TRAVERSO, PIER ANDREA

TRAVERSO, PIER ANDREA  

DIPARTIMENTO DI INGEGNERIA DELL'ENERGIA ELETTRICA E DELL'INFORMAZIONE "GUGLIELMO MARCONI"  

Docenti di ruolo di IIa fascia  

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Risultati 1 - 20 di 113 (tempo di esecuzione: 0.055 secondi).
Titolo Autore(i) Anno Periodico Editore Tipo File
A C-band GaAs-pHEMT MMIC low phase noise VCO for space applications using a new cyclostationary nonlinear noise model C. Florian; P.A. Traverso; M. Feudale; F. Filicori 2010-01-01 - IEEE-MTT 4.01 Contributo in Atti di convegno -
A Double-Pulse Technique for the Dynamic I/V Characterization of GaN FETs Alberto Santarelli;Rafael Cignani;Gian Piero Gibiino;Daniel Niessen;Pier Andrea Traverso;Corrado ...Florian;Dominique M. M. -P. Schreurs;Fabio Filicori 2014-01-01 IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS - 1.01 Articolo in rivista -
A Dual-Source Nonlinear Measurement System Oriented to the Empirical Characterization of Low-Frequency Dispersion in Microwave Electron Devices A. Raffo; V. Vadalà; P. A. Traverso; A. Santarelli; G. Vannini; F. Filicori 2011-01-01 COMPUTER STANDARDS & INTERFACES - 1.01 Articolo in rivista -
A Highly Flexible Measurement Set-Up for the LF Noise Up-Conversion and Phase-Noise Performance Characterization of Microwave Electron Devices Florian C.; Traverso P.A. 2007-01-01 - IEEE Instrumentation and Measurement Society 4.01 Contributo in Atti di convegno -
A Non-Linear Noise Model of Bipolar Transistors for the Phase-Noise Performance Analysis of Microwave Oscillators C. Florian; P. A. Traverso; M. Borgarino; F. Filicori 2006-01-01 - s.n 4.01 Contributo in Atti di convegno -
A Nonquasi-Static Empirical Model of Electron Devices A. Santarelli; V. Di Giacomo; A. Raffo; P. A. Traverso; G. Vannini; F. Filicori 2006-01-01 IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES - 1.01 Articolo in rivista -
A set-up with load- and source-pull capabilities for phase noise and frequency stability characterization of microwave devices under oscillating operation C. Florian; P.A. Traverso 2009-01-01 - s.n 4.01 Contributo in Atti di convegno -
A simple non-quasi-static non-linear model of electron devices A. Santarelli; V. Di Giacomo; A. Raffo; P. A. Traverso; G. Vannini; F. Filicori; V. A. Monaco 2005-01-01 - GAAS Association 4.01 Contributo in Atti di convegno -
Accurate modeling of electron device I/V characteristics through a simplified large-signal measurement setup Raffo A.; Santarelli A.; Traverso P. A.; Pagani M.; Vannini G.; Filicori F. 2005-01-01 INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING - 1.01 Articolo in rivista -
Accurate Nonlinear Electron Device Modelling for Cold FET Mixer Design V. Di Giacomo; A. Santarelli; A. Raffo; P. Traverso; D. Schreurs; J. Lonac; D. Resca; G. Vannini;... F. Filicori; M. Pagani 2008-01-01 - Horizon House 4.01 Contributo in Atti di convegno -
Accurate PHEMT Intermodulation Prediction in the Presence of Low-Frequency Dispersion Effects Raffo A.; Santarelli A.;Traverso P. A.; Vannini G.; Palomba F.; Scappaviva F.; Pagani M.; Filicor...i F. 2005-01-01 IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES - 1.01 Articolo in rivista -
Accurate prediction of PHEMT intermodulation distortion using the nonlinear discrete convolution model Costantini A.; Paolo R.P.; Traverso P.A.; Argento D.; Favre G.; Pagani M.; Santarelli A.; Vannini... G.; Filicori F. 2002-01-01 - IEEE 4.01 Contributo in Atti di convegno -
Accurate Small- and Large-Signal Predictions Using a Simple, Nonquasi-Static, Empirical Model V. Di Giacomo; A. Santarelli; A. Raffo; P. A. Traverso; G. Vannini; F.Filicori 2006-01-01 - FTW 4.01 Contributo in Atti di convegno -
Active bias network-based measurement set-up for the direct characterization of low-frequency noise currents in electron devices C. Florian; P. A. Traverso 2008-01-01 - s.n 4.01 Contributo in Atti di convegno -
An Active Bias Network for the Characterization of Low-Frequency Dispersion in High-Power Microwave Electron Devices Corrado Florian;Pier Andrea Traverso;Alberto Santarelli;Fabio Filicori 2013-01-01 IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT - 1.01 Articolo in rivista -
An Automated Measurement System Aimed to the Nonlinear Dynamic Characterization of Electron Device Time Dispersion A. Raffo; V. Di Giacomo; P. A. Traverso; A. Santarelli; Giorgio Vannini 2009-01-01 IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT - 1.01 Articolo in rivista -
An Empirical Bipolar Device Nonlinear Noise Modeling Approach for Large-Signal Microwave Circuit Analysis P. A. Traverso; C. Florian; M. Borgarino; F. Filicori 2006-01-01 IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES - 1.01 Articolo in rivista -
An Innovative Two-Source Large-Signal Measurement System for the Characterization of Low-Frequency Dispersive Effects in FETs A. Raffo; V. Vadalà; P. A. Traverso; A. Santarelli; G. Vannini; F. Filicori 2008-01-01 - s.n 4.01 Contributo in Atti di convegno -
Assessment of digital predistortion methods for DFB-SSMF radio-over-fiber links linearization Hadi M.U.; Kantana C.; Traverso P.A.; Tartarini G.; Venard O.; Baudoin G.; Polleux J.-L. 2020-01-01 MICROWAVE AND OPTICAL TECHNOLOGY LETTERS - 1.01 Articolo in rivista -
Automated Microwave Device Characterization Set-Up Based on a Technology-Independent Generalized Bias System P. A. Traverso; A. Raffo; M. Pirazzini; A. Santarelli; F. Filicori 2005-01-01 - IEEE Instrumentation and Measurement Society 4.01 Contributo in Atti di convegno -