The calibration of a modern electron microscope for Lorentz microscopy observations has been performed using diffractogram, Fresnel diffraction fringe analysis and low-angle electron diffraction methods. An example related to the observations of electrostatic fields associated to a thinned reverse-biased p–n junction is also reported.
P. F. Fazzini, P. G. Merli, G. Pozzi (2004). Electron microscope calibration for the Lorentz mode. ULTRAMICROSCOPY, 99, 201-209 [10.1016/j.ultramic.2004.01.002].
Electron microscope calibration for the Lorentz mode
FAZZINI, PIER FRANCESCO;POZZI, GIULIO
2004
Abstract
The calibration of a modern electron microscope for Lorentz microscopy observations has been performed using diffractogram, Fresnel diffraction fringe analysis and low-angle electron diffraction methods. An example related to the observations of electrostatic fields associated to a thinned reverse-biased p–n junction is also reported.File in questo prodotto:
Eventuali allegati, non sono esposti
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
