In this work full-quantum simulations have been employed to devise and optimize both impurity-doped (ID) and electrostatically-doped (ED) superlattice FETs (SL-FETs). A sensitivity investigation to technological and design parameters has been carried out, showing a relatively-low sensitivity to changes of most device parameters. Results at a reduced power supply VDD=0.4V are compared with the ITRS specs projected to year 2022. Benchmarking highlights the potential of the proposed ED InGaAs/InAlAs SL-FET to perform up to 1.2× faster than HP specs with 5× lower energy-delay product. This device is thus expected to be a good candidate for the post-CMOS era.

Design and optimization of impurity- and electrostatically-doped superlattice FETs to meet all the ITRS power targets at VDD=0.4V / Pasquale, Maiorano; Elena, Gnani; Antonio, Gnudi; Susanna, Reggiani; Giorgio, Baccarani. - In: SOLID-STATE ELECTRONICS. - ISSN 0038-1101. - STAMPA. - 101:(2014), pp. 70-78. [10.1016/j.sse.2014.06.020]

Design and optimization of impurity- and electrostatically-doped superlattice FETs to meet all the ITRS power targets at VDD=0.4V

MAIORANO, PASQUALE;GNANI, ELENA;GNUDI, ANTONIO;REGGIANI, SUSANNA;BACCARANI, GIORGIO
2014

Abstract

In this work full-quantum simulations have been employed to devise and optimize both impurity-doped (ID) and electrostatically-doped (ED) superlattice FETs (SL-FETs). A sensitivity investigation to technological and design parameters has been carried out, showing a relatively-low sensitivity to changes of most device parameters. Results at a reduced power supply VDD=0.4V are compared with the ITRS specs projected to year 2022. Benchmarking highlights the potential of the proposed ED InGaAs/InAlAs SL-FET to perform up to 1.2× faster than HP specs with 5× lower energy-delay product. This device is thus expected to be a good candidate for the post-CMOS era.
2014
Design and optimization of impurity- and electrostatically-doped superlattice FETs to meet all the ITRS power targets at VDD=0.4V / Pasquale, Maiorano; Elena, Gnani; Antonio, Gnudi; Susanna, Reggiani; Giorgio, Baccarani. - In: SOLID-STATE ELECTRONICS. - ISSN 0038-1101. - STAMPA. - 101:(2014), pp. 70-78. [10.1016/j.sse.2014.06.020]
Pasquale, Maiorano; Elena, Gnani; Antonio, Gnudi; Susanna, Reggiani; Giorgio, Baccarani
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/463583
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