A novel approach to optimize tunnel field effect transistors (TFETs) by technology computer aided design simulations is reported. The most interesting outcome of our design effort is a dual metal gate (DMG) TFET, which features an inverse subthreshold slope (SS) significantly < 60 mV/decade over more than five orders of magnitude of drain current, with a minimum value of 6 mV/decade sustained across one drain current decade or more. The DMGTFET simultaneously fulfills both the low-stand-by-power off-state current and the high-performance on-state current at a supply voltage of 0.5 V. Therefore, 25% reduction of static power consumption is expected compared with the 2020 International Technology Roadmap for Semiconductors requirements for multigate transistors.

Dual-Metal-Gate InAs Tunnel FET With Enhanced Turn-On Steepness and High On-Current / Giovanni Betti Beneventi; Elena Gnani; Antonio Gnudi; Susanna Reggiani; Giorgio Baccarani. - In: IEEE TRANSACTIONS ON ELECTRON DEVICES. - ISSN 0018-9383. - STAMPA. - 61:(2014), pp. 776-784. [10.1109/TED.2014.2298212]

Dual-Metal-Gate InAs Tunnel FET With Enhanced Turn-On Steepness and High On-Current

BETTI BENEVENTI, GIOVANNI;GNANI, ELENA;GNUDI, ANTONIO;REGGIANI, SUSANNA;BACCARANI, GIORGIO
2014

Abstract

A novel approach to optimize tunnel field effect transistors (TFETs) by technology computer aided design simulations is reported. The most interesting outcome of our design effort is a dual metal gate (DMG) TFET, which features an inverse subthreshold slope (SS) significantly < 60 mV/decade over more than five orders of magnitude of drain current, with a minimum value of 6 mV/decade sustained across one drain current decade or more. The DMGTFET simultaneously fulfills both the low-stand-by-power off-state current and the high-performance on-state current at a supply voltage of 0.5 V. Therefore, 25% reduction of static power consumption is expected compared with the 2020 International Technology Roadmap for Semiconductors requirements for multigate transistors.
2014
Dual-Metal-Gate InAs Tunnel FET With Enhanced Turn-On Steepness and High On-Current / Giovanni Betti Beneventi; Elena Gnani; Antonio Gnudi; Susanna Reggiani; Giorgio Baccarani. - In: IEEE TRANSACTIONS ON ELECTRON DEVICES. - ISSN 0018-9383. - STAMPA. - 61:(2014), pp. 776-784. [10.1109/TED.2014.2298212]
Giovanni Betti Beneventi; Elena Gnani; Antonio Gnudi; Susanna Reggiani; Giorgio Baccarani
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/463585
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