A technology-independent set-up for the full and direct characterization of short-circuit lowfrequency noise currents in two-port electron devices is presented. It is based on the use of low-noise transimpedance amplifiers and a specially-designed active bias network, adopted at the collector/drain port of the device. The features of the set-up proposed allow for a fast and accurate estimation of LF noise current power spectra, within a wide range of DC current bias levels, without the need for any reconfigurations and by carrying out a single-step procedure to achieve each bias point of interest.

C. Florian, P. A. Traverso (2008). Active bias network-based measurement set-up for the direct characterization of low-frequency noise currents in electron devices. FLORENCE : s.n.

Active bias network-based measurement set-up for the direct characterization of low-frequency noise currents in electron devices

FLORIAN, CORRADO;TRAVERSO, PIER ANDREA
2008

Abstract

A technology-independent set-up for the full and direct characterization of short-circuit lowfrequency noise currents in two-port electron devices is presented. It is based on the use of low-noise transimpedance amplifiers and a specially-designed active bias network, adopted at the collector/drain port of the device. The features of the set-up proposed allow for a fast and accurate estimation of LF noise current power spectra, within a wide range of DC current bias levels, without the need for any reconfigurations and by carrying out a single-step procedure to achieve each bias point of interest.
2008
Proceedings of "16th IMEKO TC4 International Symposium - Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements"
185
190
C. Florian, P. A. Traverso (2008). Active bias network-based measurement set-up for the direct characterization of low-frequency noise currents in electron devices. FLORENCE : s.n.
C. Florian; P. A. Traverso
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/66078
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