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Mostrati risultati da 21 a 40 di 71
Titolo Autore(i) Anno Periodico Editore Tipo File
Latch Susceptibility to Transient Faults and New Hardening Approach M. Omaña; D. Rossi; C. Metra 2007-01-01 IEEE TRANSACTIONS ON COMPUTERS - 1.01 Articolo in rivista -
Novel Approach to Clock Fault Testing for High Performance Microprocessors C. Metra; M. Omaña; TM Mak; S. Tam 2007-01-01 - P. Prinetto, H. Wunderlich 4.01 Contributo in Atti di convegno -
Function Inherent Code Checking: A New Low Cost On-Line Testing Approach for High Performance Microprocessor Control Logic C. Metra; D. Rossi; M. Omaña; A. Jas; R. Galivanche 2008-01-01 - P. Girard, Z. Peng 4.01 Contributo in Atti di convegno -
Novel On-Chip Clock Jitter Measurement Scheme For High Performance Microprocessors C. Metra; M. Omaña; T.M. Mak; A. Rahman; S. Tam 2008-01-01 - D, Gizopoulos, M. Tehranipoor 4.01 Contributo in Atti di convegno -
Checker No-Harm Alarms and Design Approaches to Tolerate Them Daniele Rossi; Martin Omaña; Cecilia Metra 2008-01-01 JOURNAL OF ELECTRONIC TESTING - 1.01 Articolo in rivista -
Concurrent Detection of Faults Affecting Energy Harvesting Circuits of Self-Powered Wearable Sensors M. Omaña; M. Marzencki; R. Specchia; C. Metra; B. Kaminska 2009-01-01 - D. Gizopoulos, M. Tehranipoor, S. Tragoudas 4.01 Contributo in Atti di convegno -
Novel High Speed Robust Latch M. Omaña; D. Rossi; C. Metra 2009-01-01 - D. Gizopoulos, M. Tehranipoor, S. Tragoudas 4.01 Contributo in Atti di convegno -
Accurate Linear Model for SET Critical Charge Estimation D. Rossi; J.M. Cazeaux; M. Omaña; C. Metra; A. Chatterjee 2009-01-01 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS - 1.01 Articolo in rivista -
On-Die Ring Oscillator Based Measurement Scheme for Process Parameter Variations and Clock Jitter M. Omaña; D. Giaffreda; C. Metra; TM Mak; S. Tam; A. Rahman 2010-01-01 - G. Chapman, F. Salice, H. Ito, S. Tragoudas 4.01 Contributo in Atti di convegno -
Novel Low-Cost Aging Sensor M. Omaña; D. Rossi; N. Bosio; C. Metra 2010-01-01 - N.M. Amato, H. Franke, P.H.J. Kelly 4.01 Contributo in Atti di convegno -
Self-Checking Monitor for NBTI Due Degradation M. Omaña; D. Rossi; N. Bosio; C. Metra 2010-01-01 - F. Azais, K. Chakrabarty 4.01 Contributo in Atti di convegno -
Transient Fault and Soft Error On-Die Monitoring Scheme D. Rossi; M. Omaña; C. Metra 2010-01-01 - G. Chapman, F. Salice, H. Ito, S. Tragoudas 4.01 Contributo in Atti di convegno -
High-Performance Robust Latches M. Omaña; D. Rossi; C. Metra 2010-01-01 IEEE TRANSACTIONS ON COMPUTERS - 1.01 Articolo in rivista -
Low Cost and Low Intrusive Approach to Test On-Line the Scheduler of High Performance Microprocessors D. Rossi; M. Omaña; G. Berghella; C. Metra; A. Jas; T. Chandra; R. Galivanche 2010-01-01 - N.M. Amato, H. Franke, P.H.J. Kelly 4.01 Contributo in Atti di convegno -
Impact of Aging Phenomena on Soft Error Susceptibility D. Rossi; M. Omaña; C. Metra; A. Paccagnella 2011-01-01 - P. Joshi, M. Violante, G. Chapman, F. Salice 4.01 Contributo in Atti di convegno -
Model for Thermal Behavior of Shaded Photovoltaic Cells Under Hot-Spot Condition D. Giaffreda; M. Omaña; D. Rossi; C. Metra 2011-01-01 - P. Joshi, M. Violante, G. Chapman, F. Salice 4.01 Contributo in Atti di convegno -
Low-Cost Dynamic Compensation Scheme for Local Clocks of Next Generation High Performance Microprocessors M. Omaña; C. Metra; T. M. Mak; S. Tam 2011-01-01 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS - 1.01 Articolo in rivista -
Faults Affecting the Control Blocks of PV Arrays and Techniques for Their Concurrent Detection M. Omana; D. Rossi; G. Collepalumbo; C. Metra; F. Lombardi 2012-01-01 - IEEE Computer Society 4.01 Contributo in Atti di convegno -
Polynomial Based Key Distribution Scheme for WPAN Vimalathithan R.; D. Rossi; M. Omaña; C. Metra; M. L. Valarmathi 2012-01-01 - s.n 4.01 Contributo in Atti di convegno -
New Design For Testability Approach for Clock Fault Testing C. Metra; M. Omaña; TM Mak; S. Tam 2012-01-01 IEEE TRANSACTIONS ON COMPUTERS - 1.01 Articolo in rivista -
Mostrati risultati da 21 a 40 di 71
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