FAZZINI, PIER FRANCESCO
 Distribuzione geografica
Continente #
NA - Nord America 414
EU - Europa 406
AS - Asia 95
AF - Africa 16
OC - Oceania 1
SA - Sud America 1
Totale 933
Nazione #
US - Stati Uniti d'America 412
GB - Regno Unito 142
SE - Svezia 65
UA - Ucraina 62
DE - Germania 54
CN - Cina 44
IT - Italia 27
IN - India 26
IE - Irlanda 20
FR - Francia 16
RU - Federazione Russa 13
JO - Giordania 11
ZA - Sudafrica 8
JP - Giappone 6
SC - Seychelles 5
EE - Estonia 3
NL - Olanda 3
TR - Turchia 3
CI - Costa d'Avorio 2
LB - Libano 2
SG - Singapore 2
AU - Australia 1
AZ - Azerbaigian 1
CA - Canada 1
CL - Cile 1
CR - Costa Rica 1
EG - Egitto 1
RO - Romania 1
Totale 933
Città #
Southend 123
Fairfield 58
Jacksonville 48
Chandler 47
Wilmington 32
Woodbridge 29
Ashburn 28
Cambridge 27
Seattle 25
Princeton 22
Dublin 20
Houston 18
Amman 11
Berlin 11
Padova 11
Westminster 11
Ann Arbor 9
Shenyang 8
Mülheim 7
Nanjing 7
Medford 6
Tokyo 6
Beijing 5
Mahé 5
Saint Petersburg 5
Hebei 4
San Diego 4
Taizhou 4
Changsha 3
Milan 3
Olalla 3
Verona 3
Abidjan 2
Groningen 2
Jinan 2
Kunming 2
Mountain View 2
Nanchang 2
Norwalk 2
Zhengzhou 2
Baku 1
Baotou 1
Cairo 1
Changchun 1
Falls Church 1
Frankfurt Am Main 1
Genzano Di Roma 1
Guangzhou 1
London 1
Olinda 1
Prescot 1
San Francisco 1
San José 1
Singapore 1
Tianjin 1
Toronto 1
Wuhan 1
Totale 636
Nome #
Electron optical phase-shifts by Fourier methods: analytical versus numerical calculations 112
Electron microscope calibration for the Lorentz mode 105
Phase shift of Reverse Biased p-n Junction Arrays by Fourier Methods 94
Electrical and holographic characterization of gold catalyzed titania-based layers 91
Interference electron microscopy of reverse-biased p-n junctions 85
Interference electron microscopy of one-dimensional electron-optical phase objects. 84
Effects of beam-specimen interaction on the observation of reverse-biased junction 83
Electron holography of size-controlled metal nanoclusters 75
Influence of the dopant profile on the phase contrast images of reverse biased p-n junctions 73
Towards three-dimensional field models for reverse biased p-n junctions. 73
Electron Shadow edge microscopy of reverse-biased p-n junctions 69
Totale 944
Categoria #
all - tutte 2.258
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 2.258


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/2020304 66 2 8 20 22 30 32 47 32 19 10 16
2020/2021133 34 14 14 10 0 8 3 13 4 10 12 11
2021/2022165 12 4 15 12 21 21 4 12 4 3 20 37
2022/2023207 31 43 13 13 13 15 10 6 45 3 11 4
2023/202422 5 10 0 2 3 1 0 0 0 1 0 0
2024/20252 2 0 0 0 0 0 0 0 0 0 0 0
Totale 944