In this work, we study the impact of device self heating on Bulk and doublegate silicon on insulator (DGSOI) technologies using self consistent electro-thermal (ET) simulations. Device characteristics of Bulk and DGSOI MOSFETs have been studied to estimate device performance and the impact of selfheating on the same. Self-heating effect (SHE) on the AC performance has also been studied for these two technologies.

Self-Heating Effects in Analog Bulk and SOI CMOS Circuits

SANGIORGI, ENRICO;FIEGNA, CLAUDIO
2010

Abstract

In this work, we study the impact of device self heating on Bulk and doublegate silicon on insulator (DGSOI) technologies using self consistent electro-thermal (ET) simulations. Device characteristics of Bulk and DGSOI MOSFETs have been studied to estimate device performance and the impact of selfheating on the same. Self-heating effect (SHE) on the AC performance has also been studied for these two technologies.
2010
2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology Proceedings
1782
1785
U. Roy; E. Sangiorgi; C. Fiegna
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/92694
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