A simple prototype system for static two-dimensional soft X-ray imaging using silicon microstrip detectors irradiated at normal incidence is presented. Radiation sensors consist of single-sided silicon detectors made from 300 μm thick wafers, read by RX64 ASICs. Data acquisition and control is performed by a Windows PC workstation running dedicated LabVIEW routines, connected to the sensors through a PCI-DIO-96 interface. Two-dimensional images are obtained by scanning a lead collimator with a thin slit perpendicular to the strip axis, along the whole detector size; the several strip profiles (slices) taken at each position are then put together to form a planar image. Preliminary results are presented, illustrating the high-resolution imaging capabilities of the system with soft X-rays. © 2003 Elsevier B.V. All rights reserved.

Silicon strip detectors for two-dimensional soft X-ray imaging at normal incidence / Rato Mendes P.; Abreu M.C.; Baldazzi G.; Bollini D.; Cabal Rodriguez A.E.; Dabrowski W.; Diaz Garcia A.; Gambaccini M.; Giubellino P.; Gombia M.; Grybos P.; Idzik M.; Marzari-Chiesa A.; Montano L.M.; Prino F.; Ramello L.; Rodrigues S.; Sitta M.; Sousa P.; Swientek K.; Taibi A.; Tuffanelli A.; Wheadon R.; Wiacek P.. - In: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT. - ISSN 0168-9002. - ELETTRONICO. - 509:1-3(2003), pp. 333-339. [10.1016/S0168-9002(03)01646-2]

Silicon strip detectors for two-dimensional soft X-ray imaging at normal incidence

Baldazzi G.;Bollini D.;Gombia M.;
2003

Abstract

A simple prototype system for static two-dimensional soft X-ray imaging using silicon microstrip detectors irradiated at normal incidence is presented. Radiation sensors consist of single-sided silicon detectors made from 300 μm thick wafers, read by RX64 ASICs. Data acquisition and control is performed by a Windows PC workstation running dedicated LabVIEW routines, connected to the sensors through a PCI-DIO-96 interface. Two-dimensional images are obtained by scanning a lead collimator with a thin slit perpendicular to the strip axis, along the whole detector size; the several strip profiles (slices) taken at each position are then put together to form a planar image. Preliminary results are presented, illustrating the high-resolution imaging capabilities of the system with soft X-rays. © 2003 Elsevier B.V. All rights reserved.
2003
Silicon strip detectors for two-dimensional soft X-ray imaging at normal incidence / Rato Mendes P.; Abreu M.C.; Baldazzi G.; Bollini D.; Cabal Rodriguez A.E.; Dabrowski W.; Diaz Garcia A.; Gambaccini M.; Giubellino P.; Gombia M.; Grybos P.; Idzik M.; Marzari-Chiesa A.; Montano L.M.; Prino F.; Ramello L.; Rodrigues S.; Sitta M.; Sousa P.; Swientek K.; Taibi A.; Tuffanelli A.; Wheadon R.; Wiacek P.. - In: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT. - ISSN 0168-9002. - ELETTRONICO. - 509:1-3(2003), pp. 333-339. [10.1016/S0168-9002(03)01646-2]
Rato Mendes P.; Abreu M.C.; Baldazzi G.; Bollini D.; Cabal Rodriguez A.E.; Dabrowski W.; Diaz Garcia A.; Gambaccini M.; Giubellino P.; Gombia M.; Gryb...espandi
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/874412
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