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EnglishA technology-independent set-up for the full and direct characterization of short-circuit lowfrequency noise currents in two-port electron devices is presented. It is based on the use of low-noise transimpedance amplifiers and a specially-designed active bias network, adopted at the collector/drain port of the device. The features of the set-up proposed allow for a fast and accurate estimation of LF noise current power spectra, within a wide range of DC current bias levels, without the need for any reconfigurations and by carrying out a single-step procedure to achieve each bias point of interest.
| Titolo: | Active bias network-based measurement set-up for the direct characterization of low-frequency noise currents in electron devices | |
| Autore/i: | FLORIAN, CORRADO; TRAVERSO, PIER ANDREA | |
| Autore/i Unibo: | ||
| Anno: | 2008 | |
| Titolo del libro: | Proceedings of "16th IMEKO TC4 International Symposium - Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements" | |
| Pagina iniziale: | 185 | |
| Pagina finale: | 190 | |
| Abstract: | A technology-independent set-up for the full and direct characterization of short-circuit lowfrequency noise currents in two-port electron devices is presented. It is based on the use of low-noise transimpedance amplifiers and a specially-designed active bias network, adopted at the collector/drain port of the device. The features of the set-up proposed allow for a fast and accurate estimation of LF noise current power spectra, within a wide range of DC current bias levels, without the need for any reconfigurations and by carrying out a single-step procedure to achieve each bias point of interest. | |
| Data prodotto definitivo in UGOV: | 3-dic-2008 | |
| Appare nelle tipologie: | 4.01 Contributo in Atti di convegno |
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