Effect of transverse quantization on the broken vs. staggered band lineup of InAs/Al(x)Ga(1-x)Sb TFETs is investigated, showing that cross-sections up to 10nm lead to staggered configurations for any value of the Al mole fraction x. Device performance is optimized as a function of cross-sectional size, Al content and possible source/channel underlap, while ensuring low standby power (LSTP) or low operating power (LOP) compatible off-current levels. Guidelines are provided and an “optimal” design is proposed which provides a minimum sub-threshold slope (SS) of 7.2 mV/dec along with a maximum on-state current (Ion) of 175μA/μm.

Optimization of staggered heterojunction p-TFETs for LSTP and LOP applications / Baravelli, Emanuele; Gnani, Elena; Grassi, Roberto; Gnudi, Antonio; Baccarani, Giorgio. - STAMPA. - (2013), pp. 67-68. (Intervento presentato al convegno Device Research Conference tenutosi a Notre Dame, IN; United States nel 23-26 June 2013) [10.1109/DRC.2013.6633796].

Optimization of staggered heterojunction p-TFETs for LSTP and LOP applications

BARAVELLI, EMANUELE;GNANI, ELENA;GRASSI, ROBERTO;GNUDI, ANTONIO;BACCARANI, GIORGIO
2013

Abstract

Effect of transverse quantization on the broken vs. staggered band lineup of InAs/Al(x)Ga(1-x)Sb TFETs is investigated, showing that cross-sections up to 10nm lead to staggered configurations for any value of the Al mole fraction x. Device performance is optimized as a function of cross-sectional size, Al content and possible source/channel underlap, while ensuring low standby power (LSTP) or low operating power (LOP) compatible off-current levels. Guidelines are provided and an “optimal” design is proposed which provides a minimum sub-threshold slope (SS) of 7.2 mV/dec along with a maximum on-state current (Ion) of 175μA/μm.
2013
71st Device Research Conference
67
68
Optimization of staggered heterojunction p-TFETs for LSTP and LOP applications / Baravelli, Emanuele; Gnani, Elena; Grassi, Roberto; Gnudi, Antonio; Baccarani, Giorgio. - STAMPA. - (2013), pp. 67-68. (Intervento presentato al convegno Device Research Conference tenutosi a Notre Dame, IN; United States nel 23-26 June 2013) [10.1109/DRC.2013.6633796].
Baravelli, Emanuele; Gnani, Elena; Grassi, Roberto; Gnudi, Antonio; Baccarani, Giorgio
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/351916
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