POZZI, GIULIO
POZZI, GIULIO
A 4096-pixel MAPS detector used to investigate the single-electron distribution in a Young–Feynman two-slit interference experiment
2013 A. Gabrielli;F.M. Giorgi;N. Semprini;M. Villa;A. Zoccoli;G. Matteucci;G. Pozzi;S. Frabboni;G.C. Gazzadi
Build-up of interference patterns with single electrons
2013 G. Matteucci;M. Pezzi;G. Pozzi;G. L. Alberghi;F. Giorgi;A. Gabrielli;N. S. Cesari;M. Villa;A. Zoccoli;S. Frabboni;G. C. Gazzadi
The Young-Feynman two-slits experiment with single electrons: Build-up of the interference pattern and arrival-time distribution using a fast-readout pixel detector
2012 Frabboni S.; Gabrielli A.; Carlo Gazzadi G.; Giorgi F.; Matteucci G.; Pozzi G.; Semprini Cesari N.; Villa M.; Zoccoli A.
APPLICATION OF A HEPE-ORIENTED 4096-MAPS TO TIME ANALYSIS OF SINGLE ELECTRON DISTRIBUTION IN A TWO-SLITS INTERFERENCE EXPERIMENT
2011 A. Gabrielli; F. Giorni; N. Semprini Cesari; M. Villa; A. Zoccoli; G. Matteucci; G. Pozzi; S. Frabboni; G.C. Gazzadi
Esperienza di interferenza di singolo elettrone con doppia fenditura e sensore ad alta risoluzione temporale.
2010 Balbi G.; Berti R.; Costa A.; Frabboni S.; Gabrielli A.; Gazzadi G.C.; Giorgi F.; Matteucci G.; Patuelli S.; Pozzi G.; Semprini N.; Villa M.; Zoccoli A.
Four slits interference and diffraction experiments
2010 Frabboni S.; Frigeri C.; Gazzadi G.C.; Pozzi G.
Image simulations of kinked vortices for transmission electron microscopy
2010 Beleggia M.; Pozzi G.; Tonomura A.
Interpretation of electron beam induced charging of oxide layers in a transistor studied using electron holography
2010 Ubaldi F.; Pozzi G.; Kasama T.; McCartney M.R.; Newcomb S.B.; Dunin-Borkowski R.E.
Ion and electron beam nanofabrication of the which-way double-slit experiment in a transmission electron microscope
2010 Frabboni S.; Gazzadi G.C.; Pozzi G.
Measurement of the Charge Distribution Along an Electrically Biased Carbon Nanotube using Electron Holography
2010 M. Beleggia; T. Kasama; R. E. Dunin-Borkowski; G. Pozzi
Phase shift of charged metallic nanoparticles
2010 Beleggia M.; Pozzi G.
Interpretation of electron holographic phase images and defocused bright-field images of nanocarbon field emitters
2009 Filippo Ubaldi; Takeshi Kasama; Giulio Pozzi; Rafal Dunin-Borkowski
Multiple beam interference and diffraction with FIB fabricated nano-slits
2009 Stefano Frabboni; Cesare Frigeri; Gian Carlo Gazzadi; Giulio Pozzi
Quantitative 3D characterization of semiconductor nanostructures using electron-holographic tomography
2009 Daniel Wolf; Axel Lubk; Andreas Lenk; Hannes Lichte; Giulio Pozzi; Paola Prete; Nico Lovergine
A bridge between two important problems in optics and electrostatics.
2008 R.Capelli; G.Pozzi
Characterization of JEOL 2100 Lorentz-TEM for low-magnification electron holography and magnetic imaging.
2008 M.A. Schofield; M. Beleggia; Y. Zhu; G. Pozzi
Comment on “Electron holography on dynamic motion of secondary electrons around sciatic nerve tisues”.
2008 M. Beleggia; G. Pozzi
Modelling kink vortices in high-Tc superconductors.
2008 M. Beleggia; G. Pozzi; A. Tonomura
Nanofabrication and the realization of Feynman’s two-slit experiment.
2008 S. Frabboni; G.C. Gazzadi; G. Pozzi
Three-dimensional field models for reverse-biased p-n junctions.
