UBALDI, FILIPPO
 Distribuzione geografica
Continente #
NA - Nord America 314
EU - Europa 288
AS - Asia 238
SA - Sud America 15
AF - Africa 9
Totale 864
Nazione #
US - Stati Uniti d'America 311
GB - Regno Unito 101
SG - Singapore 85
CN - Cina 69
SE - Svezia 58
DE - Germania 33
UA - Ucraina 32
HK - Hong Kong 28
IN - India 17
IT - Italia 16
VN - Vietnam 16
IE - Irlanda 14
RU - Federazione Russa 13
BR - Brasile 12
FR - Francia 10
JP - Giappone 8
JO - Giordania 7
EE - Estonia 5
SC - Seychelles 4
ZA - Sudafrica 4
PL - Polonia 3
TR - Turchia 3
CA - Canada 2
KR - Corea 2
LB - Libano 2
NL - Olanda 2
AR - Argentina 1
AZ - Azerbaigian 1
CI - Costa d'Avorio 1
CO - Colombia 1
FI - Finlandia 1
MX - Messico 1
UY - Uruguay 1
Totale 864
Città #
Southend 82
Singapore 55
Santa Clara 46
Fairfield 31
Hong Kong 28
Jacksonville 24
Ashburn 21
Wilmington 18
Cambridge 15
Beijing 14
Dublin 14
Princeton 14
Hefei 12
Woodbridge 12
Chandler 11
Seattle 10
Houston 9
Boardman 8
Tokyo 8
Amman 7
Hanoi 7
Padova 7
Westminster 7
Ann Arbor 5
Medford 5
Berlin 4
Buffalo 4
Changsha 4
Mahé 4
Mülheim 4
Nanjing 4
Saint Petersburg 4
Hebei 3
Jinan 3
London 3
Los Angeles 3
Phoenix 3
San Diego 3
Shenyang 3
Atlanta 2
Bexley 2
Brooklyn 2
Guangzhou 2
Ho Chi Minh City 2
Milan 2
Norwalk 2
Salvador 2
Seoul 2
Taizhou 2
Wroclaw 2
Abidjan 1
Angra dos Reis 1
Baku 1
Boston 1
Bình An 1
Bühl 1
Bắc Giang 1
Campo Grande 1
Caxias do Sul 1
Changchun 1
Cubatão 1
Des Moines 1
Falls Church 1
Foshan 1
Frankfurt Am Main 1
Frankfurt am Main 1
Genzano Di Roma 1
Groningen 1
Haiphong 1
Helsinki 1
Jiangmen 1
Jiaxing 1
Lang Son 1
Las Vegas 1
Lấp Vò 1
Manaus 1
Manchester 1
Medellín 1
Montevideo 1
Montreal 1
Nanchang 1
Olalla 1
Olímpia 1
Pinhais 1
Porto Velho 1
Prescot 1
Quilmes 1
Quận Bình Thạnh 1
Recife 1
Redondo Beach 1
Roubaix 1
San Francisco 1
Shanghai 1
Toledo 1
Toronto 1
Tuxtla Gutiérrez 1
Verona 1
Warsaw 1
Zhengzhou 1
Totale 590
Nome #
Three-dimensional field models for reverse-biased p-n junctions. 134
Influence of the dopant profile on the phase contrast images of reverse biased p-n junctions 131
Interference electron microscopy of reverse-biased p-n junctions 127
Towards three-dimensional field models for reverse biased p-n junctions. 126
Interference electron microscopy of one-dimensional electron-optical phase objects. 123
Effects of beam-specimen interaction on the observation of reverse-biased junction 121
Interpretation of electron beam induced charging of oxide layers in a transistor studied using electron holography 109
Totale 871
Categoria #
all - tutte 2.346
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 2.346


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/202133 0 0 0 0 0 4 0 9 2 4 7 7
2021/2022106 4 2 6 10 14 16 1 11 2 2 10 28
2022/2023123 17 26 7 6 5 10 9 5 30 0 6 2
2023/202416 2 8 0 2 2 0 0 2 0 0 0 0
2024/2025179 4 43 13 12 47 4 7 2 0 0 0 47
2025/2026133 11 25 31 26 29 11 0 0 0 0 0 0
Totale 871