Chalcogenide compounds (GST) are extensively being investigated as active materials in phase-change memories. Experimental structural data and charge transport features of GST devices suggest that electrical conduction in the amorphous phase is controlled by defects and trapped carriers. A full-3D, self-consistent Monte Carlo code has been implemented to the purpose of calculating carrier transport in GST due to hopping. An important part of the model is the transition probability per unit time between traps which, in the present implementation, is that by Miller and Abrahams. Such a model exhibits some inconsistencies that led the authors to work out a new model. The outcome of such an investigation is reported in this paper.

A New Hopping Model for Transport in Chalcogenide Glasses / Rudan M.; Giovanardi F.; Piccinini E.; Buscemi F.; Brunetti R.; Jacoboni C.. - ELETTRONICO. - (2009), pp. 1-2. (Intervento presentato al convegno International Semiconductor Device Research Symposium tenutosi a College Park, MD USA nel Dec. 9-11 2009) [10.1109/ISDRS.2009.5378320].

A New Hopping Model for Transport in Chalcogenide Glasses

RUDAN, MASSIMO;GIOVANARDI, FABIO;PICCININI, ENRICO;BUSCEMI, FABRIZIO;
2009

Abstract

Chalcogenide compounds (GST) are extensively being investigated as active materials in phase-change memories. Experimental structural data and charge transport features of GST devices suggest that electrical conduction in the amorphous phase is controlled by defects and trapped carriers. A full-3D, self-consistent Monte Carlo code has been implemented to the purpose of calculating carrier transport in GST due to hopping. An important part of the model is the transition probability per unit time between traps which, in the present implementation, is that by Miller and Abrahams. Such a model exhibits some inconsistencies that led the authors to work out a new model. The outcome of such an investigation is reported in this paper.
2009
Symposium Proceedings
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A New Hopping Model for Transport in Chalcogenide Glasses / Rudan M.; Giovanardi F.; Piccinini E.; Buscemi F.; Brunetti R.; Jacoboni C.. - ELETTRONICO. - (2009), pp. 1-2. (Intervento presentato al convegno International Semiconductor Device Research Symposium tenutosi a College Park, MD USA nel Dec. 9-11 2009) [10.1109/ISDRS.2009.5378320].
Rudan M.; Giovanardi F.; Piccinini E.; Buscemi F.; Brunetti R.; Jacoboni C.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/89612
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