Silicon strip detectors for two-dimensional soft X-ray imaging at normal incidence

Rato Mendes, P.; Abreu, M. C.; Baldazzi, G.; Bollini, D.; Cabal Rodriguez, A. E.; Dabrowski, W.; Diaz Garcia, A.; Gambaccini, M.; Giubellino, P.; Gombia, M.; Grybos, P.; Idzik, M.; Marzari-Chiesa, A.; Montano, L. M.; Prino, F.; Ramello, L.; Rodrigues, S.; Sitta, M.; Sousa, P.; Swientek, K.; Taibi, A.; Tuffanelli, A.; Wheadon, R.; Wiacek, P.

doi:10.1016/S0168-9002(03)01646-2

A simple prototype system for static two-dimensional soft X-ray imaging using silicon microstrip detectors irradiated at normal incidence is presented. Radiation sensors consist of single-sided silicon detectors made from 300 μm thick wafers, read by RX64 ASICs. Data acquisition and control is performed by a Windows PC workstation running dedicated LabVIEW routines, connected to the sensors through a PCI-DIO-96 interface. Two-dimensional images are obtained by scanning a lead collimator with a thin slit perpendicular to the strip axis, along the whole detector size; the several strip profiles (slices) taken at each position are then put together to form a planar image. Preliminary results are presented, illustrating the high-resolution imaging capabilities of the system with soft X-rays. © 2003 Elsevier B.V. All rights reserved.

Titolo:	Silicon strip detectors for two-dimensional soft X-ray imaging at normal incidence
Autore/i:	Rato Mendes P.; Abreu M. C.; Baldazzi G.; Bollini D.; Cabal Rodriguez A. E.; Dabrowski W.; Diaz Garcia A.; Gambaccini M.; Giubellino P.; Gombia M.; Grybos P.; Idzik M.; Marzari-Chiesa A.; Montano L. M.; Prino F.; Ramello L.; Rodrigues S.; Sitta M.; Sousa P.; Swientek K.; Taibi A.; Tuffanelli A.; Wheadon R.; Wiacek P.
Autore/i Unibo:	Rato Mendes P. Abreu M. C. BALDAZZI, GIUSEPPE BOLLINI, DANTE Cabal Rodriguez A. E. Dabrowski W. Diaz Garcia A. Gambaccini M. Giubellino P. GOMBIA, MIRKO Grybos P. Idzik M. Marzari-Chiesa A. Montano L. M. Prino F. Ramello L. Rodrigues S. Sitta M. Sousa P. Swientek K. Taibi A. Tuffanelli A. Wheadon R. Wiacek P. mostra contributor esterni nascondi contributor esterni
Anno:	2003
Rivista:	NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT
Digital Object Identifier (DOI):	http://dx.doi.org/10.1016/S0168-9002(03)01646-2
Abstract:	A simple prototype system for static two-dimensional soft X-ray imaging using silicon microstrip detectors irradiated at normal incidence is presented. Radiation sensors consist of single-sided silicon detectors made from 300 μm thick wafers, read by RX64 ASICs. Data acquisition and control is performed by a Windows PC workstation running dedicated LabVIEW routines, connected to the sensors through a PCI-DIO-96 interface. Two-dimensional images are obtained by scanning a lead collimator with a thin slit perpendicular to the strip axis, along the whole detector size; the several strip profiles (slices) taken at each position are then put together to form a planar image. Preliminary results are presented, illustrating the high-resolution imaging capabilities of the system with soft X-rays. © 2003 Elsevier B.V. All rights reserved.
Data stato definitivo:	2022-02-28T19:31:02Z
Appare nelle tipologie:	1.01 Articolo in rivista

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