In this work, we study the impact of device self heating on Bulk and doublegate silicon on insulator (DGSOI) technologies using self consistent electro-thermal (ET) simulations. Device characteristics of Bulk and DGSOI MOSFETs have been studied to estimate device performance and the impact of selfheating on the same. Self-heating effect (SHE) on the AC performance has also been studied for these two technologies.
Titolo: | Self-Heating Effects in Analog Bulk and SOI CMOS Circuits |
Autore/i: | U. Roy; SANGIORGI, ENRICO; FIEGNA, CLAUDIO |
Autore/i Unibo: | |
Anno: | 2010 |
Titolo del libro: | 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology Proceedings |
Pagina iniziale: | 1782 |
Pagina finale: | 1785 |
Abstract: | In this work, we study the impact of device self heating on Bulk and doublegate silicon on insulator (DGSOI) technologies using self consistent electro-thermal (ET) simulations. Device characteristics of Bulk and DGSOI MOSFETs have been studied to estimate device performance and the impact of selfheating on the same. Self-heating effect (SHE) on the AC performance has also been studied for these two technologies. |
Data prodotto definitivo in UGOV: | 20-nov-2010 |
Appare nelle tipologie: | 4.01 Contributo in Atti di convegno |
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