2008 F. Ubaldi; G. Pozzi; P.F. Fazzini; M. Beleggia
| Titolo | Autore(i) | Anno | Periodico | Editore | Tipo | File |
|---|---|---|---|---|---|---|
| A 4096-pixel MAPS detector used to investigate the single-electron distribution in a Young–Feynman two-slit interference experiment | A. Gabrielli;F.M. Giorgi;N. Semprini;M. Villa;A. Zoccoli;G. Matteucci;G. Pozzi;S. Frabboni;G.C. G...azzadi | 2013-01-01 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT | - | 1.01 Articolo in rivista | - |
| Build-up of interference patterns with single electrons | G. Matteucci;M. Pezzi;G. Pozzi;G. L. Alberghi;F. Giorgi;A. Gabrielli;N. S. Cesari;M. Villa;A. Zoc...coli;S. Frabboni;G. C. Gazzadi | 2013-01-01 | EUROPEAN JOURNAL OF PHYSICS | - | 1.01 Articolo in rivista | - |
| The Young-Feynman two-slits experiment with single electrons: Build-up of the interference pattern and arrival-time distribution using a fast-readout pixel detector | Frabboni S.; Gabrielli A.; Carlo Gazzadi G.; Giorgi F.; Matteucci G.; Pozzi G.; Semprini Cesari N....; Villa M.; Zoccoli A. | 2012-01-01 | ULTRAMICROSCOPY | - | 1.01 Articolo in rivista | - |
| APPLICATION OF A HEPE-ORIENTED 4096-MAPS TO TIME ANALYSIS OF SINGLE ELECTRON DISTRIBUTION IN A TWO-SLITS INTERFERENCE EXPERIMENT | A. Gabrielli; F. Giorni; N. Semprini Cesari; M. Villa; A. Zoccoli; G. Matteucci; G. Pozzi; S. Fra...bboni; G.C. Gazzadi | 2011-01-01 | JOURNAL OF INSTRUMENTATION | - | 1.01 Articolo in rivista | - |
| Esperienza di interferenza di singolo elettrone con doppia fenditura e sensore ad alta risoluzione temporale. | Balbi G.; Berti R.; Costa A.; Frabboni S.; Gabrielli A.; Gazzadi G.C.; Giorgi F.; Matteucci G.; P...atuelli S.; Pozzi G.; Semprini N.; Villa M.; Zoccoli A. | 2010-01-01 | - | Compositore Industrie Grafiche | 4.02 Riassunto (Abstract) | - |
| Four slits interference and diffraction experiments | Frabboni S.; Frigeri C.; Gazzadi G.C.; Pozzi G. | 2010-01-01 | ULTRAMICROSCOPY | - | 1.01 Articolo in rivista | - |
| Image simulations of kinked vortices for transmission electron microscopy | Beleggia M.; Pozzi G.; Tonomura A. | 2010-01-01 | ULTRAMICROSCOPY | - | 1.01 Articolo in rivista | - |
| Interpretation of electron beam induced charging of oxide layers in a transistor studied using electron holography | Ubaldi F.; Pozzi G.; Kasama T.; McCartney M.R.; Newcomb S.B.; Dunin-Borkowski R.E. | 2010-01-01 | - | IOP Publishing | 4.01 Contributo in Atti di convegno | - |
| Ion and electron beam nanofabrication of the which-way double-slit experiment in a transmission electron microscope | Frabboni S.; Gazzadi G.C.; Pozzi G. | 2010-01-01 | APPLIED PHYSICS LETTERS | - | 1.01 Articolo in rivista | - |
| Measurement of the Charge Distribution Along an Electrically Biased Carbon Nanotube using Electron Holography | M. Beleggia; T. Kasama; R. E. Dunin-Borkowski; G. Pozzi | 2010-01-01 | MICROSCOPY AND MICROANALYSIS | - | 4.01 Contributo in Atti di convegno | - |
| Phase shift of charged metallic nanoparticles | Beleggia M.; Pozzi G. | 2010-01-01 | ULTRAMICROSCOPY | - | 1.01 Articolo in rivista | - |
| Interpretation of electron holographic phase images and defocused bright-field images of nanocarbon field emitters | Filippo Ubaldi; Takeshi Kasama; Giulio Pozzi; Rafal Dunin-Borkowski | 2009-01-01 | - | Verlag der TU Graz | 4.02 Riassunto (Abstract) | - |
| Multiple beam interference and diffraction with FIB fabricated nano-slits | Stefano Frabboni; Cesare Frigeri; Gian Carlo Gazzadi; Giulio Pozzi | 2009-01-01 | - | Verlag der TU Graz | 4.02 Riassunto (Abstract) | - |
| Quantitative 3D characterization of semiconductor nanostructures using electron-holographic tomography | Daniel Wolf; Axel Lubk; Andreas Lenk; Hannes Lichte; Giulio Pozzi; Paola Prete; Nico Lovergine | 2009-01-01 | - | Verlag der TU Graz | 4.02 Riassunto (Abstract) | - |
| A bridge between two important problems in optics and electrostatics. | R.Capelli; G.Pozzi | 2008-01-01 | EUROPEAN JOURNAL OF PHYSICS | - | 1.01 Articolo in rivista | - |
| Characterization of JEOL 2100 Lorentz-TEM for low-magnification electron holography and magnetic imaging. | M.A. Schofield; M. Beleggia; Y. Zhu; G. Pozzi | 2008-01-01 | ULTRAMICROSCOPY | - | 1.01 Articolo in rivista | - |
| Comment on “Electron holography on dynamic motion of secondary electrons around sciatic nerve tisues”. | M. Beleggia; G. Pozzi | 2008-01-01 | JOURNAL OF ELECTRON MICROSCOPY | - | 1.01 Articolo in rivista | - |
| Modelling kink vortices in high-Tc superconductors. | M. Beleggia; G. Pozzi; A. Tonomura | 2008-01-01 | - | Springer | 4.02 Riassunto (Abstract) | - |
| Nanofabrication and the realization of Feynman’s two-slit experiment. | S. Frabboni; G.C. Gazzadi; G. Pozzi | 2008-01-01 | APPLIED PHYSICS LETTERS | - | 1.01 Articolo in rivista | - |
| Three-dimensional field models for reverse-biased p-n junctions. | F. Ubaldi; G. Pozzi; P.F. Fazzini; M. Beleggia | 2008-01-01 | - | Springer | 4.02 Riassunto (Abstract) | - |