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ItalianoGIBIINO, GIAN PIERO
Dettaglio
GIBIINO, GIAN PIERO
DIPARTIMENTO DI INGEGNERIA DELL'ENERGIA ELETTRICA E DELL'INFORMAZIONE "GUGLIELMO MARCONI"
Assegnisti
Gian Piero Gibiino; G. Gibiino; G.P. Gibiino; G. b. Gibiino
Pubblicazioni
Risultati 1 - 20 di 45 (tempo di esecuzione: 0.001 secondi).
| Titolo | Autore(i) | Anno | Periodico | Editore | Tipo | File | |
|---|---|---|---|---|---|---|---|
| 1 | A Double-Pulse Technique for the Dynamic I/V Characterization of GaN FETs | Alberto Santarelli;Rafael Cignani;Gian Piero Gibiino;Daniel Niessen;Pier Andrea Traverso;Corrado ...Florian;Dominique M. M. -P. Schreurs;Fabio Filicori | 2014 | IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS | 1.01 Articolo in rivista | - | |
| 2 | Active baseband drain-supply terminal load-pull of an X-band GaN MMIC PA | Gibiino, Gian Piero; Avolio, Gustavo; Schafer, Scott; Schreurs, Dominique; Popovic, Zoya; Santare...lli, Alberto; Filicori, Fabio | 2015 | Institute of Electrical and Electronics Engineers Inc. | 4.01 Contributo in Atti di convegno | - | |
| 3 | Assessment of the Trap-Induced Insertion Loss Degradation of RF GaN Switches under Operating Regimes | Florian, C., Gibiino, G.P., Santarelli, A. | 2018 | IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST | Institute of Electrical and Electronics Engineers Inc. | 4.01 Contributo in Atti di convegno | - |
| 4 | Behavioral modeling of RF PAs under wideband load modulation | Gibiino, Gian Piero; Lukasik, Konstanty; Barmuta, Pawel; Schreurs, Dominique; Santarelli, Alberto...; Filicori, Fabio | 2017 | Institute of Electrical and Electronics Engineers Inc. | 4.01 Contributo in Atti di convegno | - | |
| 5 | A bias network for small duty-cycle fast-pulsed measurement of RF power transistors | Gibiino, G.P.; Cignani, R.; Santarelli, A.; Traverso, P.A. | 2018 | JOURNAL OF PHYSICS. CONFERENCE SERIES | Institute of Physics Publishing | 4.01 Contributo in Atti di convegno | - |
| 6 | A broadband current sensor based on the X-Hall architecture | Crescentini M.; Biondi M.; Ramilli R.; Traverso P.A.; Gibiino G.P.; Romani A.; Tartagni M.; March...esi M.; Canegallo R. | 2019 | Institute of Electrical and Electronics Engineers Inc. | 4.01 Contributo in Atti di convegno | ||
| 7 | Characterization and Modeling of RF GaN Switches Accounting for Trap-Induced Degradation Under Operating Regimes | Florian, Corrado; Gibiino, Gian Piero; Santarelli, Alberto | 2018 | IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1.01 Articolo in rivista | - | |
| 8 | Charge-conservative GaN HEMT nonlinear modeling from non-isodynamic multi-bias S-parameter measurements | Gibiino G.P.; Santarelli A.; Filicori F. | 2019 | INTERNATIONAL JOURNAL OF MICROWAVE AND WIRELESS TECHNOLOGIES | 1.01 Articolo in rivista | - | |
| 9 | Charge-controlled GaN FET modeling by displacement current integration from frequency-domain NVNA measurements | Niessen, Daniel; Gibiino, Gian Piero; Cignani, Rafael; Santarelli, Alberto; Schreurs, Dominique M.... M.-P.; Filicori, Fabio | 2016 | IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1.01 Articolo in rivista | - | |
| 10 | Compact behavioral models of nonlinear active devices using response surface methodology | Barmuta, Paweł; Ferranti, Francesco; Gibiino, Gian Piero; Lewandowski, Arkadiusz; Schreurs, Domin...ique M. M.-P. | 2015 | IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1.01 Articolo in rivista | - | |
