In this work, we study the impact of device self heating on Bulk and doublegate silicon on insulator (DGSOI) technologies using self consistent electro-thermal (ET) simulations. Device characteristics of Bulk and DGSOI MOSFETs have been studied to estimate device performance and the impact of selfheating on the same. Self-heating effect (SHE) on the AC performance has also been studied for these two technologies.
U. Roy, E. Sangiorgi, C. Fiegna (2010). Self-Heating Effects in Analog Bulk and SOI CMOS Circuits. s.l : IEEE Press.
Self-Heating Effects in Analog Bulk and SOI CMOS Circuits
SANGIORGI, ENRICO;FIEGNA, CLAUDIO
2010
Abstract
In this work, we study the impact of device self heating on Bulk and doublegate silicon on insulator (DGSOI) technologies using self consistent electro-thermal (ET) simulations. Device characteristics of Bulk and DGSOI MOSFETs have been studied to estimate device performance and the impact of selfheating on the same. Self-heating effect (SHE) on the AC performance has also been studied for these two technologies.File in questo prodotto:
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