Sfoglia per Autore
An Empirical Bipolar Device Nonlinear Noise Modeling Approach for Large-Signal Microwave Circuit Analysis
2006 P. A. Traverso; C. Florian; M. Borgarino; F. Filicori
A Nonquasi-Static Empirical Model of Electron Devices
2006 A. Santarelli; V. Di Giacomo; A. Raffo; P. A. Traverso; G. Vannini; F. Filicori
Non-Linear Measurement-Based Noise Models of Electron Devices for Low Phase-Noise Oscillator Design
2006 C. Florian; P. A. Traverso; M. Borgarino; G. Vannini; F. Filicori
Automated Microwave-Device Characterization Setup Based on a Technology-Independent Generalized Bias System
2006 P. A. Traverso; A. Raffo; M. Pirazzini; A. Santarelli; F. Filicori
Nonlinear RF device modelling in the presence of low-frequency dispersive phenomena
2006 Filicori F.; Santarelli A.; Traverso P.A.; Raffo A.; Vannini G.; Pagani M.
Microwave Large-Signal Effects on the Low-Frequency Noise Characteristics of GaInP/GaAs HBTs
2006 M. Borgarino; C. Florian; P. A. Traverso; F. Filicori
A Non-Linear Noise Model of Bipolar Transistors for the Phase-Noise Performance Analysis of Microwave Oscillators
2006 C. Florian; P. A. Traverso; M. Borgarino; F. Filicori
A Small-Signal Parameter Based Metric for Nonlinear Models of Electron Device
2006 A.Raffo; A.Santarelli; P. A. Traverso; G. Vannini; F. Filicori
Empirical Investigation on Time Dispersion of Microwave Electron Device Characteristics under Nonlinear Dynamic Operating Conditions
2007 A. Raffo; V. Di Giacomo; P.A. Traverso; A. Santarelli; G. Vannini
Empirical Nonlinear Noise Models of Field-Effect Devices for Microwave Circuit Large-Signal Noise Analysis
2007 C. Florian; P.A. Traverso; M. Borgarino; F. Filicori
Optimal function approximation for empirical look-up-table device models (invited)
2007 A. Santarelli; D. Resca; A. Raffo; V. Di Giacomo; P. A. Traverso; G. Vannini; F. Filicori
Nonlinear characterization and modelling of microwave power FETs affected by low-frequency dispersive effects
2007 A. Raffo; A. Santarelli; P.A. Traverso; G. Vannini; F.Filicori
Design of Low Phase Noise Dielectric Resonator Oscillators with GaInP HBT devices exploiting a Non-Linear Noise Model
2007 Florian C.; Traverso P. A.; Vannini G.; Filicori F.;
A Highly Flexible Measurement Set-Up for the LF Noise Up-Conversion and Phase-Noise Performance Characterization of Microwave Electron Devices
2007 Florian C.; Traverso P.A.
On the use of the Discrete-Time Convolution Model for the compensation of non-idealities within digital acquisition channels
2007 P. A. Traverso; G. Pasini; A. Raffo; D. Mirri; G. Iuculano; F. Filicori
Electron Device Model Parameter Identification Through Large-Signal-Predictive Small-Signal-Based Error Functions
2007 A. Raffo; A. Santarelli; P. A. Traverso; G. Vannini; F. Filicori
An Innovative Two-Source Large-Signal Measurement System for the Characterization of Low-Frequency Dispersive Effects in FETs
2008 A. Raffo; V. Vadalà; P. A. Traverso; A. Santarelli; G. Vannini; F. Filicori
Optimal Function Approximation For Empirical Look-Up-Table Device Models
2008 A. Santarelli; D. Resca; A. Raffo; V. Di Giacomo; P. A. Traverso; G. Vannini; F. Filicori
Active bias network-based measurement set-up for the direct characterization of low-frequency noise currents in electron devices
2008 C. Florian; P. A. Traverso
The DTCM characterization approach for the qualification of dynamic non-linearities within A/D channels
2008 P.A. Traverso; G. Pasini; A. Raffo; D. Mirri
| Titolo | Autore(i) | Anno | Periodico | Editore | Tipo | File |
|---|---|---|---|---|---|---|
| An Empirical Bipolar Device Nonlinear Noise Modeling Approach for Large-Signal Microwave Circuit Analysis | P. A. Traverso; C. Florian; M. Borgarino; F. Filicori | 2006-01-01 | IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | - | 1.01 Articolo in rivista | - |
| A Nonquasi-Static Empirical Model of Electron Devices | A. Santarelli; V. Di Giacomo; A. Raffo; P. A. Traverso; G. Vannini; F. Filicori | 2006-01-01 | IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | - | 1.01 Articolo in rivista | - |
| Non-Linear Measurement-Based Noise Models of Electron Devices for Low Phase-Noise Oscillator Design | C. Florian; P. A. Traverso; M. Borgarino; G. Vannini; F. Filicori | 2006-01-01 | - | HORIZON HOUSE | 2.01 Capitolo / saggio in libro | - |
| Automated Microwave-Device Characterization Setup Based on a Technology-Independent Generalized Bias System | P. A. Traverso; A. Raffo; M. Pirazzini; A. Santarelli; F. Filicori | 2006-01-01 | IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | - | 1.01 Articolo in rivista | - |
