ANALYZER OF MATERIALS BY MICROWAWE SPECTROSCOPY

The present invention relates to a system for the measurement of parameters related to the dielectric properties of a material, useful for determining some chemical- physical characteristics of the material. The system comprises a waveguide, preferably rectangular, provided with a closable opening to access the inside of the guide where there is provided a sample holder for containing and accommodating a material to be analyzed, a transmitting antenna and a receiving antenna placed at two opposite sides of the holder. The system further comprises a radio frequency signal generator operatively connected to the transmitting antenna for generating a radio signal in the waveguide. Then the system comprises a gain and phase comparator connected to the receiving antenna and the transmitting antenna, to provide the control unit with the gain and phase introduced by the path into the waveguide on the signal transmitted by the transmitting antenna. The control unit further provides to transmit data for the required processing.