TRAVERSO, PIER ANDREA
Dettaglio
TRAVERSO, PIER ANDREA
DIPARTIMENTO DI INGEGNERIA DELL'ENERGIA ELETTRICA E DELL'INFORMAZIONE "GUGLIELMO MARCONI"
Docenti di ruolo di IIa fascia
Pubblicazioni
Risultati 1 - 20 di 110 (tempo di esecuzione: 0.0 secondi).
Titolo | Autore(i) | Anno | Periodico | Editore | Tipo | File | |
---|---|---|---|---|---|---|---|
1 | A C-band GaAs-pHEMT MMIC low phase noise VCO for space applications using a new cyclostationary nonlinear noise model | C. Florian; P.A. Traverso; M. Feudale; F. Filicori | 2010 | IEEE-MTT | 4.01 Contributo in Atti di convegno | - | |
2 | A Double-Pulse Technique for the Dynamic I/V Characterization of GaN FETs | Alberto Santarelli;Rafael Cignani;Gian Piero Gibiino;Daniel Niessen;Pier Andrea Traverso;Corrado ...Florian;Dominique M. M. -P. Schreurs;Fabio Filicori | 2014 | IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS | 1.01 Articolo in rivista | - | |
3 | A Dual-Source Nonlinear Measurement System Oriented to the Empirical Characterization of Low-Frequency Dispersion in Microwave Electron Devices | A. Raffo; V. Vadalà; P. A. Traverso; A. Santarelli; G. Vannini; F. Filicori | 2011 | COMPUTER STANDARDS & INTERFACES | 1.01 Articolo in rivista | - | |
4 | A Highly Flexible Measurement Set-Up for the LF Noise Up-Conversion and Phase-Noise Performance Characterization of Microwave Electron Devices | Florian C.; Traverso P.A. | 2007 | IEEE Instrumentation and Measurement Society | 4.01 Contributo in Atti di convegno | - | |
5 | A Non-Linear Noise Model of Bipolar Transistors for the Phase-Noise Performance Analysis of Microwave Oscillators | C. Florian; P. A. Traverso; M. Borgarino; F. Filicori | 2006 | s.n | 4.01 Contributo in Atti di convegno | - | |
6 | A Nonquasi-Static Empirical Model of Electron Devices | A. Santarelli; V. Di Giacomo; A. Raffo; P. A. Traverso; G. Vannini; F. Filicori | 2006 | IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1.01 Articolo in rivista | - | |
7 | A set-up with load- and source-pull capabilities for phase noise and frequency stability characterization of microwave devices under oscillating operation | C. Florian; P.A. Traverso | 2009 | s.n | 4.01 Contributo in Atti di convegno | - | |
8 | A simple non-quasi-static non-linear model of electron devices | A. Santarelli; V. Di Giacomo; A. Raffo; P. A. Traverso; G. Vannini; F. Filicori; V. A. Monaco | 2005 | GAAS Association | 4.01 Contributo in Atti di convegno | - | |
9 | Accurate modeling of electron device I/V characteristics through a simplified large-signal measurement setup | Raffo A.; Santarelli A.; Traverso P. A.; Pagani M.; Vannini G.; Filicori F. | 2005 | INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING | 1.01 Articolo in rivista | - | |
10 | Accurate Nonlinear Electron Device Modelling for Cold FET Mixer Design | V. Di Giacomo; A. Santarelli; A. Raffo; P. Traverso; D. Schreurs; J. Lonac; D. Resca; G. Vannini;... F. Filicori; M. Pagani | 2008 | Horizon House | 4.01 Contributo in Atti di convegno | - | |
11 | Accurate PHEMT Intermodulation Prediction in the Presence of Low-Frequency Dispersion Effects | Raffo A.; Santarelli A.;Traverso P. A.; Vannini G.; Palomba F.; Scappaviva F.; Pagani M.; Filicor...i F. | 2005 | IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1.01 Articolo in rivista | - | |
12 | Accurate prediction of PHEMT intermodulation distortion using the nonlinear discrete convolution model | Costantini A.; Paolo R.P.; Traverso P.A.; Argento D.; Favre G.; Pagani M.; Santarelli A.; Vannini... G.; Filicori F. | 2002 | IEEE | 4.01 Contributo in Atti di convegno | - | |
13 | Accurate Small- and Large-Signal Predictions Using a Simple, Nonquasi-Static, Empirical Model | V. Di Giacomo; A. Santarelli; A. Raffo; P. A. Traverso; G. Vannini; F.Filicori | 2006 | FTW | 4.01 Contributo in Atti di convegno | - | |
14 | Active bias network-based measurement set-up for the direct characterization of low-frequency noise currents in electron devices | C. Florian; P. A. Traverso | 2008 | s.n | 4.01 Contributo in Atti di convegno | - | |
15 | An Active Bias Network for the Characterization of Low-Frequency Dispersion in High-Power Microwave Electron Devices | Corrado Florian;Pier Andrea Traverso;Alberto Santarelli;Fabio Filicori | 2013 | IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1.01 Articolo in rivista | - | |
16 | An Automated Measurement System Aimed to the Nonlinear Dynamic Characterization of Electron Device Time Dispersion | A. Raffo; V. Di Giacomo; P. A. Traverso; A. Santarelli; Giorgio Vannini | 2009 | IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1.01 Articolo in rivista | - | |
17 | An Empirical Bipolar Device Nonlinear Noise Modeling Approach for Large-Signal Microwave Circuit Analysis | P. A. Traverso; C. Florian; M. Borgarino; F. Filicori | 2006 | IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1.01 Articolo in rivista | - | |
18 | An Innovative Two-Source Large-Signal Measurement System for the Characterization of Low-Frequency Dispersive Effects in FETs | A. Raffo; V. Vadalà; P. A. Traverso; A. Santarelli; G. Vannini; F. Filicori | 2008 | s.n | 4.01 Contributo in Atti di convegno | - | |
19 | Assessment of digital predistortion methods for DFB-SSMF radio-over-fiber links linearization | Hadi M.U.; Kantana C.; Traverso P.A.; Tartarini G.; Venard O.; Baudoin G.; Polleux J.-L. | 2020 | MICROWAVE AND OPTICAL TECHNOLOGY LETTERS | 1.01 Articolo in rivista | - | |
20 | Automated Microwave Device Characterization Set-Up Based on a Technology-Independent Generalized Bias System | P. A. Traverso; A. Raffo; M. Pirazzini; A. Santarelli; F. Filicori | 2005 | IEEE Instrumentation and Measurement Society | 4.01 Contributo in Atti di convegno | - |