FAZZINI, PIER FRANCESCO
FAZZINI, PIER FRANCESCO
DIP. DI FISICA
Electrical and holographic characterization of gold catalyzed titania-based layers
2007 L. Ortolani; E. Comini; P.F. Fazzini; M. Ferroni; V. Guidi; P.G. Merli; V. Morandi; G. Pozzi; G. Sberveglieri; A. Vomiero
Electron holography of size-controlled metal nanoclusters
2006 P. Canton; P. F. Fazzini; G. Pozzi; P. G. Merli
Interference electron microscopy of one-dimensional electron-optical phase objects.
2006 P. F. Fazzini; L. Ortolani; G. Pozzi; F. Ubaldi
Towards three-dimensional field models for reverse biased p-n junctions.
2006 P. F. Fazzini; G. Pozzi; F. Ubaldi; M. Beleggia
Effects of beam-specimen interaction on the observation of reverse-biased junction
2005 P. F. Fazzini; P. G. Merli; G.Pozzi; F. Ubaldi
Electron optical phase-shifts by Fourier methods: analytical versus numerical calculations
2005 P. F. Fazzini; G. Pozzi; M. Beleggia
Influence of the dopant profile on the phase contrast images of reverse biased p-n junctions
2005 P. F. Fazzini; G. Pozzi; F. Ubaldi
Interference electron microscopy of reverse-biased p-n junctions
2005 P. F. Fazzini; P. G. Merli; G. Pozzi; F. Ubaldi
Phase shift of Reverse Biased p-n Junction Arrays by Fourier Methods
2005 M. Beleggia; P.F. Fazzini; G. Pozzi
Electron microscope calibration for the Lorentz mode
2004 P. F. Fazzini; P. G. Merli; G. Pozzi
Electron Shadow edge microscopy of reverse-biased p-n junctions
2004 P.F. Fazzini; M. Beleggia; G. Pozzi
| Titolo | Autore(i) | Anno | Periodico | Editore | Tipo | File |
|---|---|---|---|---|---|---|
| Electrical and holographic characterization of gold catalyzed titania-based layers | L. Ortolani; E. Comini; P.F. Fazzini; M. Ferroni; V. Guidi; P.G. Merli; V. Morandi; G. Pozzi; G. ...Sberveglieri; A. Vomiero | 2007-01-01 | JOURNAL OF THE EUROPEAN CERAMIC SOCIETY | - | 1.01 Articolo in rivista | - |
| Electron holography of size-controlled metal nanoclusters | P. Canton; P. F. Fazzini; G. Pozzi; P. G. Merli | 2006-01-01 | - | s.n | 4.02 Riassunto (Abstract) | - |
| Interference electron microscopy of one-dimensional electron-optical phase objects. | P. F. Fazzini; L. Ortolani; G. Pozzi; F. Ubaldi | 2006-01-01 | ULTRAMICROSCOPY | - | 1.01 Articolo in rivista | - |
| Towards three-dimensional field models for reverse biased p-n junctions. | P. F. Fazzini; G. Pozzi; F. Ubaldi; M. Beleggia | 2006-01-01 | - | s.n | 4.02 Riassunto (Abstract) | - |
| Effects of beam-specimen interaction on the observation of reverse-biased junction | P. F. Fazzini; P. G. Merli; G.Pozzi; F. Ubaldi | 2005-01-01 | PHYSICAL REVIEW. B, CONDENSED MATTER AND MATERIALS PHYSICS | - | 1.01 Articolo in rivista | - |
| Electron optical phase-shifts by Fourier methods: analytical versus numerical calculations | P. F. Fazzini; G. Pozzi; M. Beleggia | 2005-01-01 | ULTRAMICROSCOPY | - | 1.01 Articolo in rivista | - |
| Influence of the dopant profile on the phase contrast images of reverse biased p-n junctions | P. F. Fazzini; G. Pozzi; F. Ubaldi | 2005-01-01 | - | Slovene Society for Microscopy | 4.02 Riassunto (Abstract) | - |
| Interference electron microscopy of reverse-biased p-n junctions | P. F. Fazzini; P. G. Merli; G. Pozzi; F. Ubaldi | 2005-01-01 | - | Springer | 4.02 Riassunto (Abstract) | - |
| Phase shift of Reverse Biased p-n Junction Arrays by Fourier Methods | M. Beleggia; P.F. Fazzini; G. Pozzi | 2005-01-01 | MICROSCOPY AND MICROANALYSIS | - | 4.02 Riassunto (Abstract) | - |
| Electron microscope calibration for the Lorentz mode | P. F. Fazzini; P. G. Merli; G. Pozzi | 2004-01-01 | ULTRAMICROSCOPY | - | 1.01 Articolo in rivista | - |
| Electron Shadow edge microscopy of reverse-biased p-n junctions | P.F. Fazzini; M. Beleggia; G. Pozzi | 2004-01-01 | - | s.n | 4.02 Riassunto (Abstract) | - |