivanche | 2010-01-01 | - | N.M. Amato, H. Franke, P.H.J. Kelly | 4.01 Contributo in Atti di convegno | - |
Impact of Aging Phenomena on Soft Error Susceptibility | D. Rossi; M. Omaña; C. Metra; A. Paccagnella | 2011-01-01 | - | P. Joshi, M. Violante, G. Chapman, F. Salice | 4.01 Contributo in Atti di convegno | - |
Model for Thermal Behavior of Shaded Photovoltaic Cells Under Hot-Spot Condition | D. Giaffreda; M. Omaña; D. Rossi; C. Metra | 2011-01-01 | - | P. Joshi, M. Violante, G. Chapman, F. Salice | 4.01 Contributo in Atti di convegno | - |
Low-Cost Dynamic Compensation Scheme for Local Clocks of Next Generation High Performance Microprocessors | M. Omaña; C. Metra; T. M. Mak; S. Tam | 2011-01-01 | IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS | - | 1.01 Articolo in rivista | - |
Faults Affecting the Control Blocks of PV Arrays and Techniques for Their Concurrent Detection | M. Omana; D. Rossi; G. Collepalumbo; C. Metra; F. Lombardi | 2012-01-01 | - | IEEE Computer Society | 4.01 Contributo in Atti di convegno | - |
Polynomial Based Key Distribution Scheme for WPAN | Vimalathithan R.; D. Rossi; M. Omaña; C. Metra; M. L. Valarmathi | 2012-01-01 | - | s.n | 4.01 Contributo in Atti di convegno | - |
New Design For Testability Approach for Clock Fault Testing | C. Metra; M. Omaña; TM Mak; S. Tam | 2012-01-01 | IEEE TRANSACTIONS ON COMPUTERS | - | 1.01 Articolo in rivista | - |
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