In this paper, the sensitivity analysis of a single scale model is employed in order to reduce the input dimensionality of the related multiscale model, in this way, improving the efficiency of its uncertainty estimation. The approach is illustrated with two examples: a reaction model and the standard Ornstein–Uhlenbeck process. Additionally, a counterexample shows that an uncertain input should not be excluded from uncertainty quantification without estimating the response sensitivity to this parameter. In particular, an analysis of the function defining the relation between single scale components is required to understand whether single scale sensitivity analysis can be used to reduce the dimensionality of the overall multiscale model input space.

Sensitivity analysis based dimension reduction of multiscale models / Nikishova A.; Comi G.E.; Hoekstra A.G.. - In: MATHEMATICS AND COMPUTERS IN SIMULATION. - ISSN 0378-4754. - ELETTRONICO. - 170:(2020), pp. 205-220. [10.1016/j.matcom.2019.10.013]

Sensitivity analysis based dimension reduction of multiscale models

Comi G. E.;
2020

Abstract

In this paper, the sensitivity analysis of a single scale model is employed in order to reduce the input dimensionality of the related multiscale model, in this way, improving the efficiency of its uncertainty estimation. The approach is illustrated with two examples: a reaction model and the standard Ornstein–Uhlenbeck process. Additionally, a counterexample shows that an uncertain input should not be excluded from uncertainty quantification without estimating the response sensitivity to this parameter. In particular, an analysis of the function defining the relation between single scale components is required to understand whether single scale sensitivity analysis can be used to reduce the dimensionality of the overall multiscale model input space.
2020
Sensitivity analysis based dimension reduction of multiscale models / Nikishova A.; Comi G.E.; Hoekstra A.G.. - In: MATHEMATICS AND COMPUTERS IN SIMULATION. - ISSN 0378-4754. - ELETTRONICO. - 170:(2020), pp. 205-220. [10.1016/j.matcom.2019.10.013]
Nikishova A.; Comi G.E.; Hoekstra A.G.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/936395
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