| 11 | A compact measurement set-up for envelope-tracking RF PAs with calibrated sensing of baseband V/I at the supply terminal | Couvidat, Julien; Gibiino, Gian Piero; Pailloncy, Guillaume; Vanden Bossche, Marc; Ghiotto, Antho...ny; Schreurs, Dominique | 2015 | Institute of Electrical and Electronics Engineers Inc. | 4.01 Contributo in Atti di convegno | - | |
| 12 | Comparing LSNA Calibrations: Large-Signal Network Analyzer Round Robin | Barmuta, Pawel; Ribeiro, Diogo; Wang, Kuangda; Avolio, Gustavo; Rajabi, Mohammad; Lewandowski, Ar...kadiusz; Gibiino, Gian Piero; Szatkowski, Jaroslaw; Schreurs, Dominique; Hale, Paul; Remley, Kate; Williams, Dylan | 2016 | IEEE MICROWAVE MAGAZINE | 1.01 Articolo in rivista | - | |
| 13 | Design of Experiments Using Centroidal Voronoi Tessellation | Barmuta, Paweł; Gibiino, GIAN PIERO; Ferranti, Francesco; Lewandowski, Arkadiusz; Schreurs, Domin...ique M. M. P. | 2016 | IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1.01 Articolo in rivista | - | |
| 14 | Double-pulse characterization of GaN-on-Sapphire FETs for technology development | Gibiino, Gian Piero; Barmuta, Pawel; Cignani, Rafael; Niessen, Daniel; Lewandowski, Arkadiusz; Do...brzanski, Lech; Schreurs, Dominique; Santarelli, Alberto | 2016 | Institute of Electrical and Electronics Engineers Inc. | 4.01 Contributo in Atti di convegno | - | |
| 15 | An empirical behavioral model for RF PAs including self-heating | Gibiino, Gian Piero; Cappello, Tommaso; Niessen, Daniel; Schreurs, Dominique M. M.-P.; Santarelli..., Alberto; Filicori, Fabio | 2015 | Institute of Electrical and Electronics Engineers Inc. | 4.01 Contributo in Atti di convegno | - | |
| 16 | Evaluation of GaN FET power performance reduction due to nonlinear charge trapping effects | Santarelli, Alberto; Cignani, Rafael; Niessen, Daniel; Gibiino, Gian Piero; Traverso, Pier Andrea...; Di Giacomo, Valeria; Chang, Christophe; Floriot, Didier; Schreurs, Dominique; Filicori, Fabio | 2014 | Institute of Electrical and Electronics Engineers Inc. | 4.01 Contributo in Atti di convegno | - | |
| 17 | Experimental assessment of a broadband current sensor based on the x-hall architecture | Crescentini M.; Ramilli R.; Gibiino G.P.; Marchesi M.; Canegallo R.; Romani A.; Tartagni M.; Trav...erso P.A. | 2020 | Institute of Electrical and Electronics Engineers Inc. | 4.01 Contributo in Atti di convegno | - | |
| 18 | GaN FET Nonlinear Modeling Based on Double Pulse I/V Characteristics | Alberto Santarelli;Daniel Niessen;Rafael Cignani;Gian Piero Gibiino;Pier Andrea Traverso;Corrado ...Florian;Dominique M. M.-P. Schreurs;Fabio Filicori | 2014 | IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1.01 Articolo in rivista | - | |
| 19 | A GaN HEMT Global Large-Signal Model Including Charge Trapping for Multibias Operation | Gibiino, Gian Piero*; Santarelli, Alberto; Filicori, Fabio | 2018 | IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1.01 Articolo in rivista | - | |
| 20 | Global modeling of GaN HEMT resistive current including charge trapping and self-heating for multi-bias multi-class PA performance prediction | Gibiino, Gian Piero; Cignani, Rafael; Santarelli, Alberto; Filicori, Fabio | 2017 | Institute of Electrical and Electronics Engineers Inc. | 4.01 Contributo in Atti di convegno | - |
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