X-ray detection for personal dosimetry requires sensitive, stable and non-toxic materials. At the same time, scalability onto large-area and flexible substrates is emerging as a desirable property. To satisfy these requirements, novel materials to be employed as the active layer of direct X-ray detectors are needed. In this search for easy-processability, large area, efficient and non-toxic materials for direct X-ray detection, we assess the performance of a layered metal-organic chalcogenide [AgSePh]infinity, recently proposed as representative of a novel excitonic semiconductors platform. Here we demonstrate that [AgSePh]infinity can be successfully applied as direct ionizing radiation detecting layer, reaching sensitivities up to (180 +/- 10) mu C Gy-1 cm-2 and competitive limit of detection down to (100 +/- 30) nGy s-1. Moreover, it offers good stability and reproducibility of detection after 100 Gy of irradiation and upon bending to a curvature radius of 5 mm.
Layered metal-organic chalcogenide thin films for flexible and large-area X-ray direct detection / Fratelli, Ilaria; Maserati, Lorenzo; Basiricò, Laura; Galeazzi, Alessandro; Passarella, Bianca; Ciavatti, Andrea; Caironi, Mario; Fraboni, Beatrice. - In: FRONTIERS IN PHYSICS. - ISSN 2296-424X. - ELETTRONICO. - 11:(2023), pp. 1325164.1-1325164.8. [10.3389/fphy.2023.1325164]
Layered metal-organic chalcogenide thin films for flexible and large-area X-ray direct detection
Fratelli, Ilaria
Primo
;Maserati, Lorenzo;Basiricò, Laura;Ciavatti, Andrea;Fraboni, Beatrice
2023
Abstract
X-ray detection for personal dosimetry requires sensitive, stable and non-toxic materials. At the same time, scalability onto large-area and flexible substrates is emerging as a desirable property. To satisfy these requirements, novel materials to be employed as the active layer of direct X-ray detectors are needed. In this search for easy-processability, large area, efficient and non-toxic materials for direct X-ray detection, we assess the performance of a layered metal-organic chalcogenide [AgSePh]infinity, recently proposed as representative of a novel excitonic semiconductors platform. Here we demonstrate that [AgSePh]infinity can be successfully applied as direct ionizing radiation detecting layer, reaching sensitivities up to (180 +/- 10) mu C Gy-1 cm-2 and competitive limit of detection down to (100 +/- 30) nGy s-1. Moreover, it offers good stability and reproducibility of detection after 100 Gy of irradiation and upon bending to a curvature radius of 5 mm.File | Dimensione | Formato | |
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