CRIS Current Research Information System
IRIS è la soluzione IT che facilita la raccolta e la gestione dei dati relativi alle attività e ai prodotti della ricerca. Fornisce a ricercatori, amministratori e valutatori gli strumenti per monitorare i risultati della ricerca, aumentarne la visibilità e allocare in modo efficace le risorse disponibili.
EnglishThe electrical compensation processes of high resistivity CdTe is controlled by deep levels.We have characterized the electrical activity of deep traps by means of three different and complementary spectroscopic methods: photoinduced current transient spectroscopy, surface photovoltage spectroscopy, and space charge limited current analyses. The aim is twofold: to achieve a thorough characterization of the deep trap properties and to assess the potentiality and limitations of the three experimental techniques by a cross correlation of the results obtained with each one of them. We have obtained a direct quantitative estimate of the major deep trap concentration, and we have assessed the sensitivity limit in deep-level detection for surface photovoltage spectroscopy.
| Titolo: | Deep states in semi-insulating II-VI compounds: electrical characterization spectroscopies |
| Autore/i: | FRABONI, BEATRICE |
| Autore/i Unibo: | |
| Anno: | 2008 |
| Titolo del libro: | Proceedings of the 16th International Conference on Room temperature Semiconductor X and gamma- ray detectors |
| Pagina iniziale: | 175 |
| Pagina finale: | 177 |
| Abstract: | The electrical compensation processes of high resistivity CdTe is controlled by deep levels.We have characterized the electrical activity of deep traps by means of three different and complementary spectroscopic methods: photoinduced current transient spectroscopy, surface photovoltage spectroscopy, and space charge limited current analyses. The aim is twofold: to achieve a thorough characterization of the deep trap properties and to assess the potentiality and limitations of the three experimental techniques by a cross correlation of the results obtained with each one of them. We have obtained a direct quantitative estimate of the major deep trap concentration, and we have assessed the sensitivity limit in deep-level detection for surface photovoltage spectroscopy. |
| Data prodotto definitivo in UGOV: | 3-feb-2011 |
| Appare nelle tipologie: | 4.01 Contributo in Atti di convegno |
File in questo prodotto:
Copyright © 2021