A multi-tone multi-harmonic scattering (M2S) parameter measurement approach, suitable for multi-port nonlinear network characterization, is proposed. The M2S parameters, based on the concept of incommensurate excitation frequencies, provide a generalization to the multi-input multi-harmonic case of the well-known single-input describing functions representation using only the fundamental frequency. The M2S parameters are directly measurable quantities featuring a mild nonlinear dependency on the incident wave amplitudes only, with the advantage of a much larger information content with respect to single-tone periodic measurements. The validity of the proposed approach is demonstrated for RF transistor and power amplifier load-pull applications, where good accuracy can be achieved with a smaller number of measurements in comparison with conventional load-pull techniques, since the M2S parameters do not depend on the incident wave phases.

M2s parameters: A multi-tone multi-harmonic measurement approach for the characterization of nonlinear networks

Gibiino G. P.;Angelotti A. M.;Santarelli A.;Filicori F.;Traverso P. A.
2020

Abstract

A multi-tone multi-harmonic scattering (M2S) parameter measurement approach, suitable for multi-port nonlinear network characterization, is proposed. The M2S parameters, based on the concept of incommensurate excitation frequencies, provide a generalization to the multi-input multi-harmonic case of the well-known single-input describing functions representation using only the fundamental frequency. The M2S parameters are directly measurable quantities featuring a mild nonlinear dependency on the incident wave amplitudes only, with the advantage of a much larger information content with respect to single-tone periodic measurements. The validity of the proposed approach is demonstrated for RF transistor and power amplifier load-pull applications, where good accuracy can be achieved with a smaller number of measurements in comparison with conventional load-pull techniques, since the M2S parameters do not depend on the incident wave phases.
I2MTC 2020 - International Instrumentation and Measurement Technology Conference, Proceedings
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Gibiino G.P.; Angelotti A. M.; Santarelli A.; Filicori F.; Traverso P.A.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/806898
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