The accuracy of Error Vector Magnitude (EVM) measured at component level using a vector network analyzer (VNA) mainly depends on the dynamic range available for acquiring the relevant incident and reflected modulated waves. In this work, we propose a new experimental procedure for reproducing the same power levels that would be generated by the device-under-test (DUT), but without introducing the DUT's nonlinearity. This approach allows for accurately establishing the EVM profile measurable by a given VNA-based measurement system, thereby enabling the optimization of the available dynamic range for a given target DUT. The approach has been experimentally validated by measuring two nonlinear DUTs across two configurations of a V NA-based measurement system.
Mengozzi, M., Angelotti, A.M., Gibiino, G.P. (2025). An Experimental Procedure for Assessing EVM Performance of VNA-Based Measurement Systems. Institute of Electrical and Electronics Engineers Inc. [10.1109/ARFTG65332.2025.11168141].
An Experimental Procedure for Assessing EVM Performance of VNA-Based Measurement Systems
Mengozzi M.;Angelotti A. M.;Gibiino G. P.
2025
Abstract
The accuracy of Error Vector Magnitude (EVM) measured at component level using a vector network analyzer (VNA) mainly depends on the dynamic range available for acquiring the relevant incident and reflected modulated waves. In this work, we propose a new experimental procedure for reproducing the same power levels that would be generated by the device-under-test (DUT), but without introducing the DUT's nonlinearity. This approach allows for accurately establishing the EVM profile measurable by a given VNA-based measurement system, thereby enabling the optimization of the available dynamic range for a given target DUT. The approach has been experimentally validated by measuring two nonlinear DUTs across two configurations of a V NA-based measurement system.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
