A new procedure is presented for the analytical representation of electron device characteristics on the basis of function samples. The proposed formula relies on the analogy with the reconstruction theory of sampled signals. Full analytical developments are provided in the paper along with practical application examples based on actual 0.25 μm GaAs PHEMT characteristics. The proposed function approximation is shown to provide excellent predictions under different signal operations, when used in association with accurate nonlinear models of microwave electron devices. Comparisons with other typical interpolation procedure are also provided.
A. Santarelli, D. Resca, A. Raffo, V. Di Giacomo, P. A. Traverso, G. Vannini, et al. (2008). Optimal Function Approximation For Empirical Look-Up-Table Device Models. INTERNATIONAL JOURNAL OF MICROWAVE AND OPTICAL TECHNOLOGY, 3, 165-174.
Optimal Function Approximation For Empirical Look-Up-Table Device Models
SANTARELLI, ALBERTO;TRAVERSO, PIER ANDREA;FILICORI, FABIO
2008
Abstract
A new procedure is presented for the analytical representation of electron device characteristics on the basis of function samples. The proposed formula relies on the analogy with the reconstruction theory of sampled signals. Full analytical developments are provided in the paper along with practical application examples based on actual 0.25 μm GaAs PHEMT characteristics. The proposed function approximation is shown to provide excellent predictions under different signal operations, when used in association with accurate nonlinear models of microwave electron devices. Comparisons with other typical interpolation procedure are also provided.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
