A simulation study of the graphene base heterojunction transistor (GBHT) is presented based on a novel realistic graphene-Si interface model, calibrated on the experimental graphene-Si Schottky diodes, whose current-voltageerature characteristics are well reproduced. The GBHT simulations predict f<inf>T</inf> in the tens-of-gigahertz range and confirm the need for an improved quality of the graphene interface for the terahertz operation to be reached.

Di Lecce, V., Gnudi, A., Gnani, E., Reggiani, S., Baccarani, G. (2015). Simulations of Graphene Base Transistors with Improved Graphene Interface Model. IEEE ELECTRON DEVICE LETTERS, 36(9), 969-971 [10.1109/LED.2015.2452214].

Simulations of Graphene Base Transistors with Improved Graphene Interface Model

DI LECCE, VALERIO;GNUDI, ANTONIO;GNANI, ELENA;REGGIANI, SUSANNA;BACCARANI, GIORGIO
2015

Abstract

A simulation study of the graphene base heterojunction transistor (GBHT) is presented based on a novel realistic graphene-Si interface model, calibrated on the experimental graphene-Si Schottky diodes, whose current-voltageerature characteristics are well reproduced. The GBHT simulations predict fT in the tens-of-gigahertz range and confirm the need for an improved quality of the graphene interface for the terahertz operation to be reached.
2015
Di Lecce, V., Gnudi, A., Gnani, E., Reggiani, S., Baccarani, G. (2015). Simulations of Graphene Base Transistors with Improved Graphene Interface Model. IEEE ELECTRON DEVICE LETTERS, 36(9), 969-971 [10.1109/LED.2015.2452214].
Di Lecce, Valerio; Gnudi, Antonio; Gnani, Elena; Reggiani, Susanna; Baccarani, Giorgio
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/521265
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