ZANOLLA, NICOLA
 Distribuzione geografica
Continente #
NA - Nord America 502
EU - Europa 171
AS - Asia 145
SA - Sud America 14
AF - Africa 8
Totale 840
Nazione #
US - Stati Uniti d'America 499
CN - Cina 63
GB - Regno Unito 58
SG - Singapore 46
DE - Germania 27
RU - Federazione Russa 15
IE - Irlanda 14
IT - Italia 14
SE - Svezia 14
IN - India 13
UA - Ucraina 13
VN - Vietnam 10
BR - Brasile 9
FR - Francia 8
HK - Hong Kong 8
EE - Estonia 6
ZA - Sudafrica 5
AR - Argentina 3
MX - Messico 3
CI - Costa d'Avorio 2
JP - Giappone 2
EC - Ecuador 1
FI - Finlandia 1
ID - Indonesia 1
KZ - Kazakistan 1
SC - Seychelles 1
SK - Slovacchia (Repubblica Slovacca) 1
TR - Turchia 1
VE - Venezuela 1
Totale 840
Città #
Ann Arbor 205
Southend 51
Fairfield 45
Singapore 27
Wilmington 24
Ashburn 21
Houston 20
Santa Clara 20
Chandler 18
Seattle 15
Woodbridge 15
Dublin 14
Cambridge 12
Nanjing 12
Princeton 12
Beijing 11
Boardman 9
Hong Kong 8
Jacksonville 6
Padova 6
Westminster 6
Großheubach 4
Ho Chi Minh City 4
Medford 4
Saint Petersburg 4
Shenyang 4
Berlin 3
Buffalo 3
Changsha 3
Hanoi 3
Hebei 3
Los Angeles 3
Milan 3
New York 3
Redondo Beach 3
Tianjin 3
Yubileyny 3
Abidjan 2
Bühl 2
Dearborn 2
Des Moines 2
Haikou 2
Hangzhou 2
Jinan 2
Nanchang 2
Tokyo 2
Verona 2
Viamão 2
Aktau 1
Augusta 1
Bandung 1
Buenos Aires 1
Cachoeiro de Itapemirim 1
Campo Novo do Parecis 1
Chicago 1
Cárdenas 1
Dallas 1
Falls Church 1
Feira de Santana 1
General Escobedo 1
Guayaquil 1
Helsinki 1
Jiaxing 1
Joinville 1
Kiev 1
Kilburn 1
Kunming 1
Langfang 1
London 1
Mahé 1
Manchester 1
Mérida 1
Mülheim 1
Ningbo 1
Puerto Madryn 1
Quận Bảy 1
Recife 1
Reggio Emilia 1
Rio de Janeiro 1
Shar'ya 1
Shenzhen 1
Silao 1
São José do Rio Pardo 1
Taiyuan 1
Thành Phố Bà Rịa 1
Tres Lomas 1
Ulan-ude 1
Việt Trì 1
Washington 1
Totale 673
Nome #
Noise Reduction in CMOS Circuits Through Switched Gate and Forward Substrate Bias 166
Reduction of RTS Noise in Small-Area MOSFETs Under Switched Bias Conditions and Forward Substrate Bias 143
Suppression of Random Telegraph Signal Noise in small-area MOSFETs under switched gate and substrate bias conditions 142
The impact of substrate bias on RTS and flicker noise in MOSFETs operating under switched gate bias 133
Measurement and simulation of gate voltage dependence of RTS emission and capture time constants in MOSFETs 132
Reduction of Low-Frequency Noise in MOSFETs Under Switched Gate and Substrate Bias 129
Totale 845
Categoria #
all - tutte 2.337
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 2.337


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/202139 0 0 0 0 0 7 0 5 7 5 7 8
2021/2022283 5 2 36 38 43 29 31 29 35 8 11 16
2022/202383 7 6 2 12 8 8 1 3 20 2 6 8
2023/202426 3 6 3 3 2 4 1 0 1 3 0 0
2024/202570 1 12 7 5 26 5 5 0 0 0 0 9
2025/202688 1 10 16 11 35 15 0 0 0 0 0 0
Totale 845