We present here a comprehensive system for submicron-device simulation based on the hydrodynamic (HD) model and the expansion of the Boltzmann equation (BTE) in spherical harmonics (SHE). In the typical operating regime of semiconductor devices, the accurate calculation of the carrier concentration and velocity, along with the information about the carrier temperature, provided by the HD model, is important for describing a number of phenomena indicated by the general term hot-carrier effects, which play a relevant role in modern devices. The coefficients of the model are computed by adopting the solution method for the BTE based on the SHE, and using the full-band structure for both the electron and valence band of silicon. The dependence of the coefficients on lattice temperature has been investigated and compared with available experimental data.

Comprehensive system for submicron-device simulation / Rudan Massimo; Lorenzini Martino; Vecchi Maria Cristina; Reggiani Susanna. - STAMPA. - 1:(1997), pp. 41-48. (Intervento presentato al convegno Proceedings of the 1997 21st International Conference on Microelectronics, MIEL'97. Part 1 (of 2) tenutosi a Nis, Yugosl, nel 1997).

Comprehensive system for submicron-device simulation

Rudan Massimo;Lorenzini Martino;Vecchi Maria Cristina;Reggiani Susanna
1997

Abstract

We present here a comprehensive system for submicron-device simulation based on the hydrodynamic (HD) model and the expansion of the Boltzmann equation (BTE) in spherical harmonics (SHE). In the typical operating regime of semiconductor devices, the accurate calculation of the carrier concentration and velocity, along with the information about the carrier temperature, provided by the HD model, is important for describing a number of phenomena indicated by the general term hot-carrier effects, which play a relevant role in modern devices. The coefficients of the model are computed by adopting the solution method for the BTE based on the SHE, and using the full-band structure for both the electron and valence band of silicon. The dependence of the coefficients on lattice temperature has been investigated and compared with available experimental data.
1997
Proceedings of the International Conference on Microelectronics
41
48
Comprehensive system for submicron-device simulation / Rudan Massimo; Lorenzini Martino; Vecchi Maria Cristina; Reggiani Susanna. - STAMPA. - 1:(1997), pp. 41-48. (Intervento presentato al convegno Proceedings of the 1997 21st International Conference on Microelectronics, MIEL'97. Part 1 (of 2) tenutosi a Nis, Yugosl, nel 1997).
Rudan Massimo; Lorenzini Martino; Vecchi Maria Cristina; Reggiani Susanna
File in questo prodotto:
Eventuali allegati, non sono esposti

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/895734
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo

Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 0
  • ???jsp.display-item.citation.isi??? 0
social impact