ZANOLLA, NICOLA
ZANOLLA, NICOLA
DIP. DI ELETTRONICA,INFORMATICA,SISTEMISTICA-DEIS
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Reduction of RTS Noise in Small-Area MOSFETs Under Switched Bias Conditions and Forward Substrate Bias
2010 N. Zanolla; D . Šiprak; M. Tiebout; P. Baumgartner; E. Sangiorgi; C. Fiegna
Noise Reduction in CMOS Circuits Through Switched Gate and Forward Substrate Bias
2009 D. Siprak; .M. Tiebout; N. Zanolla; P. Baumgartner; C. Fiegna
Suppression of Random Telegraph Signal Noise in small-area MOSFETs under switched gate and substrate bias conditions
2009 N. Zanolla; D. Siprak; M. Tiebout; P. Baumgartner; E. Sangiorgi; C. Fiegna
Measurement and simulation of gate voltage dependence of RTS emission and capture time constants in MOSFETs
2008 N. Zanolla; D. Siprak; P. Baumgartner; E. Sangiorgi; C. Fiegna
Reduction of Low-Frequency Noise in MOSFETs Under Switched Gate and Substrate Bias
2008 D.j Siprak; N. Zanolla; M. Tiebout; P. Baumgartner; C. Fiegna
The impact of substrate bias on RTS and flicker noise in MOSFETs operating under switched gate bias
2008 N. Zanolla; D. Siprak; M. Tiebout; P. Baumgartner; E. Sangiorgi; C. Fiegna.
| Titolo | Autore(i) | Anno | Periodico | Editore | Tipo | File |
|---|---|---|---|---|---|---|
| Reduction of RTS Noise in Small-Area MOSFETs Under Switched Bias Conditions and Forward Substrate Bias | N. Zanolla; D . Šiprak; M. Tiebout; P. Baumgartner; E. Sangiorgi; C. Fiegna | 2010-01-01 | IEEE TRANSACTIONS ON ELECTRON DEVICES | - | 1.01 Articolo in rivista | - |
| Noise Reduction in CMOS Circuits Through Switched Gate and Forward Substrate Bias | D. Siprak; .M. Tiebout; N. Zanolla; P. Baumgartner; C. Fiegna | 2009-01-01 | IEEE JOURNAL OF SOLID-STATE CIRCUITS | - | 1.01 Articolo in rivista | - |
| Suppression of Random Telegraph Signal Noise in small-area MOSFETs under switched gate and substrate bias conditions | N. Zanolla; D. Siprak; M. Tiebout; P. Baumgartner; E. Sangiorgi; C. Fiegna | 2009-01-01 | - | American Institute of Physics | 4.01 Contributo in Atti di convegno | - |
| Measurement and simulation of gate voltage dependence of RTS emission and capture time constants in MOSFETs | N. Zanolla; D. Siprak; P. Baumgartner; E. Sangiorgi; C. Fiegna | 2008-01-01 | - | IEEE | 4.01 Contributo in Atti di convegno | - |
| Reduction of Low-Frequency Noise in MOSFETs Under Switched Gate and Substrate Bias | D.j Siprak; N. Zanolla; M. Tiebout; P. Baumgartner; C. Fiegna | 2008-01-01 | - | s.n | 4.01 Contributo in Atti di convegno | - |
| The impact of substrate bias on RTS and flicker noise in MOSFETs operating under switched gate bias | N. Zanolla; D. Siprak; M. Tiebout; P. Baumgartner; E. Sangiorgi; C. Fiegna. | 2008-01-01 | - | IEEE | 4.01 Contributo in Atti di convegno | - |