Charge trapping effects represent a major challenge in the performance evaluation and the measurement-based compact modeling of modern short-gate-length (i.e., ≤0.15 µm) Gallium Nitride (GaN) high-electron mobility transistors (HEMT) technology for millimeter-wave applications. In this work, we propose a comprehensive experimental methodology based on multi-bias large-signal transient measurements, useful to characterize charge-trapping dynamics in terms of both capture and release mechanisms across the whole device safe operating area (SOA). From this dataset, characterizations, such as static-IV, pulsed-IV, and trapping time constants, are seamlessly extracted, thus allowing for the separation of trapping and thermal phenomena and delivering a complete basis for measurement-based compact modeling. The approach is applied to different state-of-the-art GaN HEMT commercial technologies, providing a comparative analysis of the measured effects.

Angelotti A.M., Gibiino G.P., Florian C., Santarelli A. (2021). Trapping dynamics in gan hemts for millimeter-wave applications: Measurement-based characterization and technology comparison. ELECTRONICS, 10(2), 1-16 [10.3390/electronics10020137].

Trapping dynamics in gan hemts for millimeter-wave applications: Measurement-based characterization and technology comparison

Angelotti A. M.
;
Gibiino G. P.;Florian C.;Santarelli A.
2021

Abstract

Charge trapping effects represent a major challenge in the performance evaluation and the measurement-based compact modeling of modern short-gate-length (i.e., ≤0.15 µm) Gallium Nitride (GaN) high-electron mobility transistors (HEMT) technology for millimeter-wave applications. In this work, we propose a comprehensive experimental methodology based on multi-bias large-signal transient measurements, useful to characterize charge-trapping dynamics in terms of both capture and release mechanisms across the whole device safe operating area (SOA). From this dataset, characterizations, such as static-IV, pulsed-IV, and trapping time constants, are seamlessly extracted, thus allowing for the separation of trapping and thermal phenomena and delivering a complete basis for measurement-based compact modeling. The approach is applied to different state-of-the-art GaN HEMT commercial technologies, providing a comparative analysis of the measured effects.
2021
Angelotti A.M., Gibiino G.P., Florian C., Santarelli A. (2021). Trapping dynamics in gan hemts for millimeter-wave applications: Measurement-based characterization and technology comparison. ELECTRONICS, 10(2), 1-16 [10.3390/electronics10020137].
Angelotti A.M.; Gibiino G.P.; Florian C.; Santarelli A.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/801186
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