| Nonlinear RF device modelling in the presence of low-frequency dispersive phenomena | Filicori F.; Santarelli A.; Traverso P.A.; Raffo A.; Vannini G.; Pagani M. | 2006-01-01 | INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING | - | 1.01 Articolo in rivista | - |
| Microwave Large-Signal Effects on the Low-Frequency Noise Characteristics of GaInP/GaAs HBTs | M. Borgarino; C. Florian; P. A. Traverso; F. Filicori | 2006-01-01 | IEEE TRANSACTIONS ON ELECTRON DEVICES | - | 1.01 Articolo in rivista | - |
| A Non-Linear Noise Model of Bipolar Transistors for the Phase-Noise Performance Analysis of Microwave Oscillators | C. Florian; P. A. Traverso; M. Borgarino; F. Filicori | 2006-01-01 | - | s.n | 4.01 Contributo in Atti di convegno | - |
| A Small-Signal Parameter Based Metric for Nonlinear Models of Electron Device | A.Raffo; A.Santarelli; P. A. Traverso; G. Vannini; F. Filicori | 2006-01-01 | - | - | 4.01 Contributo in Atti di convegno | - |
| Empirical Investigation on Time Dispersion of Microwave Electron Device Characteristics under Nonlinear Dynamic Operating Conditions | A. Raffo; V. Di Giacomo; P.A. Traverso; A. Santarelli; G. Vannini | 2007-01-01 | - | IEEE Instrumentation and Measurement Society | 4.01 Contributo in Atti di convegno | - |
| Empirical Nonlinear Noise Models of Field-Effect Devices for Microwave Circuit Large-Signal Noise Analysis | C. Florian; P.A. Traverso; M. Borgarino; F. Filicori | 2007-01-01 | - | IEEE Microwave Theory and Techniques Society | 4.01 Contributo in Atti di convegno | - |
| Optimal function approximation for empirical look-up-table device models (invited) | A. Santarelli; D. Resca; A. Raffo; V. Di Giacomo; P. A. Traverso; G. Vannini; F. Filicori | 2007-01-01 | - | Aracne Editrice srl | 4.01 Contributo in Atti di convegno | - |
| Nonlinear characterization and modelling of microwave power FETs affected by low-frequency dispersive effects | A. Raffo; A. Santarelli; P.A. Traverso; G. Vannini; F.Filicori | 2007-01-01 | - | Horizon House | 4.01 Contributo in Atti di convegno | - |
| Design of Low Phase Noise Dielectric Resonator Oscillators with GaInP HBT devices exploiting a Non-Linear Noise Model | Florian C.; Traverso P. A.; Vannini G.; Filicori F.; | 2007-01-01 | - | IEEE / Institute of Electrical and Electronics Engineers | 4.01 Contributo in Atti di convegno | - |
| A Highly Flexible Measurement Set-Up for the LF Noise Up-Conversion and Phase-Noise Performance Characterization of Microwave Electron Devices | Florian C.; Traverso P.A. | 2007-01-01 | - | IEEE Instrumentation and Measurement Society | 4.01 Contributo in Atti di convegno | - |
| On the use of the Discrete-Time Convolution Model for the compensation of non-idealities within digital acquisition channels | P. A. Traverso; G. Pasini; A. Raffo; D. Mirri; G. Iuculano; F. Filicori | 2007-01-01 | MEASUREMENT | - | 1.01 Articolo in rivista | - |
| Electron Device Model Parameter Identification Through Large-Signal-Predictive Small-Signal-Based Error Functions | A. Raffo; A. Santarelli; P. A. Traverso; G. Vannini; F. Filicori | 2007-01-01 | IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | - | 1.01 Articolo in rivista | - |
| An Innovative Two-Source Large-Signal Measurement System for the Characterization of Low-Frequency Dispersive Effects in FETs | A. Raffo; V. Vadalà; P. A. Traverso; A. Santarelli; G. Vannini; F. Filicori | 2008-01-01 | - | s.n | 4.01 Contributo in Atti di convegno | - |
| Optimal Function Approximation For Empirical Look-Up-Table Device Models | A. Santarelli; D. Resca; A. Raffo; V. Di Giacomo; P. A. Traverso; G. Vannini; F. Filicori | 2008-01-01 | INTERNATIONAL JOURNAL OF MICROWAVE AND OPTICAL TECHNOLOGY | - | 1.01 Articolo in rivista | - |
| Active bias network-based measurement set-up for the direct characterization of low-frequency noise currents in electron devices | C. Florian; P. A. Traverso | 2008-01-01 | - | s.n | 4.01 Contributo in Atti di convegno | - |
| The DTCM characterization approach for the qualification of dynamic non-linearities within A/D channels | P.A. Traverso; G. Pasini; A. Raffo; D. Mirri | 2008-01-01 | - | s.n | 4.01 Contributo in Atti di convegno | - |
Legenda icone
- file ad accesso aperto
- file disponibili sulla rete interna
- file disponibili agli utenti autorizzati
- file disponibili solo agli amministratori
- file sotto embargo
- nessun file disponibile