High‐Sensitivity Flexible X‐Ray Detectors based on Printed Perovskite Inks

The demand for high-energy radiation detection systems combining high sensitivity, low-cost and large-area fabrication has pushed the research on hybrid perovskites as promising materials for X- and gamma-photon detection, thanks to their high Z atoms, solution-processability, and high optoelectronic performance. Here, flexible direct X-ray detectors are demonstrated with outstanding real-time detection properties. They are based on printed micrometers-thick films of methylammonium lead triiodide nanocrystals inks, formulated in low boiling point and benign solvents. Record optoelectronic performances, such as high X-ray sensitivity (up to 2270 mu C Gy(-1) cm(-2)), radiation tolerance over 2.2 Gy of total dose, and fast response time (48 ms) have been achieved by using a simple device architecture and materials processing The functionality under strong bending stress (strain > 10%) and under high X-ray energy (up to 150 keV) has been assessed, opening the way for flexible real-time direct radiation detectors and imagers, operating at low-voltages (bias < 4V) and apt to be fabricated by means of large-area scalable processes.