A new nonquasi-static nonlinear model of electron devices is proposed by adopting a perturbed charge-controlled approach. The model is based on the definition of a virtual quasi-static device, associated with the actual one, which is controlled by means of equivalent voltage sources. The advantage of this approach is that conventional purely quasi-static models can be still adopted even at very high frequencies, if suitable equivalent voltages are applied. Identification from small-signal measurements and implementation into commercially available computer-aided design tools of the new nonquasi-static model are described in this paper. Finally, by considering a GaAs p-high electron mobility transistor, accurate prediction capabilities at microwaves and millimeter frequencies are experimental verified and compared with a more conventional equivalent-circuit-based model.

A Nonquasi-Static Empirical Model of Electron Devices / A. Santarelli; V. Di Giacomo; A. Raffo; P. A. Traverso; G. Vannini; F. Filicori. - In: IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. - ISSN 0018-9480. - STAMPA. - 54, N.12, 2006:(2006), pp. 4021-4031. [10.1109/TMTT.2006.885879]

A Nonquasi-Static Empirical Model of Electron Devices

SANTARELLI, ALBERTO;TRAVERSO, PIER ANDREA;FILICORI, FABIO
2006

Abstract

A new nonquasi-static nonlinear model of electron devices is proposed by adopting a perturbed charge-controlled approach. The model is based on the definition of a virtual quasi-static device, associated with the actual one, which is controlled by means of equivalent voltage sources. The advantage of this approach is that conventional purely quasi-static models can be still adopted even at very high frequencies, if suitable equivalent voltages are applied. Identification from small-signal measurements and implementation into commercially available computer-aided design tools of the new nonquasi-static model are described in this paper. Finally, by considering a GaAs p-high electron mobility transistor, accurate prediction capabilities at microwaves and millimeter frequencies are experimental verified and compared with a more conventional equivalent-circuit-based model.
2006
A Nonquasi-Static Empirical Model of Electron Devices / A. Santarelli; V. Di Giacomo; A. Raffo; P. A. Traverso; G. Vannini; F. Filicori. - In: IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. - ISSN 0018-9480. - STAMPA. - 54, N.12, 2006:(2006), pp. 4021-4031. [10.1109/TMTT.2006.885879]
A. Santarelli; V. Di Giacomo; A. Raffo; P. A. Traverso; G. Vannini; F. Filicori
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/40166
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